In this section, the goodness of …t of the proposed model for a set of available historical in-control response vectors, fy1; : : : ; yTg, generated in a manufacturing process is discussed. Recall that ( T1; : : : ; TT)T, y (yT1; : : : ; yTT)T, Y Yn1 YnT, and F is the in-control prior c.d.f.
Consider the null hypothesis H0: 1; : : : ; T i:i:d:F 2 fF : 2 g versus the alternative H1: 1; : : : ; T i:i:d: F =2 fF : 2 g. Let F( ) denote the set of all prior c.d.f.’s on and let `(F ; y) denote the log-likelihood function of F given y.
Then
`(F ; y) log
" T Y
t=1
f (yt; F )
#
= XT
t=1
log[f (yt;F )]
XT t=1
`(F ; yt);
where
f (yt; F ) = Z
f (ytj t) dF ( t):
Let WT(y) denote the corresponding likelihood ratio (LR) statistic given y.
Then
where ^F is the non-parametric MLE of F given y under H1 and ^ is the parametric MLE of under H0. Since it takes too much time to calculate the critical point for performing the LR test, an alternative goodness-of-…t test is proposed in the paper as follows:
Note that the empirical prior c.d.f. ~F with p.m.f. T 1 PT
t=1 1f tg converges to F in distribution as T ! 1 and that, for t 2 f1; : : : ; T g, the MLE yt=nt of t
given ytconverges to tas nt! 1. Since 1; : : : ; T are unobserved, the empirical prior c.d.f. ~F is unavailable. Thus, we utilize the estimated empirical prior c.d.f. F with p.m.f. T 1 PT
t=1 1fyt=ntg to estimate F . When all of n1; : : : ; nT, and T tend to 1, F converges to F in distribution.
In the paper, consider the goodness-of-…t statistic
WT(y) 2 h
`(F ; y)jF =F ` ^; y i
2 h
`(F ; y) ` ^; y i
: (47)
One way to calculate the critical point for performing the goodness-of-…t test is as follows: First simulate an i.i.d. sample fy(1); : : : ; y(R)g, e.g., R = 50 000, from the estimated in-control marginal c.d.f. Fy; 0j 0= ^ ( Fy;^). Let (y(1); : : : ; y(R)) be a permutation of (y(1); : : : ; y(R)) such that WT(y(1)) : : : WT(y(R)). Let
be a known constant with 0 < < 1, e.g., 0:05. An approximate size 1 goodness-of-…t test is to reject H0 if and only if WT(y) > WT(y([R (1 )])), where [R (1 )] is the largest integer less than or equal to R (1 ).
The corresponding values of WT(y([R (1 )]))’s for Cases 1-4 in Section 4 are shown in Table 1, where k = 1, T = 300, n1 = : : : = nT = 300, R = 50 000, and = 0:05. And the empirical c.d.f.’s of WT(y)’s for Cases 1-4 in Section 4 are shown in Figures 1, where k = 1, T = 300, n1 = : : : = nT = 300, R = 50 000.
Table 1: The values of WT(y([R (1 )]))’s for Cases 1-4, where k = 1, T = 300, n1 = : : : = nT = nt= 300, R = 50 000, and = 0:05.
Case 1 Case 2 Case 3 Case 4
WT(y([R (1 )])) 18.1 4.90 12.7 1.78
Figure 1: The empirical c.d.f.’s of WT’s for Case 1-4, where k = 1, T = 300, n1 = : : : = nT = nt= 300, and R = 50 000.
-5.0 0.0 5.0 10.0 15.0 20.0 25.0
W*T
0.0 0.2 0.4 0.6 0.8 1.0
Empirical c.d.f.
Case 1 Case 2 Case 3 Case 4
4.90 0.95
18.1
1.78 12.7
6
SIMPLIFICATIONIn this section, the simpli…cation of the two-components mixture prior para-metric family to either the …rst or the second component prior parapara-metric family is discussed if the null hypothesis of the previous goodness-of-…t test is not rejected.
