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The sensitivity of SiGe nanowires after the oxidation of

Chapter 3 Results & Discussion

3.2 The sensitivity of SiGe nanowire sensor with various oxidation

3.2.4 The sensitivity of SiGe nanowires after the oxidation of

We expected the sensitivity of SiGe nanowires were further enhanced by oxidation. Therefore, we change temperature of oxidation process (T=950℃). Unfortunately, some of nanowires were failure (Si0.8Ge0.2, Si0.7Ge0.3 and Si0.6Ge0.4), the reason may be nanowires were over oxidized.

After the oxidation of 2min at 950℃, the ID-VD curve of SiGe nanowires were shown in Figures 3-33~3-34. The average conductance of

SiGe nanowires between VD= 4V to VD= 8V, was shown in Figure 3-35~3-36. Finally, the sensitivity of SiGe nanowires were shown in Figures 3-37~3-38.

We observed that the sensitivity of SiGe nanowire was enhanced by oxidation condition. After the oxidation of 2min at 950℃, the sensitivity of Si0.93Ge0.07 nanowire was enhancement as compared with the oxidation of 2min at 900℃. The result was shown in Figures 3-39~3-41. But, the sensitivity of Si0.89Ge0.11 nanowire was reduction as compared with the oxidation of 2min at 900℃. The result was shown in Figures 3-42~3-43.

The reason may be higher defect was formed during this oxidation process [46]. In addition, we also oxidized SiGe nanowires by higher temperature (T=1000℃). But, oxidation rate was too fast so that nanowires were over oxidized.

Chapter 4 Conclusions

We have successfully fabrication the SiGe nanowire with different Ge concentration respectively. In addition, we used the SiGe nanowires as bio-sensor. The 3-amino-propyl-trimethoxy-silane (APTMS) was used to modify the surface, which could connect the bio-linker. The conductance of SiGe nanowire increases owing to APTMS with positive charge. The bis (sulfosuccinimidyl) suberate sodium (BS3) as the bio-linker connected to APTMS and the conductance decreased because of negative charge. Finally, the protein immunoglobulin G (IgG) is linked to BS3, and the conductance reduces for negative charge. In order to compare the sensitivity with/without oxidation, the ∆S/S is considered. ∆S is the variation of conductance and S is the normal conductance of SiGe nanowire. We have demonstrated that the sensitivity was improved by using higher Ge concentration (7% ~ 30%) nanowire.

After the oxidation of 2 min at 900℃, the sensitivity of SiGe nanowires were enhanced. There are two reasons lead to the result. One is enhancement of surface-to-volume ratio after oxidation. The other one is Ge atom is rejected from the oxide and condensed in the remaining SiGe nanowire. In addition, we observed that oxidation rate of SiGe nanowire increase with Ge concentration. Therefore, Si0.6Ge0.4 nanowire was oxidized over.

After the oxidation of 2 min at 950℃, the sensitivity of Si0.93Ge0.07 nanowires were enhanced. The percentage change of the conductance is

9.6% for the normal state, 13.9% for the 900 ℃ oxidation and 34.76%

for 950 ℃ oxidation after APTMS modified. It is clearly observed that the sensitivity is improved by oxidation. After the oxidation of 2min at 950℃, the sensitivity (22.27%) of Si0.89Ge0.11 nanowire was reduction as compared with the oxidation (36.36%) of 2min at 900℃. The reason may be that higher defect was formed during this oxidation process. In addition, we also oxidized SiGe nanowires by higher temperature (T=1000℃). But, oxidation rate was too fast so that nanowires were over oxidized.

Chapter 5 Future Work

Due to oxygen concentration will affect whether GeO2 formed during oxidation process. We will change nitrogen/oxygen ratio to avoid GeO2 formed. In addition, we can change time of oxidation to control Ge concentration in SiGe nanowires. By changing nitrogen/oxygen ratio and time of oxidation, we will obtain optimum condition of oxidation.

