[PDF] Top 20 An EWMA-Based Process Mean Estimator with Dynamic Tuning Capability
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An EWMA-Based Process Mean Estimator with Dynamic Tuning Capability
... and an MBA degree from San Jose State University in ...Senior Process Engineer at National Semiconductor Fairchild Research Center, Santa Clara, ...been an Associate Professor in the Graduate ... See full document
10
A time-varying weights tuning method of the double EWMA controller
... manufacturing, EWMA controllers are sometimes called bias tuning ...The EWMA-based controllers are used for compensating against disturbances which a5ect the run-by-run variability in quality ... See full document
8
Fuzzy inference to assess manufacturing process capability with imprecise data
... estimate mean and variance parameters of normal ...sample mean X and the sam- ple variance S 2 n is established by a set of confidence intervals, one on top of the other, and triangular shaped fuzzy numbers ... See full document
19
M-estimator based Robust Radial Basis Function Neural Networks with Growing and Pruning Techniques
... 1: INTRODUCTION The radial basis function (RBF) neural network is considered as a good candidate for approximation and prediction problems due to its rapid learning capacity. In typical RBF networks, the Gaussian ... See full document
5
Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process
... the process mean between the two specification limits, the proximity to the target value, and the process ...useful capability index for processes with two-sided specification ...limits. ... See full document
10
Optimal Tool Replacement For Processes With Multiple Characteristics Based On Capability Index
... for dynamic processes and apply the mean square error (MSE) associated with the regression relationship in the following ...consistent process drift in many applications. The effects of tool ... See full document
33
Testing process capability for one-sided specification limit with application to the voltage level translator
... normal process. The sample mean X ¼ 4:94 and sample standard de- viation S ¼ 0:43 are first ...the estimator e C C PU ¼ b n1 ðUSL X Þ=ð3SÞ ¼ ...2 based on C ¼ 1:25, a ¼ 0:05, and n ¼ ... See full document
9
An alternative mean estimator for processes monitored by SPC charts
... duction process to its satisfactory operational ...the process that complete the statistical process control ...the process, necessary corrective actions or process adjustment are ... See full document
17
Measuring process capability based on Cpmk with gauge measurement errors
... the process capability indices C p , C pk , and C pm have been popularly accepted in the manufacturing industry as management tools for evaluating and improving process ...account process ... See full document
18
A Bayesian-like estimator of the process capability index C-pmk
... the capability index C pmk , and inves- tigated the statistical properties of its natural estimator ^ C C pmk for stable normal processes with constant mean ...new estimator ~ C C pmk ... See full document
10
Cholesteric liquid crystal laser with wide tuning capability
... Merck兲 with a nematic liquid crystal 共ZLI2293, Merck兲 in a suitable ...into an empty cell that was made from two glass plates coated with indium tin oxide and separated by a 25- m-thick ...coated ... See full document
3
On-line tuning of a single EWMA controller based on the neural technique
... To link to this article: http://dx.doi.org/10.1080/00207540410001661409 PLEASE SCROLL DOWN FOR ARTICLE Taylor & Francis makes every effort to ensure the accuracy of all the information (the “Content”) contained in the ... See full document
17
Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics
... (ICs) with smaller devices and feature sizes on wafers of larger di- ameters has been a trend in the semiconductor industry in order to achieve a smaller die size, lower electric power consump- tion, more rapid ... See full document
6
Process capability analysis for an entire product
... product with both symmetric and asymmetric bilateral ...is based on the critical values of individual process capabilities for the multi-process product, marking the process ... See full document
13
Dynamic average method for cycle time estimator in an IC fab
... The proposed algorithm is based on a dynamic average of historical process data stored in database to generate run- time, wait-time and hold-time information, and the res[r] ... See full document
4
An improved BJT-based silicon retina with tunable image smoothing capability
... Retina with Tunable Image Smoothing Capability Chung-Yu Wu, Fellow, IEEE, and Hsin-Chin Jiang, Student Member, IEEE Abstract—An improved bipolar junction transistor (BJT) based silicon retina ... See full document
8
An application of non-normal process capability indices
... Numerous process capability indices, including C p , C pk , C pm , and C pmk , have been proposed to provide measures of process potential and ...compared with the four basic ...measuring ... See full document
6
An SOM-based algorithm for optimization with dynamic weight updating
... the dynamic system is tackled, the SOM learning may involve system parameters that fall in quite different ranges, ...in an individual basis, in learning the system param- ...problems with one ... See full document
12
Capability adjustment or gamma processes with mean shift consideration in implementing Six Sigma program
... the process mean (see ...a process mean shift, then the process is not under ...momentary process mean shifts, it may be beyond the control chart detection ... See full document
13
Measuring process yield based on the capability index C-pm
... Abstract Process capability indices C p , C a , C pk and C pm have been proposed to the manufacturing industry as capability mea- sures based on various criteria including variation, ... See full document
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