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The Effects of Plasma Treatments on the Field Emission Characteristics of Silicon Nanowires 詹凱傑、李世鴻

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The Effects of Plasma Treatments on the Field Emission Characteristics of Silicon Nanowires 詹凱傑、李世鴻

E-mail: [email protected]

ABSTRACT

Silicon nanowires have been synthesized on Si substrate (100) via a Ni catalytic reaction in Ar ambience at 1000 °C for 2hr. and, the as grown silicon nanowires were treated with various plasmas for the analyses of SiNW on field emission characteristics. It must be noted that the field emissiom current of as-grown SiNW is much smaller than that of carbon nanotubes. Nevertheless, after the hydrogen plasma treatment, the screen effect of the SiNW was reduced and the electronic emissions from the surface of SiNW film were aided effectively. The SiNW will clusted together after treatment of CF4 plasma, the appearance of cluster can increase the surface density and emission sites of SiNW. Additionly, in SiNW, after CF4+H2 plasma treatment, not only the screen effect will be reduced, but also the surface density and emission sites will be increaded dramatically.

In summary, after plasma treatment, the field emission characteristics of SiNWs were impoved obviously, and could be match against that of carbon nanotubes. The SiNW can provide much potential for field emission application.

Keywords : Silicon nanowires (SiNW)、Field emission、plasma、Screening effect Table of Contents

封面內頁 簽名頁

授權書...iii

中文摘要...iv

ABSTRACT...v

誌謝...vi

目錄...vii

圖目錄...x

表目錄...xiv

第一章、簡介...1

1.1 奈米材料的歷史與簡介...1

1.2 奈米材料的特徵...4

1.2.1 表面效應...4

1.2.2小尺寸效應...5

1.2.3量子穿隧效應...7

1.3 奈米材料的應用...9

1.3.1 場發射電子源...12

1.3.2 場發射電子源的特性...12

第二章、文獻回顧...14

2.1 氫氣電漿處理文獻...14

2.2 氫氣退火處理文獻...20

2.3 研究動機...23

第三章、理論與研究方法...25

3.1 電子場發射理論...25

3.2 奈米線的成長機制...28

3.2.1 Vapor-Liquid-Solid (VLS)...29

3.2.2 氧化物輔助生長 (Oxide-Assisted Growth, OAG)...31

3.2.3 Vapor-Solid (VS)...33

3.2.4 Solution-Liquid-Solid...34

3.2.5 Solid-Liquid-Solid (SLS)...36

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3.2.6 Solid-Solid transformation (SS)...38

3.3 電漿蝕刻機制...39

3.4 實驗儀器原理...40

3.4.1 熱蒸鍍系統...40

3.4.2 高溫爐管系統...41

3.4.3 電漿蝕刻系統...42

3.4.4 掃描式電子顯微鏡系統...45

3.4.5 能量散佈分析儀系統...46

3.4.6 場發射量測裝置系統...48

3.5 實驗步驟...50

3.5.1 蒸鍍...50

3.5.2 成長矽奈米線...51

3.5.3 電漿後處理...52

3.5.4 電性量測...52

第四章、實驗結果與討論...53

4.1 CF4電漿後處理對矽奈米線的研究與討論...53

4.1.1 掃瞄式電子顯微鏡(SEM)的分析...53

4.1.2 能量散佈分析儀(EDS)的分析...57

4.1.3 電子場發射的分析...59

4.2 H2電漿後處理對矽奈米線的研究與討論...64

4.2.1 掃瞄式電子顯微鏡(SEM)的分析...64

4.2.2 能量散佈分析儀(EDS)的分析...66

4.2.3 電子場發射的分析...68

4.3 CF4+H2電漿後處理對矽奈米線的研究與討論...72

4.3.1 掃瞄式電子顯微鏡(SEM)的分析...72

4.3.2 能量散佈分析儀(EDS)的分析...75

4.3.3 電子場發射的分析...77

4.4 不同電漿處理對矽奈米線的研究與討論...82

4.4.1 掃瞄式電子顯微鏡(SEM)的分析比較...82

4.4.2 能量散佈分析儀(EDS)的分析比較...83

4.4.3 電流密度的分析比較...84

第五章、結論...86

參考文獻...87 REFERENCES

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