Let u 2 f1; 2g be …xed. Consider the null hypothesis Hu0: 1; : : : ; T i:i:d:F 2 fFu; u: u 2 ug versus the alternative Hu1: 1; : : : ; T i:i:d: F 2 fF : 2 g.
Let Wu;T(y)denote the LR statistic given y, where
Wu;T(y) 2
"
` ^; y sup
u2 u
XT t=1
`u( u; yt)
#
2 ` ^; y sup
u2 u
`u( u; y) 2 h
` ^; y `u ^
u; y i
(48)
with ^udenoting the MLE of ugiven y under the uth component prior parametric family.
One way to calculate the critical point for performing the LR test is as follows:
First simulate fy(u;1); : : : ; y(u;R)g, e.g., R = 50 000, from the estimated in-control marginal c.d.f. Fy;u; 0uj 0u= ^u ( Fy;u; ^
u). Let (y(u)(1); : : : ; y(u)(R)) be a permutation of (y(u;1); : : :, y(u;R)) such that Wu;T(y(u)(1)) : : : Wu;T(y(u)(R)). Let be a known constant with 0 < < 1, e.g., 0:05. An approximate size 1 LR test is to reject Hu0 if and only if Wu;T(y) > Wu;T(y(u)([R (1 )])), where [R (1 )] is the largest integer less than or equal to R (1 ).
When both H10 and H20 are rejected, the proposed two-components mixture prior parametric family for the in-control prior distribution is selected. The cor-responding monitoring technique is developed in the following section.
When H10 is not rejected but H20 is rejected, the …rst component prior
para-metric family for the in-control prior distribution is selected. The corresponding monitoring technique is developed in Chen et al. (2004).
When H10is rejected but H20is not rejected, the second component prior para-metric family for the in-control prior distribution is selected. The corresponding monitoring technique is developed in Chen et al. (2005).
When neither H10 nor H20is rejected, the model selection technique developed in Chen and Liu (2005) can be utilized. The corresponding monitoring technique is developed in either Chen et al. (2004) or Chen et al. (2005).
The corresponding values of Wu;T(y(u)([R (1 )]))’s for Cases 1-4 in Section 4 are shown in Table 2, where u 2 f1; 2g, k = 1, T = 300, n1 = : : : = nT = 300, R = 50 000, and = 0:05. And the empirical c.d.f.’s of W1;T(y)’s and W2;T(y)’s for Cases 1-4 in Section 4 are shown in Figures 2 and 3, where k = 1, T = 300, n1 = : : : = nT = 300, R = 50 000.
Table 2: The values of Wu;T(y(u)([R (1 )]))’s for Cases 1-4, where u 2 f1; 2g, k = 1, T = 300, n1 = : : : = nT = nt = 300, R = 50 000, and = 0:05.
Case 1 Case 2 Case 3 Case 4 W1;T(y(1)([R (1 )])) 2.146 1.762 0.566 1.284 W2;T(y(2)([R (1 )])) 1.035 0.653 1.789 0.335
Figure 2: The empirical c.d.f.’s of W1;T’s for Case 1-4, where k = 1, T = 300,
7
A PROCESS MONITORING SCHEMELet Pin denote the false-alarm rate, i.e., the probability that an out-of-control signal occurs when the manufacturing process is in control. Conventionally, Pin is taken to be 2 ( 3) ( 0:002 699 8), where is the c.d.f. of the standard normal distribution. In this section, utilizing the LR method, a Bayesian (or an empirical Bayes) monitoring scheme for the manufacturing process is proposed when F = F 0 2 fF : 2 g for some known (or unknown) 0 2 . The main reason for using the LR test is that it often has a higher power than other tests when the alternative hypothesis is true, which corresponds to a better detecting power in monitoring the process when the process is out of control.
In order to monitor the manufacturing process at time t (> T ), suppose that the response vector yt is observed. Then we are interested in testing whether or not the manufacturing process is in control at time t. Recall that F t is the prior c.d.f. of t and that F( ) is the set of all c.d.f.’s on .
