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多組偏壓侷域之量子尖端接觸元件的電性量測

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(1)國. 立. 交. 通. 大. 學. 電 子 物 理 研 究 所 碩 士 論 文 多組偏壓侷域之量子尖端接觸元件的電性量測 Electrical transport in multiple gated quantum point contacts. 研究生:陳偉仁 指導教授:許世英 副教授. 中華民國 九十四年 十月.

(2) 多組偏壓侷域之量子尖端接觸元件的電性量測 Electrical transport in multiple gated quantum point contacts 研究生:陳偉仁. student:Wei-Ren Chen. 指導教授:許世英. Advisor:Dr.Shih-Ying Hsu 國立交通大學 電子物理研究所 碩士論文 A Thesis. Submitted to Institute of Electrophysics College of Science National Chiao Tung University In Partial Fulfillment of Requirements For the Degree of Master of Science In Electrophysics October 2005 Hsinchu, Taiwan, Republic of China. 中華民國九十四年十月.

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