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[PDF] Top 20 Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL

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Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL

Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL

... Abstract The purpose of process capability analysis is to provide numerical measures on whether a process is capable of reproducing items meeting the manufacturing ... See full document

10

Process capabitity assessment for index C-pk based on bayesian approach

Process capabitity assessment for index C-pk based on bayesian approach

... Abstract. Process capability indices have been proposed in the manufacturing industry to provide numerical measures on process reproduction capability, which are effective ... See full document

14

Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance

Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance

... implemented for monitoring process stability. The purpose of the present paper is to consider the capability estimation and testing of the one-sided ... See full document

20

A note on Bayesian estimation of process capability indices

A note on Bayesian estimation of process capability indices

... of the index is not very useful in making reasonable decision on the capability of a ...estimate approach is more ...review on the most popular PCIs, C p , C ... See full document

10

A Bayesian approach based on multiple samples for measuring process performance with incapability index

A Bayesian approach based on multiple samples for measuring process performance with incapability index

... concerning the process accuracy and the process precision, has been proposed to the manufacturing industry for measuring process ...concerning the ... See full document

3

Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process

Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process

... Several process capability indices, including C p , C pk , and C pm , have been proposed to provide numerical measures on manufacturing potential and actual ... See full document

10

Testing process capability for one-sided specification limit with application to the voltage level translator

Testing process capability for one-sided specification limit with application to the voltage level translator

... Engineering and Management, National Chiao Tung University, Taiwan 30050, ROC Received 8April 2002; received in revised form 30 May 2002 Abstract Process capability indices C PU ... See full document

9

A Bayesian approach for assessing process precision based on multiple samples

A Bayesian approach for assessing process precision based on multiple samples

... make the estimation of these capability indices meaningful, we would check if the manufacturing process is under statistical control and the distribution is ...normal. ... See full document

11

Measuring process capability based on Cpmk with gauge measurement errors

Measuring process capability based on Cpmk with gauge measurement errors

... Engineering and Management, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan, Republic of China Due to their effectiveness and simplicity of use, the process ... See full document

18

An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators

An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators

... assessing the performance of normal stable manufacturing processes with one-sided specification limits, process capability indices C PU and C PL ... See full document

8

Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics

Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics

... about one- third of the total wafer manufacturing costs, is one of the most complex operations and is the most critical process in semiconductor man- ...determine ... See full document

6

Multiple-process performance analysis chart based on process loss indices

Multiple-process performance analysis chart based on process loss indices

... statistical process control techniques for mon- itoring and surveillance of the ...However, process capability analysis is a vital part of an overall quality-improvement ... See full document

8

Testing Reliability Assurance Using Capability Indices CPU and CPL Based on Multiple Samples with Variable Sample Size

Testing Reliability Assurance Using Capability Indices CPU and CPL Based on Multiple Samples with Variable Sample Size

... Using Process Capability Indices C P U and C P L 63 cesses with one-sided specification ...of the estimators of C P U and C P L have ... See full document

20

Measuring process yield based on the capability index C-pm

Measuring process yield based on the capability index C-pm

... Abstract Process capability indices C p , C a , C pk and C pm have been proposed to the manufacturing industry as capability mea- sures based ... See full document

6

A Bayesian approach to obtain a lower bound for the C-pm capability index

A Bayesian approach to obtain a lower bound for the C-pm capability index

... sensors. The instrumentation amplifier can be used over a wide range of gain, accommodating a variety of input signals and ...controls the bridge excitation voltage. It provides the ... See full document

14

A Bayesian-like estimator of the process capability index C-pmk

A Bayesian-like estimator of the process capability index C-pmk

... proposed the capability index C pmk , and inves- tigated the statistical properties of its natural estimator ^ C C pmk for stable normal processes with constant ... See full document

10

Testing process capability based on C-pm in the presence of random measurement errors

Testing process capability based on C-pm in the presence of random measurement errors

... BSTRACT Process capability indices have been widely used in the manufacturing industry providing numerical measures on process ...performance. The index C p ... See full document

24

An overview of theory and practice on process capability indices for quality assurance

An overview of theory and practice on process capability indices for quality assurance

... around the target ...asymmetric process capability index C pa , and using unilateral characteristics, Chen et ...a process capability analysis chart (PCAC) to evaluate ... See full document

22

The performance of process capability index C-s on skewed distributions

The performance of process capability index C-s on skewed distributions

... DOWN FOR ARTICLE Taylor & Francis makes every effort to ensure the accuracy of all the information (the “Content”) contained in the publications on our ...agents, and our ... See full document

18

The communion bridge to Six Sigma and Process capability indices

The communion bridge to Six Sigma and Process capability indices

... 題名: The communion bridge to Six Sigma and Process capability indices 作者: Chen, ...Y.;Hsu, C. H. 貢獻者: 亞洲大學經營管理學系 關鍵詞: Six Sigma;Process capability ... See full document

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