7.1
A BAYESIAN MONITORING SCHEMEIn this subsection, consider the case where F = F 0 2 fF : 2 g for some known 0 2 . To monitor the manufacturing process at time t, the null hypothesis H0: F t = F 0 versus the alternative H1: F t 6= F 0, i.e., F t 2 F( )nfF 0g, is tested.
List all the elements of the sample space Ynt of yt by fy(1)t ; : : : ; y(jYt ntj)g, where jYntj (= (nt+ k)!=(nt!k!)) is the number of elements in Ynt. Regard F t as the unknown parameter of interest in F( ). Then the unknown parameter of inter-est is non-parametric. Let `(F t; yt) ( log[f (yt; F t)]) denote the log-likelihood
function of F t given yt. Note that
`(F t; yt) = log Z
f (ytj t) dF t( t) log Z
sup
t2
f (ytj t) dF t( t)
= log Z
f (ytj t)j t=yt=nt dF t( t) = logh
f (ytj t)j t=yt=nt
i
;
where the binomial/multinomial likelihood f (ytj t)for tgiven ytattains its max-imum at t = yt=nt: Thus, the MLE ^F t of F t given yt has p.m.f. 1fyt=ntg and
sup
F t2F( )
`(F t; yt) = `(F t; yt)jF t= ^F t ` F^ t; yt = log f (ytj t)j t=yt=nt :
Let Wt; 0(yt) denote the corresponding LR statistic, where
Wt; 0(yt) = 2 log f (ytj t)j t=yt=nt ` 0; yt (49)
with P (f0 < Wt; 0(yt) <1g; Fyt; 0) = 1.
The size PinLR test and a control chart of monitoring the LR statistic Wt; 0(yt) can be constructed as follows: Let (yt;(1); : : : ; yt;(jYntj))be a permutation of (yt(1); : : :, y(jYt ntj))such that Wt; 0(yt;(1)) : : : Wt; 0(yt;(jYntj)). Note that Wt; 0(yt)is a dis-crete random variable. If a deterministic upper control limit is used, a pre-speci…ed false-alarm rate Pin (2 (0; 1)), e.g., 2 ( 3), is nearly impossible to attain. How-ever, there is no problem to attain any pre-speci…ed false-alarm rate based on the concept of a randomized-upper-control-limit approach proposed in Shiau et al. (2005). To …nd the randomized upper control limit ( RU CL 0), we start ac-cumulating the right tail probability from Wt; 0(yt;(jYntj))until we reach the …rst r
such that P (fWt; 0(yt) Wt; 0(yt;(r))g; Fyt; 0) Pin. Denote this r by m 0, i.e.,
m 0 = max r: P Wt; 0(yt) Wt; 0 yt;(r) ; Fyt; 0 Pin : (50)
If P (fWt; 0(yt) Wt; 0(yt;(m 0))g; Fyt; 0) = Pin, which is nearly impossible, then there is no need for randomization and Wt; 0(yt;(m 0))is the upper control limit ( U CL 0). If P (fWt; 0(yt) Wt; 0(yt;(m 0))g; Fyt; 0) > Pin, then Wt; 0(yt;(m 0)) = RU CL 0. Note that there may be more than one yt;(r) such that Wt; 0(yt;(r)) = RU CL 0. Let m 0;L, m 0;U 2 f1; : : : ; jYntjg such that
Wt; 0 yt;(m 0;L 1) < Wt; 0 yt;(m 0;L) = RU CL 0 = Wt; 0 yt;(m 0;U)
< Wt; 0 yt;(m 0;U+1) ;
where Wt; 0(yt;(0)) 0 and Wt; 0(yt;(jYntj+1)) 1. Then the randomization is done by signaling an out-of-control alarm with probability
Pin; 0;RU CL = Pin P (fWt; 0(yt) > RU CL 0g; Fyt; 0) P (fWt; 0(yt) = RU CL 0g; Fyt; 0)
=
Pin PjYntj
r=m 0;U+1 P (fWt; 0(yt) = Wt; 0(yt;(r))g; Fyt; 0) Pm 0;U
r=m 0;L P (fWt; 0(yt) = Wt; 0(yt;(r))g; Fyt; 0) :(51) This leads to
Pin = P Wt; 0(yt) > RU CL 0 ; Fyt; 0
+Pin; 0;RU CL P Wt; 0(yt) = RU CL 0 ; Fyt; 0
and 0 < Pin; 0;RU CL 1. When Pin; 0;RU CL = 1, there is no need for
randomiza-tion.
