A-68.5 dB IM3 Low-Voltage CMOS Transconductor with Wide Tuning Range
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(2) LETTER. 1557. Fig. 1. The implementation of the proposed transconductor circuit.. VD1 = VGS 6 − VGS 3 = (2Ib /K)1/2 − (ID1 /K)1/2 and VD2 = VGS 6 − VGS 4 = (2Ib /K)1/2 − (ID2 /K)1/2 . Also, from (3), Vcm − VX − Vth = (2Ib /K)1/2 and VX = Vcm − Vth − (2Ib /K)1/2 . By inserting these results into (1), with only one variable ID1 left in the equation, ID1 can be solved and obtained. Similarly, ID2 can be solved from (2) as well. The currents ID1 and ID2 would be a function of the input differential voltage. To analyze the linearity of the output current iout = ID1 − ID2 against the input voltage under the differential structure, a Taylor series expansion has been used, where the relationship could be summarized by. 3 (β − 2α)3 α (6) 2 (β − α) β2 − 2αβ − α2 3 2Ib and β = Vcm −Vth where K1 = K2 = K6 = K, α = K. circuit. This is because the input common-mode voltage is directly sensed at the gate terminal of transistor M6. If the input common-mode voltage is changed, the variation would appear at the source node of transistor M6, that is, the source nodes of transistors M1 and M2. Therefore, the common-mode current would not be changed since the gate and source voltage of transistors M1 and M2 vary in the same direction simultaneously. Low distortion voltage-to-current conversion is obtained under the defined bias conditions, and furthermore, a transconductance tuning ability can be added with a high linearity current multiplier circuit, which is composed of transistors M7 to M10 in Fig. 1. The transistors would operate in the weak inversion region while proper sizing is required. For a MOSFET operating in the weak inversion region with VDS larger than a few times the thermal voltage UT , its current exhibits an exponential dependence on VGS and can be expressed as VGS W ID = ID0 exp (8) L nUT. In (4), the output current can be seen to be a nonlinear function of the input differential voltage. Since the evenorder harmonic terms could be cancelled out by the differential structure, the third-order harmonic distortion would become the dominant component. We can find that to minimize the third-order distortion term, the following equation should be satisfied. 2Ib Vcm − Vth (7) = K6 2. where W and L are the width and the length of the transistor, respectively, ID0 is the reverse saturation current, n is the subthreshold slope factor, and UT is the thermal voltage. From the above equation, we can find that ID7 L7 VS G7 = nUT ln (9) ID0 W7 ID8 L8 (10) VS G8 = nUT ln ID0 W8. If the above condition is held, only the fifth or higher order distortion terms are left in (4) and these nonlinear terms have very low contribution to the proposed circuit. The input common-mode voltage is detected by using extra resistors, and the resistors are designed without degrading the input signal performance. In addition, this circuit would not need extra common-mode feedfoward (CMFF). The device sizes of transistors M7 and M8 are set to be the same. We can obtain from the linear voltage-to-current conversion circuit, ID7 = I1 + ii and ID8 = I1 − ii . Therefore, I1 +ii (11) ΔV = VS G7 −VS G8 = VGS 9 −VGS 10 = nUT ln I1 −ii. iout = a1,out vd + a2,out v2d + a3,out v3d + a4,out v4d + L ⎛ ⎞ 1 ⎜⎜⎜⎜ β2 − 3βα + α2 ⎟⎟⎟⎟ a1,out = Gm = K ⎜⎝α − ⎟⎠ 2 α2 + 2βα − β2. (4) (5). a3,out = −. The subthreshold slope factor n is equal to (Cox +.
