• 沒有找到結果。

HOE enhances AFM performance through its features of compact configuration, small size, and high sensitivity. This unique capability and easy optical adjustment of HOE can make the AFM system much more desirable than the conventional optical lever method.

For understanding the optical properties of HOE, theoretical analyses by ray-tracking method describe the optical model of holographic pickup head. For the consistency of the theoretical analysis, the software simulation is made to verify the optical properties of holographic pickup head. Through comprehensively studying the effect between the optical components and light spot, the optical system for the AFM is adaptively optimized.

The performances of the holographic pickup head are experimentally verified. The derivations of translational S-curve with different objective lens show the relationship between depth of focus and linear region. The relationships between angular signal and angle for bending and torsion are demonstrated. The peak to peak voltage of translational S-curve decreases gradually with the increase of water thickness. The linear region increases gradually with the increase of water thickness. During the experiment, the thermal fluctuation method simplifies the procedure of spring constant calibration.

Besides, the cantilever motion measurements are examined the translational and angular detection functions with high sensitivity as 0.45 nm/mV and 0.95 μrad/mV, respectively.

For suppressing the spurious peaks in liquid, the integration of two damping plates (PEEK) and the steel structures is adopted in the probe holder. The spurious peaks are less than 4.3% and 14.5% of the resonant peaks in air and water. The spectrum of stimulated cantilever is clear and significant without any spurious peaks. This result shows that the spurious peaks can be suppressed by the probe holder effectively.

The practicality of the proposed methodology is demonstrated through the AFM scanning process to verify the stability and high resolution of the developed HOE-based AFM in air and water. Single atomic step (0.34 nm) of graphite is detected by force error signal and tracking error signal. In addition, the function of HOE-based profiler is also verified by directly measuring calibration grating with laser beam. Through successfully detecting the profiles of microcircuit and tuberose epidermis tissue, it testifies the measurement feasibility of the HOE-based profiler in micron-scale applications in scientific and engineering fields.

For observing dynamic processes in liquid, an area of future research should be considered is the high speed and high resolution AFM. Therefore, the objective lens with high numerical aperture and the high resonant frequency cantilever should be utilized.

Besides, the angular signal of holographic pickup head is proposed for improving the sensitivity. As a result, the tracking error signal is necessary for high speed AFM and torsion mode AFM.

Reference

[1] Schmalz, G.,”Ueber Glaette und Ebenheit als physikalisches und physiologisches Problem”, Zeitschrift des Vereins Deutscher Ingenieure, vol. 73, pp. 1461-1467, 1929

[2] Young, R., Ward, J., and Scire, F., “The Topografiner An Instrument for Measuring Surface Microtopography”, Review of Scientific Instruments, vol. 43, no. 7, pp.

999-1012, 1972

[3] Binnig, G., Rohrer, H., Gerber, C., and Weibel, E., “Surface Studies by Scanning Tunneling Microscopy”, Physics Review Letter, vol. 49, pp. 57-61, 1982

[4] Binnig, G., Quate, C.F., and Gerber, C., “Atomic Force Microscope”, Physics Review Letter, vol 56, no. 9, pp. 930-933, 1986

[5] Meyer, G. and Amer, N.M., “Novel optical approach to atomic force microscopy”, Applied Physics Letters, vol. 53, no. 12, pp. 1045-1047, 1988

[6] Martin, Y., Williams, C.C., and Wickramasinghe, H.K., “Atomic force microscope–force mapping and profiling on a sub 100-Å scale”, Journal of Applied Physics, vol. 61, no. 10, p. 4723, 1987

[7] Zhong, Q., Inniss, D., Kjollor, K., and Elings, V.B., “Fractured polymer/ silica fiber surface studied by tapping mode atomic force microscopy”, Surface Science Letter, vol. 290, pp. 688-692, 1993

[8] Meyer, G. and Amer, N.M., “Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope”, Applied Physics Letters, vol. 57, no. 20, p. 2089, 1990

[9] Maivald, P., Butt, H.J., Gould, S.A.C., Drater, C.B., Guriey, J.A., Elings, V.B., and Hansma, P.K., “Using force modulation to image surface elasticities with the atomic

force microscope”, Nanotechnology, vol. 2, pp. 103-106, 1991

[10] James, P.J., Antognozzi, M., Tamayo, J., McMaster, T.J., Newton, J.M., and Miles, M.J., “Interpretation of Contrast in Tapping Mode AFM and Shear Force Microscopy. A Study of Nafion”, Langmuir, vol. 17, no. 2, pp. 349-360, 2001

[11] Sulchek, T., Hsieh, R., Adams, J.D., Minne, S.C., Quate, C.F., and Adderton, D.M., ”High-speed atomic force microscopy in liquid”, Review of Scientific Instruments, vol. 71, no. 5, p. 2097, 2000

[12] Salapaka, S., Dahieh, M., and Mezic, I., “On the Dynamics of a Harmonic Oscillator Undergoing Impacts with a Vibrating Platform”, Nonlinear Dynamics, vol. 24, no. 4, pp. 333-358, 2001

[13] Roger, B., York, D., Whisman, N., Jones, M., Murray, K., Adams, J.D., Sulchek, T., and Minne, S.C., “Tapping mode atomic force microscopy in liquid with an insulated piezoelectric microactuator”, Review of Scientific Instruments, vol. 73, no.