Material of nanowire sensor Application

Silicon pH sensor,bio-sensor,DNA sensor and virus sensor

Metal oxide gas sensor

Polymer gas sensor

Metal gas sensor

Table 1-1

Figure 1-1. Conversion of a NW FET into NW nanosensor for pH sensing [1].

Figure 1-2. Plot of the conductance Versus pH [1].

Figure 1-3. A biotion-modified SiNW and subsequent binding of streptavidin to the SiNW surface [1].

Figure 1-4. Plot of conductance versus time for a biotin-modified SiNW,where region 1 correspond to buffer solution,region 2 corresponds to the addition of 250nM streptavidin [1].

Figure 1-5. Conductance versus time for a biotin-modified SiNW,where region 1 corresponds to buffer solution, region 2 corresponds to the addition of ~3μM m-antibiotin,and region 3 corresponds to pure buffer solution [1].

Figure 1-6. Modification scheme of the SiNW surface for the DNA detector: (1) self-assembly of 3-mercaptopropyltrimethoxysilane (MPTMS) by gas-phase reaction in Ar for 4 h; (2) covalent immobilization of DNA probes by exposing the previous surface to 5 íM solution of oligonucleotide CCT AAT AAC AAT modified with acrylic phosphoramidite at the 5¢-end for 12 h; (3) DNA detection based on hybridization between label-free complementary DNA target GGA TTA TTG TTA and the immobilized DNA probes on the SiNW surfaces. The inset is the SPV signal on a p-type Si surface at different stages of the modification; A, B, and C correspond to the schematic diagrams, D is with 25 pM solution of complementary DNA target exposed to the surface C, and E is with 25 pM solution of noncomplementary DNA (GGA TCA TTG TTA) exposed to the surface C [10].

Figure 1-7. Conductance of the same p-type SiNW, where the arrow indicates the addition of 25 pM complementary DNA (GGA TTA TTG TTA) solution [10].

Figure 1-8. Conductance (Upper) and optical (Lower) data recorded simultaneously vs. time for a single silicon nanowire device after introduction of influenza A solution. Combined bright-field and fluorescence images correspond to time points 1–6 indicated in the conductance data; virus appears as a red dot in the images [11].

Figure 1-9. Response of the SnO2 nanobelts to CO at a working temperature of 400 °C and 30% RH [13].

Figure 1-10. Measured time-dependent current through an individual CPNW sensor upon exposure to NH3 gas. The nanowire device being tested was about 335 nm in diameter [16].

Figure 1-11. Sensor resistance responses for hydrogen concentration varied in a range from 0.2 to 1% by pulses [18].

Figure 1-12. Schema of Scanning Probe Lithography (SPL).

Figure 1-13. Schema of imprint process [28].

Figure 1-14. Schematic view of iterative spacer lithography (ISL) [29].

Figure 1-15. Drain current of N- and P-MOSFETs are improved with the use of SiGe-channel [33].

Figure 1-16. The N-type sensitivity is improved with the increase concentration of Ge. [percentage % = (pH11-pH5)/pH5]

Figure 1-17. Scanning TEM image and Ge profile across the layers obtained by EDS measurement [41].

Figure 1-18. Mobility enhancement factor for the SGOI-MOSFETs as a function of the Ge fraction [47].

Si substrate 5000Å SiO2

Figure 2-1. SiO2 layer is grown on Si substrate. The thickness of SiO2 layer is 5000Å.

Figure 2-2. Defined active area. The height of oxide step is 3000Å.

Figure 2-3. Amorphous Si layer is deposited on SiO2 layer. The thickness ofα-Si layer is 150Å.

Figure 2-4. SiGe layer is deposited on α-Si layer.

Figure 2-5. Defined S/D region and nanowire.

SiGe nanowire

Figure 2-6. Remove one side of the parallel SiGe spacer.

SiGe nanowire

Al contact

Figure 2-7. Defined Al contact pad.

Figure 3-1. The Cross-Section view of the SEM of Si0.93Ge0.07 nanowire.

The height and width of Si0.93Ge0.07 nanowire are 192nm and 77nm respectively.