The monitoring scheme is as follows: If Wt; 0(yt) > RU CL 0, then the null hypothesis H0: F t = F 0 is rejected and the manufacturing process is declared to be out of control at time t; if Wt; 0(yt) < RU CL 0, then the null hypothesis H0: F t = F 0 is not rejected and the manufacturing process is declared to be in control at time t; if Wt; 0(yt) = RU CL 0, then, with probability Pin; 0;RU CL, the null hypothesis H0: F t = F 0 is rejected and the manufacturing process is declared to be out of control at time t.
The corresponding values of RU CL 0’s and Pin; 0;RU CL’s for Cases 1-4 in Sec-tion 4 are shown in Table 3, where k = 1, T = 300, n1 = : : : = nT = nt = 300, and Pin = 2 ( 3) ( 0:002 699 8).
Table 3: The values of RU CL 0’s and Pin; 0;RU CL’s for Cases 1-4 in Section 4, where k = 1, T = 300, n1 = : : : = nT = nt = 300, and Pin = 2 ( 3) ( 0:002 699 8).
Case 1 Case 2 Case 3 Case 4
RU CL 0 10.5 10.4 10.5 10.6
Pin; 0;RU CL 0.547 0.537 0.765 0.120
7.2
AN EMPIRICAL BAYES MONITORING SCHEMEIn this subsection, consider the case where F = F 0 2 fF : 2 g for some unknown 0 2 . To monitor the manufacturing process at time t (> T ), the null hypothesis H0: F t = F 0 versus the alternative H1: F t 6= F 0 is tested.
The LR statistic Wt; 0(yt) proposed in Section 7.1 for known 0 can be esti-mated by Wt; 0(yt)j 0= ^ ( Wt;^(yt)), where ^ is the MLE of given y and
Wt;^(yt) = 2 n
log f (ytj t)j t=yt=nt ` ^; yt o
(52)
with P (f0 < Wt;^(yt) < 1g; Fyt; 0) = 1. Note that ^ = 0 + Op(1=p T ) as T ! 1, which implies that Wt;^(yt) = Wt; 0(yt) + Op(1=p
T )as T ! 1.
An empirical Bayes monitoring scheme can be constructed by replacing the unknown 0 by ^ in the Bayesian monitoring scheme described in Section 7.1, where RU CL 0 and Pin; 0;RU CL are estimated by RU CL 0j 0= ^ ( RU CL^) and Pin; 0;RU CLj 0= ^ ( Pin; ^ ;RU CL), respectively.
To see how the additional estimation error resulting from the empirical Bayes approach a¤ects the performance of the monitoring scheme, the Kullback-Leibler divergence d(F 0; F^) between F 0 and F^ can be used as a measure of how close F^ is to F 0, where F^ F j = ^ and
d (F 0; F^)
Z
log ( t; )j = 0
( t; )j = ^
( t; )j = 0d t Z
log
"
( t; 0) ( t; ^)
#
( t; 0) d t: (53)
When there is no closed-form formula for d(F 0; F^), it can be numerically evaluated as follows: First simulate an i.i.d. sample f (1)1 ; : : : ; (R1 1)g of size R1, e.g., R1 = 50 000, from the in-control prior c.d.f. F 0 and then numerically
evalu-ate d(F 0; F^)by largest integer less than or equal to R .
