[PDF] Top 20 Simultaneous capture and shift power reduction test pattern generator for scan testing
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Simultaneous capture and shift power reduction test pattern generator for scan testing
... high power because too many faults are compacted in the first few ...post-fill test regeneration. The high-power CASPR patterns are removed at the cost of a few new ...peak power of CASPR is ... See full document
10
Reduction of Test Power during Test Application in Full-Scan Sequential Circuits with Multiple Capture Techniques
... during scan shift or capture cycles, thus the average and peak power dissipation can be ...multiple capture technique workable, we have developed a pattern insertion ... See full document
6
Scan-Cell Reordering for Minimizing Scan-Shift Power Based on Nonspecified Test Cubes
... algorithm for finding a Hamiltonian path with minimal W TC total ...experiments for ROBPR on the same benchmark circuits and test patterns as in Section ...less scan-in transitions but ... See full document
29
Scan-chain reordering for minimizing scan-shift power based on non-specified test cubes
... experiments for ROBPR on the same benchmark circuits and test patterns as in ...less scan-in transitions but only 3.82% more scan-out transitions com- pared to ...significant ... See full document
8
On Reducing Test Power and Test Volume by Selective Pattern Compression Schemes
... low power, scan chain, test data ...of scan cells. It makes the large scale chip designs require larger test data volume and longer scan ...the test data volume, ... See full document
5
Generation of Multiple Primary Input Blocking Patterns for Power Minimization during Scan Testing
... original scan chain into several scan paths and activates these scan paths using different enable ...one scan path is activated to restrict the scan ...whole scan chain ... See full document
6
A test clock reduction method for scan-designed circuits
... In the second phase, from the compact combinational test set for these rernain- ing faults from phase one, two active overlapping tech- niques, maximum overlapping and [r] ... See full document
9
Jump scan: a DFT technique for low power testing
... Low power DFT techniques ensure correct operations of the CUT in test ...technique for low power testing. As opposed to traditional Mux-scan chains which shift one bit per ... See full document
6
Test time reduction for scan-designed circuits by sliding compatibility
... To minimize the additional testing time while retaining test quality of scan design, various scan clock reduction methods have been proposed[l-5 ,7J.. These prevlous work[r] ... See full document
6
Test time reduction for scan-designed circuits by sliding compatibility
... To show the effectiveness of our method (ACT), these test clock reduction techniques proposed in this paper have been implemented on SUN4-SPARC2 workstation and 22 ISCAS[r] ... See full document
8
Test time reduction in scan designed circuits
... Significan- t reduction in scan and test application time can be obtained with this simple two phase testing strategy.. The balance between these two phases can be deter- m[r] ... See full document
5
Don’t-Care Bits Filling for Capture Power Reduction
... the test power dissipation during capture ...each scan cell which estimates the potential on incurring cascaded transitions in the circuit under test (CUT) and obtain an optimal ... See full document
6
A Generic Multi-Dimensional Scan-Control Scheme for Test-Cost Reduction
... multi-dimensional scan shift control test scheme to re- duce test power, test data volume, and test time with small area ...the power reduction in ... See full document
15
Reducing Test Power by Partial Gating on Scan-Chain Outputs
... much power during testing usually destroy integrated circuits or provide wrong test ...Low-power testing methods therefore become very important ...down testing power. In ... See full document
7
A multilayer data copy test data com pression scheme for reducing shifting-in power for multiple scan design
... (MDC), for multiple-scan-chain designs to reduce the test data volume and test power ...simple and easy to be implemented without requiring any knowledge of coding ... See full document
10
Simultaneous Application of Power Management Scheduling and Operation Delay Selection for Peak Power Minimization
... peak power may lead to logic errors due to voltage drops or reliability problems due to ...portable and wireless communication, low power design is getting very ...efficient power management ... See full document
6
A simple tree pattern matching algorithm for code generator
... In order t o generate the machine assembly code, the instruction description of a target machine can be represented by the tree-rewriting rules which contain macro [r] ... See full document
6
Noise reduction using simultaneous masking property and SNR variation for various noise corruptions
... Abstract:A speech enhancement algorithm adapted by both intra- frame masking properties of the human auditory system and inter- frame SNR variation is proposed to enhance a speech signal corrupted by colored ... See full document
2
Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume
... Experimental results show that compared with the previous test-per-clock techniques based on the LFSR- and twisted-ring-counter-reseeding methods, our method can reduce the test sequen[r] ... See full document
1
Compilers for Leakage Power Reduction
... Compilers for Leakage Power Reduction YI-PING YOU, CHINGREN LEE, and JENQ KUEN LEE National Tsing Hua University Power leakage constitutes an increasing fraction of the total ... See full document
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