Figure 3-2. The Cross-Section view of the SEM of Si0.89Ge0.11 nanowire.

The height and width of Si0.89Ge0.11 nanowire are 184nm and 45.5nm respectively.

Figure 3-3. The Cross-Section view of the SEM of Si0.8Ge0.2 nanowire.

The height and width of Si0.8Ge0.2 nanowire are 159nm and 65.9nm respectively.

Figure 3-4. The Cross-Section view of the SEM of Si0.7Ge0.3 nanowire.

The height and width of Si0.7Ge0.3 nanowire are 153nm and 54.5nm respectively.

Figure 3-5. The Cross-Section view of the SEM of Si0.6Ge0.4 nanowire.

The height and width of Si0.6Ge0.4 nanowire are 153nm and 54.5nm respectively.

Figure 3-6. The Cross-Section view of the SEM of Si0.93Ge0.07 nanowire after the oxidation of 2 min at 900℃. The height and width of nanowire are 168nm and 55.9nm respectively.

Figure 3-7. The Cross-Section view of the SEM of Si0.89Ge0.11 nanowire after the oxidation of 2 min at 900℃. The height and width of nanowire are 166nm and 42.8nm respectively.

Figure 3-8. The Cross-Section view of the SEM of Si0.8Ge0.2 nanowire after the oxidation of 2 min at 900℃. The height and width of nanowire are 137nm and 47.1nm respectively.

Figure 3-9. The Cross-Section view of the SEM of Si0.7Ge0.3 nanowire after the oxidation of 2 min at 900℃. The height and width of nanowire are 121nm and 43.5nm respectively.

Figure 3-10. The Cross-Section view of the SEM of Si0.6Ge0.4 nanowire after the oxidation of 2 min at 900℃. The nanowire was oxidized over.

Figure 3-11. The Cross-Section view of the SEM of Si0.93Ge0.07 nanowire after the oxidation of 2 min at 950℃. The height and width of nanowire are 155nm and 42.9nm respectively.

Figure 3-12. The Cross-Section view of the SEM of Si0.89Ge0.11 nanowire after the oxidation of 2 min at 950℃. The height and width of nanowire are 118nm and 38nm respectively.

Unoxidation

Dry Oxidation of 2min at 900℃

height width area surface/volume

Dry Oxidation of 2min at 950℃

height width area surface/volume

Figure 3-13. Schema of mechanism of detecting IgG antibody.

Figure 3-14. The ID-VD curve of N-type Si0.93Ge0.07 nanowire. The length of nanowire is 30μm.

APTMS BS3

Figure 3-15. The ID-VD curve of N-type Si0.89Ge0.11 nanowire. The length of nanowire is 17μm.

Figure 3-16. The ID-VD curve of N-type Si0.8Ge0.2 nanowire. The length of nanowire is 13μm.

Figure 3-17. The ID-VD curve of N-type Si0.7Ge0.3 nanowire. The length of nanowire is 19μm.

Figure 3-18. The conductance of N-type Si0.93Ge0.07 nanowire changes with different chemical molecules. The length of nanowire is 30μm.

Figure 3-19. The conductance of N-type Si0.89Ge0.11 nanowire changes with different chemical molecules. The length of nanowire is 17μm.

Figure 3-20. The conductance of N-type Si0.8Ge0.2 nanowire changes with different chemical molecules. The length of nanowire is 13μm.

Figure 3-21. The conductance of N-type Si0.7Ge0.3 nanowire changes with different chemical molecules. The length of nanowire is 19μm.

Figure 3-22. The sensitivity improves with the increment of Ge concentration.

Figure 3-23. The sensitivity improves with the increment of Ge concentration.

Figure 3-24. The sensitivity improves with the increment of Ge concentration.

Figure 3-25. After the oxidation of 2min at 900℃, ID-VD curve of N-type Si0.93Ge0.07 nanowire. The length of nanowire is 50μm.

