[PDF] Top 20 Test time reduction in scan designed circuits
Has 10000 "Test time reduction in scan designed circuits" found on our website. Below are the top 20 most common "Test time reduction in scan designed circuits".
Test time reduction in scan designed circuits
... Significan- t reduction in scan and test application time can be obtained with this simple two phase testing strategy.. The balance between these two phases can be deter- m[r] ... See full document
5
Test time reduction for scan-designed circuits by sliding compatibility
... To minimize the additional testing time while retaining test quality of scan design, various scan clock reduction methods have been proposed[l-5 ,7J.. These prevlous work[r] ... See full document
6
Test time reduction for scan-designed circuits by sliding compatibility
... To show the effectiveness of our method (ACT), these test clock reduction techniques proposed in this paper have been implemented on SUN4-SPARC2 workstation and 22 ISCAS[r] ... See full document
8
A test clock reduction method for scan-designed circuits
... In the second phase, from the compact combinational test set for these rernain- ing faults from phase one, two active overlapping tech- niques, maximum overlapping and [r] ... See full document
9
Reduction of Test Power during Test Application in Full-Scan Sequential Circuits with Multiple Capture Techniques
... a time during scan shift or capture cycles, thus the average and peak power dissipation can be ...occurred in multiple capture ...the scan chain into don’t care bit sub-scan chain (DCS) ... See full document
6
Simultaneous capture and shift power reduction test pattern generator for scan testing
... compacted in the first few ...ATPG test set to reduce power, as suggested by previous techniques, can be very time-consuming since almost every test pattern from regular ATPG needs ... See full document
10
A Generic Multi-Dimensional Scan-Control Scheme for Test-Cost Reduction
... CONCLUSION In this paper, we propose a multi-dimensional scan shift control test scheme to re- duce test power, test data volume, and test time with small area ...power ... See full document
15
Flip-flop selection for mixed scan and reset design based on test generation and structure of sequential circuits
... CONCLUSIONS In this work, a novel methodology for flip-flop selection for partial resetting and partial scanning on sequential circuits designed to improve testability has been ...of test ... See full document
16
Scan-Cell Reordering for Minimizing Scan-Shift Power Based on Nonspecified Test Cubes
... benchmark circuits and test patterns as in Section ...that, in average, ROBPR can generate 34.87% less scan-in transitions but only ...more scan-out transitions com- pared ... See full document
29
Scan-chain reordering for minimizing scan-shift power based on non-specified test cubes
... of scan-shift transitions and estimated wire length after ...less scan-shift transitions and ...of scan paths, compared to [24]. The reduction of the total wire length by [24] is mainly ... See full document
8
Structural fault based specification reduction for testing analog circuits
... Conclusion In this paper, we have presented an approach to reduce the number of test specifications for analog ...reduce test specifications with a testing confidence ...continuous time state- ... See full document
11
A multilayer data copy test data com pression scheme for reducing shifting-in power for multiple scan design
... was in C++ and applied to several benchmark ...MDCGEN, test sets were generated with the same fault coverage as that of a commercial tool Syntest ...shown in Table I. In the table, we present ... See full document
10
Diagnosis of Multiple Hold-time and Setup-time Faults in Scan Chains
... the scan chains. Observe the scan outputs of good ...the scan outputs of the other ...the scan chain without being changed by ...shifted in without observing any SO or PO. At this ... See full document
6
Evaluation of Scan and Association Process for Real-Time Communication in Mobile WiMAX
... handover in Mobile WiMAX [2]. Most of these studies assume that the scan and association process can be done in the background and before handover without influencing the current ...the scan ... See full document
4
Reducing Test Power by Partial Gating on Scan-Chain Outputs
... integrated circuits or provide wrong test ...power. In this study, we propose a method to reduce power during test by selecting partial flip-flops for inserting control ...paths in ... See full document
7
The burn-in test scheduling problem with batch dependent processing time and sequence dependent setup time
... Conclusions In this paper burn-in test scheduling problem (BTSP) has many real-world applications, involving the constraints of batch dependent processing time, sequence dependent setup ... See full document
14
Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume
... Experimental results show that compared with the previous test-per-clock techniques based on the LFSR- and twisted-ring-counter-reseeding methods, our method can reduce the test sequen[r] ... See full document
1
Reschedulable-Group-SCAN scheme for mixed real-time/non-real-time disk scheduling in a multimedia system
... works In past years,various real-time disk scheduling al- gorithms have been developed to heuristically employ a seek-optimizing SCAN scheme for an EDF schedule to reduce the disk service ...known ... See full document
10
Characterization of SOA in Time Domain and the Improvement Techniques for Using in High-Voltage Integrated Circuits
... System-on-Chip in Taiwan during 2010–2011 and has been serving as the Executive Director of the National Science and Technology Program on Nano Technology in Taiwan ...(2011–2014). In the technical ... See full document
9
A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume
... new test-per-clock BIST method that attempts to minimize the test sequence length and the test data volume ...one time so as to minimize the number of seeds. To shorten the test ... See full document
6
相關主題