The corresponding values of RU CL^ (y
([R ]))’s and Pin; ^ (y
([R ]));RU CL 0.257 0.0513 0.552 0.00126 0.261
Case 2 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
RU CL^ (y
([R ])) 10.6 10.6 10.4 10.6 10.4
Pin; ^(y
([R ]));RU CL 0.954 0.807 0.216 0.566 0.587
Case 3 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9 RU CL^(y
([R ])) 10.5 10.3 10.3 10.5 10.6
Pin; ^ (y
([R ]));RU CL 0.688 0.0511 0.433 0.840 0.602
Case 4 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
RU CL^ (y
([R ])) 10.5 10.4 10.7 10.5 10.3
Pin; ^ (y
([R ]));RU CL 0.346 0.506 0.353 0.449 0.553
From Tables 3 and 4, it is easily seen that all of RU CL^(y
([R ]))’s are close to RU CL 0, but Pin; ^(y
([R ]));RU CL’s are not necessarily close to Pin; 0;RU CL for Cases 1-4.
8
AVERAGE RUN LENGTH BEHAVIORIn this section, the performance of the proposed process monitoring scheme is studied in terms of the average run length. Let ARL0 denote the average run length for an out-of-control signal to occur when the manufacturing process is in control. Recall that Pin is the false-alarm rate, i.e., the probability that an out-of-control signal occurs when the manufacturing process is in out-of-control. Then ARL0 = 1=Pin. When Pin = 2 ( 3) ( 0:002 699 8), ARL0 = 1=[2 ( 3)] ( 370:40). Let ARL1 denote the average run length for an out-of-control signal to occur when the manufacturing process is out of control. Let Pout denote the correct-alarm rate, i.e., the probability that an out-of-control signal occurs when the manufacturing process is out of control. Similarly, ARL1 = 1=Pout.
8.1
A BAYESIAN APPROACHIn this subsection, consider the case where F = F 0 2 fF : 2 g for some known 0 2 . To monitor the manufacturing process at time t, the monitoring scheme proposed in Section 7.1 is used for the null hypothesis H0: F t = F 0 versus the alternative H1: F t 6= F 0.
Set ARL0 ARL0; 0, Pin Pin; 0, ARL1 ARL1; 0;F
t, and Pout Pout; 0;F
t. When Pin; 0 is pre-speci…ed to be 2 ( 3) ( 0:002 699 8),
ARL0; 0 = 1
Pin; 0 = 1
2 ( 3) 370:40: (55)
When F t 6= F 0,
Pout; 0;F
t = P Wt; 0(yt) > RU CL 0 ; Fyt
+Pin; 0;RU CL P Wt; 0(yt) = RU CL 0 ; Fyt ; (56)
where all of Wt; 0(yt), RU CL 0, and Pin; 0;RU CL are de…ned in Section 7.1 and Fyt is de…ned in Section 3.
The corresponding values of Pout; 0;F i’s, and ARL1; 0;F i’s for Cases 1-4 in Section 4 are shown in Tables 5 and 6, where k = 1, T = 300, n1 = : : : = nT = nt = 300, and i 2 f1; 2; 3g.
Case 1: 1 = (log(1=4); log(80); log(20); 2:210; log[1=(0:210)2])T, 2 = (log(1=
9); log(90); log(10); 1:552; log[1=(0:220)2])T, and 3 = (log(4=21); log(80); log(20);
0:503; log[1=(0:216)2])T.
Case 2: 1 = (log(9=11); log(85); log(15); 0:510; log[1=(0:210)2])T, 2 = (log(11=9); log(72); log(18); 2:030; log[1=(0:210)2])T, and 3 = (log(14=11); log(80);
log(20); 0:203; log[1=(0:202)2])T.
Case 3: 1 = (log(2=3); log(65); log(35); 0:110; log[1=(0:210)2])T, 2 = (log(1);
log(70); log(30); 2:005; log[1=(0:253)2])T, and 3 = (log(3=2); log(60); log(40); 0:2 03; log[1=(0:202)2])T.
Case 4: 1 = (log(4); log(70); log(20); 1:510; log[1=(0:210)2])T, 2 = (log(3);
log(88); log(22); 1:203; log[1=(0:220)2])T, and 3 = (log(83=17); log(80); log(20);
1:203; log[1=(0:041)2])T.
Table 5: The values of Pout; 0;F i’s for Cases 1-4, where k = 1, T = 300, n1 = : : : = nT = nt = 300, and i 2 f1; 2; 3g.