Figure 3-26. After the oxidation of 2min at 900℃, ID-VD curve of N-type Si0.89Ge0.11 nanowire. The length of nanowire is 9μm.

Figure 3-27. After the oxidation of 2min at 900℃, ID-VD curve of N-type Si0.8Ge0.2 nanowire. The length of nanowire is 15μm.

Figure 3-28. After the oxidation of 2min at 900℃, the conductance of N-type Si0.93Ge0.07 nanowire changes with different chemical molecules.

The length of nanowire is 50μm.

Figure 3-29. After the oxidation of 2min at 900℃, the conductance of N-type Si0.89Ge0.11 nanowire changes with different chemical molecules.

The length of nanowire is 7μm.

Figure 3-30. After the oxidation of 2min at 900℃, the conductance of N-type Si0.8Ge0.2 nanowire changes with different chemical molecules.

The length of nanowire is 15μm.

Figure 3-31. After the oxidation of 2min at 900℃, the sensitivity of SiGe nanowires were enhanced.

Figure 3-32. After the oxidation of 2min at 900℃, the sensitivity of SiGe nanowires were enhanced.

Figure 3-33. After the oxidation of 2min at 950℃, ID-VD curve of N-type Si0.93Ge0.07 nanowire. The length of nanowire is 20μm.

Figure 3-34. After the oxidation of 2min at 950℃, ID-VD curve of N-type Si0.89Ge0.11 nanowire. The length of nanowire is 13μm.

Figure 3-35. After the oxidation of 2min at 950℃, the conductance of N-type Si0.93Ge0.07 nanowire changes with different chemical molecules.

The length of nanowire is 20μm.

Figure 3-36. After the oxidation of 2min at 950℃, the conductance of N-type Si0.89Ge0.11 nanowire changes with different chemical molecules.

The length of nanowire is 13μm.

Figure 3-37. After the oxidation of 2min at 950℃, the sensitivity of SiGe nanowires were enhanced.

Figure 3-38. After the oxidation of 2min at 950℃, the sensitivity of SiGe nanowires were enhanced.

Figure 3-39. The sensitivity of Si0.93Ge0.07 nanowires were enhanced with different oxidation temperature.

Figure 3-40. The sensitivity of Si0.93Ge0.07 nanowires were enhanced with different oxidation temperature.

Figure 3-41. The sensitivity of Si0.93Ge0.07 nanowires were enhanced with different oxidation temperature.

Figure 3-42. The sensitivity of Si0.89Ge0.11 nanowires changed with different temperature.

Figure 3-43. The sensitivity of Si0.89Ge0.11 nanowires changed with different temperature.

Reference:

[1] Yi Cui, Qingqiao Wei, Hongkun Park, and Charles M. Lieber,

“Nanowire Nanosensors for Highly Sensitive and Selective Detection of Biological and Chemical Species”, Science, Vol. 293, 1289, (2001) [2] Hyunjin Lee, Seong-Wan Ryu, Jin-Woo Han, Lee-Eun Yu, Maesoon

Im, Chungjin Kim, Sungho Kim, Eujung Lee, Kuk-Hwan Kim, Ju-Hyun Kim, Dong-il Bae, Sang-Cheol Jeon, Kwang Hee Kim, Gi Sung Lee, Jae Sub Oh, Yun Chang Park, Woo Bo Bae, Jung Jae Yoo, Jun Mo Yang, Hee Mok Lee, and Yang-Kyu Choi, “A Nanowire Transistor for High Performance Logic and Terabit Non-Volatile Memory Devices”, Symposium on VLSI Technology Digest of Technical Papers, 144-145, (2007)

[3] G. Brambilla, F. Xu, and X. Feng, “Fabrication of optical fibre nanowires and their optical and mechanical characterization”, ELECTRONICS LETTERS, Vol 42, 8, (2006)

[4] Shih-Ching Chen, Ting-Chang Chang, Po-Tsun Liu, Yung-Chun Wu, Po-Shun Lin, Bae-Heng Tseng, Jang-Hung Shy, S. M. Sze, Chun-Yen Chang, and Chen-Hsin Lien, ”A Novel Nanowire channel Poly-Si TFT Functioning as Transistor and Nonvolatile SONOS Memory”, IEEE ELECTRON DEVICE LETTERS, Vol. 28, 9, (2007)

[5] Q. Gao, Y. Kim, H. J. Joyce, P. Lever, S. Mokkapati, M. Buda, H. H.

