• 沒有找到結果。

功率積體電路之接面隔離研究

N/A
N/A
Protected

Academic year: 2021

Share "功率積體電路之接面隔離研究"

Copied!
115
0
0

加載中.... (立即查看全文)

全文

Loading

數據

圖 4.3  LDMOS 導通時電流流密圖     (a)  高低壓整合 ..............................................................................42     (b)  高壓整合..................................................................................42  圖 4.4  高低壓整合,導通時電流流密圖     (a)  LIGBT ..
圖 4.20  高低壓整合,高壓元件反向偏壓下電流流密圖     (a)  LDMOS .....................................................................................58     (b)  SA-LIGBT.................................................................................58  圖 4.21  高低壓整合,P-sink 寬
圖 4.28  高低壓整合含隔離結構,P 型保護環寬度與漏電流關係圖     (a)  LDMOS .....................................................................................67     (b)  SA-LIGBT.................................................................................67  圖 4.29  相同面積下,高低
圖 1.1  多磊晶層結構圖  LDMOS C ollectorIsolatorC MOS P+ N+ P+ P P-sub N-epiN -epi N -bufferN+N+N+N+P+P+P+N-wellP-well 圖 1.2  保護環隔離結構圖  V<0
+7

參考文獻

相關文件

Huan Liu and Dan Orban, “Cloud MapReduce: a MapReduce Implementation on top of a Cloud Operating System,” IEEE/ACM International Symposium on Cluster, Cloud and

C., “Robust and Efficient Algorithm for Optical Flow Computation,” Proceeding of IEEE International Conference on Computer Vision, pp. “Determining Optical Flow.” Artificial

Selcuk Candan, ”GMP: Distributed Geographic Multicast Routing in Wireless Sensor Networks,” IEEE International Conference on Distributed Computing Systems,

Clay Collier, “In-Vehicle Route Guidance Systems Using Map-Matched Dead Reckoning", Position Location and Navigation Symposium, IEEE 1990, 'The 1990's - A Decade of Excellence in the

Chen, “Adjustable gamma correction circuit for TFT LCD,” IEEE International Symposium on Circuits and Systems, vol. Kan, “Implementation of the Gamma (γ) Line System Similar

Gu, “Corner Block List: An Effective and Efficient Topological Representation of Nonslicing Floorplan,” IEEE/ACM International Conference on Computer-Aided Design, pp.8–12,

Gary (1994), “An optimal neural network process model for plasma etching,” IEEE Trans. James(1993), “Robust features selections scheme for fault diagnosis in an electric

本系統結合德州儀器 ( Texas Instruments ) 之 CC2530 所開發之模組,以及 Analog Devices 之 Energy Metering IC – ADE7763,並使用 Switching Power