9, pp. 3242-3244, 2002

[14] Buguin, A., Roure, O.D., and Silberzan, P., “Active atomic force microscopy cantilever for imaging in liquids”, Applied Physics Letters, vol. 78, no. 19, pp.

2982-2984, 2001

[15] Umeda, K., Oyabu, N., Kobayashi, K., Hirata, Y., Matsushige, K., and Yamada, H.,

“High-resolution frequency-modulation atomic force microscopy in liquids using electrostatic excitation method”, Applied Physics Express, vol. 3, no. 6, p. 065205, 2010

[16] Kiracofe, D., Kobayashi, K., Labuda, A., Raman, A., and Yamada, H., “High frequency laser photothermal excitation for microcantilever vibrations in air and in liquids”, Review of Scientific Instruments, vol. 82, no. 1, p. 3702, 2011

D.S., Belcher, A.M., Rangrlow, I.W., and Youce-Toumi, K., “Use of self-actuating and self-sensing cantilever for imaging biological samples in fluid”, Nanotechnology, vol. 20, no. 43, p. 434003, 2001

[18] Rensen, W.H.J., Van Hulst, N.F., and Kammer, S.B., “Imaging soft samples in liquid with tuning fork based shear force microscopy”, Applied Physics Letters, vol. 77, no.

10, pp. 1557-1559, 2000

[19] Xu, X. and Raman, A., “Comparative dynamics of magnetically,acoustically, and Brownian motion driven microcantilevers in liquids”, Journal of Applied Physics, vol. 102, no. 3, p. 34303, 2007

[20] Ando, T., Uchihasi, T., and Kordera, N., “High-speed atomic force microscopy”, Japanese Journal of Applied Physics, vol. 51, p. 08KA02, 2012

[21] Baro, A.M. and Reifenberger, R.G., “Atomic force microscopy in liquid: biological applications”, Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012, pp.189-209

[22] Ando, T., Kodere, N., Maruyama, D., Takai, E., Saito, K., and Toda, A., “A High-Speed Atomic Force Microscope for Studying Biological Macromolecules in Action”, Japanese Journal of Applied Physics, vol. 41, pp. 4850-4856, 2002

[23] Toshio, A., Takayuki, U., and Takeshi, F., “High-speed atomic force microscopy for nano-visualization of dynamic biomolecular process”, Progress in Surface Science, vol. 83, pp. 337-437, 2008

[24] Fukuma, T., Okazaki, Y., Kodera, N., Uchihasi, T., and Ando, T., “High resonance frequency force microscope scanner using inertia balance support”, Applied Physics Letters, vol. 92, pp. 243119-243122, 2008

[25] Uchihasi, T. and Ando, T., “Fast phase imaging in liquids using a rapid scan atomic force microscope”, Applied Physics Letters, vol. 89, p. 213112, 2006

[26] Quercioli, F., Tribilli, B., Ascoil, C., Baschieri, P., and Frediani, C., “Monitoring of an atomic force microscope cantilever with a compact disk pickup”, Review of Scientific Instruments, vol. 70, no. 9, pp. 3620-3624, 1999

[27] Huang, K.Y., Hwu, E.T., Chow, H.Y., and Hung, S.K., “Development of an optical pickup system for measuring the displacement of the micro cantilever”, 2005 IEEE International Conference on Mechatronics, pp. 695-698, 2005

[28] Hwu, E.T., Huang, K.Y., Hung, S.K., and Hwang, I.S., “Measurement of Cantilever Displacement Using a Compact Disk/Digital Versatile Disk Pickup Head”, Japanese Journal of Applied Physics, vol. 45, no. 3B, pp. 2368-2371, 2006

[29] Hwu, E.T., Hung, S.K., Yang, C.W., Huang, K.Y., and Hwang, I.S., “Real-time detection of linear and angular displacements with a modified DVD optical head”, Nanotechnology, vol. 19, p. 115501, 2008

[30] Liao, H.S., Huang, K.Y., Hwang, I.S., Chang, T.J., Hsiao, W.W., Lin, H.H., Hwu, E.T., and Chang, C.S., “Operation of astigmatic-detection atomic force microscopy in liquid environments”, Review of scientific instruments, vol. 84, no. 10, p. 103709, 2013

[31] Liao, H.S., Chen, Y.H., Ding, R.F., Huang, H.F., Wang, W.M., Hwu, E.T., Huang, K.Y., Chang, C.S., and Hwang, I.S., ”High-speed atomic force microscope based on an astigmatic detection system”, Review of scientific instruments, vol. 85, no. 10, p.