Tan and C. Jagadish, “Quantum Dots and Nanowires for Optoelectronic Device Application”, International Conference on Transparent Optical Networks, Vol. 2, 242, (2006)

[6] Kook-Nyung Lee, Suk-Won Jung, Won-Hyo Kim, Min-Ho Lee,

Woo-Kyeong Seong, Mira Kim, and Yoon-Sik Lee, “Fabrication of silicon Nanowire for Biosensor Application”, IEEE SENSORS, Vol. , 1269, (2006)

[7] Ajay Agarwal, I. K. Lao, K. Buddhharaju, N. Singh, N.

Balasubramanian and D. L. Kwong, “Silicon Nanowire Array Bio-sensor Using Top-down CMOS Technology”, The 14th International Conference on Solid-State Sensors, (2007)

[8] Inkyu Park, Zhiyong Li, and Albert P. Pisano, “Selective Functionalization of Silicon Micro/Nanowire Sensors via Localized Joule Heating”, Proceeding of the 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, (2007)

[9] Z. Gao, A. Agarwal, A. D. Trigg, N. Singh, C. Fang, C. H. Tung and K. D. Buddharaju, “Silicon Nanowire Arrays For Ultrasensitive Label –free Detection of DNA”, The 14th International Conference on Solid-State Sensor, (2007)

[10] Z. Li, Y. Chen, X. Li, T. I. Kamins, K. Nauka and R. S. Williams,

“Sequence- Specific Label-Free DNA Sensors Based on Silicon Nanowires ”, Nano Letters, Vol. 4, 245, (2004)

[11] Fernando Patolsky, Gengfeng Zheng, Oliver Hayden, Melike Lakadamyali, Xiaowei Zhuang and Charles M. Lieber, “Electrical detection of single viruses”, Proceeding of the National Academy Sciences of the U.S.A., Vol. 101, 14017, (2004)

[12] Zhlyong Fan, Deepanshu Dutta, Chung-Jen Chien, Hsiang-Yu Chen, Evan C. Brown, Pai-Chun Chang, and Jia G. Lu, “Electrical and photoconductive properties of vertical ZnO nanowires in high density arrays”, Applied Physics Letters, Vol. 89, 2131110, (2007)

[13] E. Comini, G. Faglia, G. Sberveglien, Zhengwei Pan and Zhong L.

Wang, “Stable and highly sensitive gas sensors based on semiconducting oxide nanobelts”, Applied Physics Letters, Vol. 81, 10, (2002)

[14] Chao Li, Daihua Zhang, Xiaolei Liu, Song Han, Tao Tang, Jie Han, and Chongwu Zhou, “In2O3 nanowires as chemical sensors”, Applied Physics Letters, Vol. 82, 10, (2003)

[15] Andrea Ponzoni, Elisabetta Comini, Giorgio Sberveglieri, Jun Zhou, Shao Zhi Deng, Ning Sheng Xu, Yong Ding, and Zhong Lin Wang,

“Ultrasenstive and highly selective gas sensors using three-dimensional tungsten oxide nanowire networks”, Applied Physics Letters, Vol. 88, 203101, (2006)

[16] Haiqing Liu, Jun Kameoka, David A. Czaplewski, and H. G.

Craighead, “Polymeric Nanowire Chemical Sensor”, Nano Letters, Vol.