Case 1 Case 2 Case 3 Case 4 Pout; 0;F
1 0.0568 0.024 0.0487 0.0434 Pout; 0;F 2 0.0153 0.0652 0.0929 0.0492 Pout; 0;F
3 0.0169 0.0140 0.0135 0.0590
Table 6: The values of ARL1; 0;F i’s for Cases 1-4, where k = 1, T = 300, n1 = : : : = nT = nt= 300, and i 2 f1; 2; 3g.
Case 1 Case 2 Case 3 Case 4 ARL1; 0;F 1 17.6 41.2 20.5 23.1 ARL1; 0;F
2 65.3 15.3 10.8 20.3
ARL1; 0;F 3 59.1 71.6 74.2 16.9
8.2
AN EMPIRICAL BAYES APPROACHIn this subsection, consider the case where F = F 0 2 fF : 2 g for some unknown 0 2 . To monitor the manufacturing process at time t, the monitoring scheme proposed in Section 7.2 is used for the null hypothesis H0: F t = F 0 versus the alternative H1: F t 6= F 0.
Set ARL0 ARL0; 0;^, Pin Pin; 0;^, ARL1 ARL1; 0;^ ;F t, and Pout
Pout; 0;^ ;F t. When ^ = 0, which is nearly impossible, we have Pin; 0;^ = Pin; 0 and Pout; 0;^ ;F
t
= Pout; 0;F
t, where both Pin; 0 and Pout; 0;F
t are de…ned in Sec-tion 8.1. When ^ 6= 0, we have
Pin; 0;^ = P n
Wt;^(yt) > RU CL^
o
; Fyt; 0 +Pin;^;RU CL P n
Wt;^(yt) = RU CL^o
; Fyt; 0 (57)
and
Pout; 0;^ ;F t = P n
Wt;^(yt) > RU CL^o
; Fyt +Pin; ^ ;RU CL P n
Wt;^(yt) = RU CL^
o
; Fyt ; (58)
where all of Wt;^(yt), RU CL^, and Pin; ^;RU CL are de…ned in Section 7.2 and both Fyt; 0 and Fyt are de…ned in Section 3.
To see how the additional estimation error resulting from the empirical Bayes approach a¤ects the performance of the average run length, the Kullback-Leibler divergence d(F 0; F^)between F 0 and F^ de…ned in Section 7.2 can be used as a measure of how close F^ is to F 0. See Section 7.2 for details.
The corresponding values of P ’s and ARL ’s for Cases
1-4 in Section 4 are shown in Table 7, where k = 1, T = 300, n1 = : : : = nT = nt = 300, R = R1 = 50 000, and 2 f0:1; 0:3; 0:5; 0:7; 0:9g.
Table 7: The values of Pin; 0;^ (y
([R2 ]))’s and ARL0; 0;^(y
([R ]))’s for Cases 1-4, where k = 1, T = 300, n1 = : : : = nT = nt = 300, R = R1 = 50 000, and 2 f0:1; 0:3; 0:5; 0:7; 0:9g.
Case 1 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pin; 0;^ (y([R ])) 0.00169 0.00334 0.00123 0.00374 0.00132
ARL0; 0;^ (y([R ])) 590.7 299.8 812.9 267.5 759.5
Case 2 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pin; 0;^ (y([R ])) 0.00281 0.00320 0.00204 0.00332 0.00372
ARL0; 0;^ (y([R ])) 356 313 490 301 269
Case 3 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pin; 0;^ (y([R ])) 0.00324 0.00202 0.00373 0.00247 0.00146
ARL0; 0;^ (y([R ])) 309 495 268 406 685
Case 4 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pin; 0;^ (y([R ])) 0.00282 0.00445 0.00162 0.00279 0.00569
ARL0; 0;^ (y([R ])) 355.1 225.0 615.6 358.9 175.7
The corresponding values of Pout; 0;^(y
([R ]));F i’s and ARL1; 0;^ (y
([R ]));F i’s for Cases 1-4 in Section 4 are shown in Tables 8-10, where k = 1, T = 300, n1 = : : : = nT = nt = 300, R = R1 = 50 000, 2 f0:1; 0:3; 0:5; 0:7; 0:9g, and i 2 f1; 2; 3g.