(3) IEICE TRANS. FUNDAMENTALS, VOL.E93–A, NO.8 AUGUST 2010. 1558. Fig. 3. Fig. 2. Die photograph.. The simulated Gm range of the proposed transconductor.. Cdepl )/Cox [7], where Cox and Cdepl are the gate and depletion capacitance per unit area, respectively. We can find that the factor Cox is almost equal for NMOS and PMOS devices from the process device model. Besides, Cdepl would be changed according to the size of MOSFET, and we can design a specified ratio of NMOS and PMOS to obtain the same capacitance. The current output from the differential pair of transistors M9 and M10 can be expressed by ID9 =. ID10 =. 2I2 1+e. ΔV nUT. 2I2 −ΔV. 1 + e nUT. 2I2 I2 = I2 − ii I1 I1 + ii 1+ I1 − ii 2I2 I2 = I2 + ii = I1 I1 − ii 1+ I1 + ii. =. (13). Finally, the output current io is given by io = ID10 − I2 = I2 − ID9 =. I2 ii I1. Fig. 4. (12). (14). With the weak inversion characteristic, the input voltage should be logarithmically determined at first and through the exponential function, the output current would have a linear relationship. In other words, the output current is equal to a scaled version of the input current where the scaling factor is determined by the ratio of two bias currents. In our proposed circuit, the output current can be tuned by tuning the bias current I2 at the output stage. The high linearity characteristic can also be maintained when the circuit operates from the weak inversion region to the moderate inversion region, and thus the tuning range could be further extended. The transconductor was designed in the TSMC 0.18-μm Deep N-Well CMOS process, with a 1V supply. The power consumption is less than 0.24 mW. Figure 2 shows the large signal simulation of the transconductance with respect to the function of applied differential input voltage. With the scalable tuning current, the tuning range of 10 μS to 230 μS can be obtained. The chip photograph is shown in Fig. 3 with the active area less than 0.03 mm2 . The third-order inter-modulation (IM3) distortion measured with two sinusoidal tones of 400 mV pp am-. The measured IM3 of the proposed transconductor.. plitude at the transconductance of 100 μS is shown in Fig. 4. The IM3 is shown to be less than −68.5 dB at a frequency of 2 MHz. When we increase the transconductoance value to 230 μS, the IM3 is kept at −68.3 dB. The IM3 becomes −70 dB at the transconductance of 10 μS. The IIP3 can be obtained by using the IM3 results in different input signal swings. In this design, the IIP3 is 28 dBm. However, due to the limited supply voltage of 1 V, the P1 dB is 6.5 dBm. The circuit works under the differential fashion, and thus the noise performance is highly dependent on the aspect ratio of input transistors M1 and M2. In this circuit, a large aspect ratio of input transistors is designed and the measured √ input-referred noise of the transconductor is 9 nV/ Hz at 1 MHz. 3.. Paragraphs and Itemizations. A CMOS implementation of a wide tuning range transconductor is presented. Linear region MOS transistors are used to perform the voltage-to-current conversion and the thirdorder harmonic distortion term can be minimized by providing suitable bias conditions. The current multiplier makes use of weak inversion region MOS transistors to achieve high linearity. The theoretical analysis of the high performance operation and the results are provided to demonstrate the validity of the transconductor..
(4) LETTER. 1559. Acknowledgments The authors would like to thank the National Chip Implementation Center of Taiwan for supporting the chip fabrication. References [1] T.Y. Lo and C.C. Hung, “A 40 MHz double differential-pair CMOS OTA with −60 dB IM3,” IEEE Trans. Circuits Syst. I, vol.55, no.2, pp.258–265, Feb. 2008. [2] S.R. Zarabadi, M. Ismail, and C.C. Hung, “High performance analog VLSI computational circuits,” IEEE J. Solid-State Circuits, vol.33,. no.4, pp.644–649, April 1998. [3] J.L. Pennock, “CMOS Triode transconductor continuous time filters,” Proc. IEEE CICC, pp.378–381, 1986. [4] C. Yoo, S.W. Lee, and W. Kim, “A ±1.5-V, 4-MHz CMOS continuoustime filter with a single-integrator based tuning,” IEEE J. Solid-State Circuits, vol.33, no.1, pp.18–27, Jan. 1998. [5] F. Yang and C.C. Enz, “A low-distortion BiCMOS seventh-order Bessel filter operating at 2.5 V supply,” IEEE J. Solid-State Circuits, vol.31, no.3, pp.321–330, March 1995. [6] R.G. Carvajal, J. Ramirez-Angulo, A.J. Lopez-Martin, A. Torralba, J.A.G. Galan, A. Carlosena, and F.M. Chavero, “The flipped voltage follower: A useful cell for low-voltage low-power circuit design,” IEEE Trans. Circuits Syst. I, vol.52, no.7, pp.1276–1291, July 2005. [7] D.A. Johns and K. Martin, Analog Integrated Circuit Design., John Wiley & Sons, New Jersey, 1997..
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