4, 671, (2004)

[17] Yufeng Ma, Jianming Zhang, Guojin Zhang, and Huixin He,

“Polyaniline Nanowires on Si Surfaces Fabricated with DNA Templates”, American Chemical Society, Vol. 126, 7097, (2004)

[18] Kyun Tae Kim, Sang Jun Sim, and Sung Min Cho, “Hydrogen Gas Sensor Using Pd Nanowires Electro-Deposited Into Anodized Alumina Template”, IEEE Sensors Journal, Vol. 6, 509, (2006)

[19]Frederic Favier, Erich C. Walter, MichealP. Zach, Thorsten Benter, and Reginald M. Penner, ”Hydrogen Sensors and Switches from Electrodeposited Palladium Mesowire Arrays”, Science, Vol. 293, 2227, (2001)

[20] Woong-Ki Hong, Dae-Kue Hwang, Il-Kyu Park, Gunho Jo,

Sunghoon Song, Seong-Ju Park, and Takhee Lee, “Realization of highly reproducible ZnO nanowire field effect transistor with n-channel depletion and enhancement modes”, Applied Physics Letters, Vol. 90, 243103, (2007)

[21] Deli Wang, Yi Cui, Marc W. Bockrath, and Charles M. Lieber,

“Nanowire Crossbar Arrays as Address Decoders for Integrated Nanosystems, Zhaohui Zhong”, Science, Vol. 302, 1377, (2003)

[22] Duan, X.; Huang, Y.; Lieber, C. M., “Nonvolatile Memory and Programmable Logic from Molecule- Gated Nanowires”, Nano Letters, Vol. 2, 487, (2002)

[23] Zhong, Z.; Qian, F.; Wang, D.; Lieber, C. M. , “Synthesis of p-Type Gallium Nitride Nanowires for Electronic and Photonic Nanodevices”, Nano Letters, Vol. 3, 343, (2003)

[24] Mark S. Gudiksen, Xiangfeng Duan, Yi Cui, and Charles M. Lieber,

“Highly Polarized Photoluminescence and Photodetection from Single Indium Phosphide Nanowires, Jianfang Wang”, Science, Vol. 293, 1455, (2001)

[25] Xiangfeng Duan, Yu Huang, Ritesh Agarwal, Charles M. Lieber,

“Single-nanowire electrically driven lasers”, Nature, Vol. 421, 241, (2003)

[26] H. H. Solak, D. He, W. Li, S. Singh- Gasson, and F. Cerrina,

“Exposure of 38 nm period grating patterns with extreme ultraviolet interferometric lithography”, Applied Physics Letters, Vol. 75, 2328, (1999)

[27] R. Nemutudi, N.J. Curson, N.J. Appleyard, D.A. Ritchie, G.A.C.

Jones , “Modification of a shallow 2DEG by AFM lithography”,

Microelectronic Engineering, Vol. 57, 967, (2001)

[28] X.-M. Yan, S. Kwon, A. M. Contreras, J. Bolor, and G. A. Somorjai,

“Fabrication of Large Number Density Platinum Nanowire Arrays by Size Reduction Lithography and Nanoimprint Lithography”, vol. 5, 4, (2005)

[29] Y. K. Choi, T. J. King, C. Hu , “A Spacer Patterning Technology for Nanoscale CMOS”, IEEE Transactions on Electron Devices, Vol.

49, 436, (2002).

[30] Paritosh Mohanty, Isun Yoon, Teajoon Kang, Kwanyong Seo, Kumar S. K. Varadwaj, Wonjun Choi, Q-Han Park, Jae Pyung Ahn, Yung Doug Suh, Hyotcherl Ihee, and Bongsoo Kim, “Simple Vapor-Phase Synthesis of Single-Crystalline Ag Nanowires and Single-Nanowire Surface-Enhanced Raman Scattering”, Journal American Chemical Society, Vol. 129, 9576, (2007)

[31] Chao Li, Daihua Zhang, Song Han, Xiaolei Liu, Tao Tang, and Chonggwu Zhou, “Diameter-Controlled Growth of Single- Crystalline In2O3 Nanowires and Their Electronic Properties”, Advance Materials, Vol. 15, 143, (2003)

[32] Adam P. Robinson, Gavin Bumell, Mingzhe Hu, and Judith L.