103710, 2014

[32] Kimura, Y., Sugama, S., and Ono, Y.,”Compact optical head using a holographic optical element for CD players”, Applied Optics, vol. 27, no. 4, pp. 668-671, 1988 [33] Shiaya, Y., Kohji, M., Kuniaki, O., Miroyuki, Y., Tetsuo, U., Keiji, S., and Yukio, K.,

“Optical pickup employing a hologram-laser-photodiode unit”, Japanese Journal of

[34] Hologram laser specifications. Model: GH6D307B5A. Sharp Corporation.

[35] Rudolf K., “Lens Design Fundamentals”, New York: Academic Press, 1998, pp.145-149

[36] Harvey, J.E., and Vernold, C.L.,”Description of Diffraction Grating Behavior in Direction Cosine Space”, Applied Optics, vol. 37, no. 34, pp. 8158-8160, 1998 [37] Damask, J.N., “Polarization Optics in Telecommunications”, Springer, pp. 221-223,

2004

[38] Liu, G., Zhi, Z., and Wang, R.K., “Digital focusing of OCT images based on scalar diffraction theory and information entropy”, Biomedical Optics Express, vol. 3, no.

11, pp. 2774-2783, 2012

[39] Garcia, R. and Perez, R., “Dynamic atomic force microscopy methods”, Surface Science Reports, vol. 47, pp. 197-301, 2002

[40] Clough, R.W. and Penzien, J., “Dynamics of structures”, California: Computer &

Structure, Inc, 3rd ed., 2003, pp 377-385

[41] Van Eysden, C.A. and Sader, J.E., “Frequency response of cantilever beam immersed in viscous fluids with applications to the atomic force microscopy: arbitrary mode order”, Journal of Applied Physics, vol. 101, p. 044908, 2007

[42] Sader, J.E., “Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope”, Journal of Applied Physics, vol.

84, no.1, pp. 64-76, 1998

[43] Liao, H.S., “Design and development of atomic force microscope systems for liquid environment”, Ph. D. Dissertation, Department of Mechanical Engineering, National Taiwan University, Taiwan, p.39, 2013

[44] Jaschke, M. and Butt, H.J., “Calibration of thermal noise in atomic force microscopy”, Neuropathology, vol. 6, pp. 1-7, 1995

[45] Burnham, N.A., Chen, X., Hogges, C.S., Matei, G.A., Thoreson, E.J., Roberts, C.J., Davies, M.C., and Tendler, S.J.B., “Comparison of calibration methods for atomic-force microscopy cantilever”, Nanotechnology, vol. 14, pp. 1-6, 2003

[46] Enders, O., Korte, F., and Kolb, H.A., “Lorentz-force-induced excitation of cantilever for oscillation-mode scanning probe microscopy”, Surface and Interface Analysis, vol. 36, pp. 119-123, 2004

[47] Jeon, S., Braiman, Y., and Thundat, Y., “Cross talk between bending, twisting, and buckling modes of three types of microcantilever sensors”, Review of Scientific Instruments, vol. 75, no.11, pp. 4841-4844, 2004

[48] Asakawa, H. and Fukuma, T., “Spurious-free cantilever excitation in liquid by piezoactuator with flexure drive mechanism”, Review of scientific instruments, vol.

80, no. 10, p. 103703, 2009

[49] Huang, Q.X., Fei, Y.T., Gonda, S., Misumi, I., Sato, O., Keem, T., and Kurosawa, T.,

“The interference effect in an optical beam deflection detection system of a dynamic mode AFM”, Measurement Science and Technology, vol. 17, pp. 1417-1423, 2006 [50] Kassies, R., van der Werf, K.O., Bennink, M.L., and Otto, C.,”Removing

interference and optical feedback artifacts in atomic force microscopy measurement by application of high frequency laser current modulation”, Review of Scientific Instruments, vol. 75, pp. 689-693, 2004

Appendix A

Specification of HOE unit

Appendix B

Specification of AD624

Appendix C

AFM probe: PPP-NCH

Appendix D

AFM probe: PPP-CONT

Appendix E

AFM probe: CSC38/Cr-Au

Appendix E

Test grating: TGQ1

Appendix F

Calibration grating: TGZ3

相關文件