MacManus-Driscoll, “Controlled, perfect ordering in ultrathin anodic aluminum oxide templates on silicon”, Applied Physics Letters, Vol. 91, 143123, (2007)

[33] Yee-Chia Yeo, Qiang Lu, Tsu-Jae King, Chenming Hu, Takayuki Kawashima, Masato Oishi, Supika Mashiro, and Junro Sakai,

“Enhanced Performance in Sub-100 nm CMOSFETs using Strained Epitaxial Silicon-Germanium”, IEDM, 753, (2000)

[34] “The Ge enhance the sensitivity for bio-sensor”, IEEE International Nanoelectronics Conference, (2008)

[35] J. Eugene, F. K. LeGoues, V. P. Kesan, S. S. lyer, and F. M.

d’Heurle, “Diffusion versus oxidation rates in silicon-germanium alloys”, Applied Physics Letters, Vol. 59, 1, (1991)

[36] H. K. Liou, P. Mei, U. Gennser, and E. S. Yang, “Effects of Ge con- centration on SiGe oxidation behavior”, Applied Physics Letters, Vol.

59, 10, (1991)

[37] F. K. LeGoues, R. Rosenberg, and B. S. Meyerson, “Kinetics and mechanism of oxidation of SiGe: dry versus wet oxidation”, Applied Physics Letters, Vol. 54, 7, (1989)

[38] H. Tsutsu, W. J. Edwards, and D. G. Ast, “Oxidation of polycrystalline-SiGe alloys”, Applied Physics Letters, Vol. 63, 3, (1994)

[39] Carl Wagner, “Formation ofComposite Scales Consisting of Oxides of Different Metals”, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, Vol. 99, 369, (1952)

[40] Carl Wagner, “Theoretical Analysis of the Diffusion Processes Determining the Oxidation Rate of Alloys”, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, Vol. 103, 627, (1956)

[41] T. Tezuka, N. Sugiyama, and S. Takagi, “Fabrication of strained Si on an ultrathin SiGe-on-insulator virtual substrate with a high-Ge fraction”, Applied Physics Letters, Vol. 79, 1789, (2001)

[42] N. Sugiyama, T. Tezuka, T. Mizuno, M. Suzuki, Y. Ishikawa, N.

Shibata, and S. Takagi, “Temperature effects on Ge condensation by thermal oxidation of SiGe-on-insulator structures”, Journal of Applied

Physics, Vol. 95, 8, (2004)

[43] S. Balakumar, Suo Peng, K. M. Hoe, A. Agarwal, G. Q. Lo, R.

Kumar, N. Balasubramanian, and D. L. Kwong, “SiGeO layer formation mechanism at the SiGe/oxide interface during Ge condensation”, Applied Physics Letters, Vol. 90, 32111, (2007)

[44] Shu Nakaharai, Tsutormu Tezuka, Naoharu Sugiyama, Yoshihiko Moriyama, and Shin-ichi Takagi, “Characterization of 7-nm-thick strained Ge-on-insulator layer fabricated by Ge-condensation technique”, Applied Physics Letters, Vol. 83, 17, (2003)

[45] S. Nakaharai, T. Tezuka , N. Hirashita, E. Toyoda, Y. Moriyama, N.

Sugiyama, and S. Takagi, “Generation of Crystal Defects in Ge-on-Insulator (GOI) Layers in Ge-condensation Process”, The Third International SiGe Technology and Device Meeting (ISTDM), (2006) [46] B. Vincent, J. F. Damiencourt, V. Delaye, R. Gassilloud, L.

Clavelier, and Y. Morand, “Stacking fault generation during relaxation of silicon germanium on insulator layers obtained by the Ge condensation technique”, Applied Physics Letters, Vol. 90, 074101, (2007)

[47] Tsutomu Tezuka, Naoharu Sugiyama, Tomohisa Mizuno, and

[47] Tsutomu Tezuka, Naoharu Sugiyama, Tomohisa Mizuno, and

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