Table 8: The values of Pout; 0;^ (y );F ’s and ARL1; 0;^ (y );F ’s for Cases
1-4, where k = 1, T = 300, n1 = : : : = nT = nt = 300, R = R1 = 50 000, and 2 f0:1; 0:3; 0:5; 0:7; 0:9g.
Case 1 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^ (y([R ]));F 1 0.0409 0.0763 0.0192 0.0999 0.0318
ARL1; 0;^(y([R ]));F 1 24.4 13.1 52.0 10.0 31.4
Case 2 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^ (y([R ]));F 1 0.0296 0.0288 0.0130 0.0199 0.0401
ARL1; 0;^(y([R ]));F 1 33.7 34.8 77.0 50.2 25.0
Case 3 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^ (y([R ]));F 1 0.0647 0.0327 0.0365 0.0606 0.0451
ARL1; 0;^(y([R ]));F 1 15.5 30.5 27.4 16.5 22.2
Case 4 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^ (y([R ]));F 1 0.0463 0.0520 0.0190 0.0520 0.0268
ARL1; 0;^ (y([R ]));F 1 21.6 19.2 52.6 19.2 37.3
Table 9: The values of Pout; 0;^ (y
([R ]));F 2’s and ARL1; 0;^ (y
([R ]));F 2’s for Cases 1-4, where k = 1, T = 300, n1 = : : : = nT = nt = 300, R = R1 = 50 000, and
2 f0:1; 0:3; 0:5; 0:7; 0:9g.
Case 1 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^(y([R ]));F 2 0.0126 0.0184 0.00802 0.0218 0.0108
ARL1; 0;^(y([R ]));F 2 79.5 54.4 125 46.0 92.8
Case 2 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9 Pout; 0;^ (y([R ]));F 2 0.0808 0.0778 0.0323 0.0515 0.110
ARL1; 0;^(y([R ]));F 2 12.4 12.9 31.0 19.4 9.11
Case 3 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^ (y([R ]));F 2 0.0776 0.0938 0.136 0.0497 0.0371
ARL1; 0;^(y([R ]));F 2 12.9 10.7 7.36 20.1 26.9
Case 4 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^ (y([R ]));F 2 0.0525 0.0586 0.0223 0.0586 0.0310
ARL1; 0;^(y([R ]));F 2 19.1 17.1 44.8 17.1 32.2
Table 10: The values of Pout; 0;^ (y
([R ]));F 3’s and ARL1; 0;^ (y
([R ]));F 3’s for Cases 1-4, where k = 1, T = 300, n1 = : : : = nT = nt = 300, R = R1 = 50 000, and
2 f0:1; 0:3; 0:5; 0:7; 0:9g.
Case 1 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^ (y([R ]));F 3 0.0108 0.0181 0.0113 0.0157 0.00902
ARL1; 0;^(y([R ]));F 3 92.6 55.4 88.9 63.5 110.9
Case 2 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^ (y([R ]));F 3 0.0121 0.0152 0.0139 0.0195 0.0120
ARL1; 0;^(y([R ]));F 3 82.8 65.9 72.1 51.3 83.2
Case 3 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9 Pout; 0;^ (y([R ]));F 3 0.0199 0.00786 0.00911 0.0182 0.0121
ARL1; 0;^ (y([R ]));F 3 50.3 127 109 55.1 82.6
Case 4 = 0:1 = 0:3 = 0:5 = 0:7 = 0:9
Pout; 0;^ (y([R ]));F 3 0.0627 0.0695 0.0282 0.0695 0.0383
ARL1; 0;^ (y([R ]));F 3 16.0 14.4 35.5 14.4 26.1
From Tables 8-10, there is no pattern that the values of Pin; 0;^ and Pout; 0;^ ;F
i
for Case 1-Case 4 increase as the Kullback-Leibler divergence d(F 0; F^)increases, where k = 1, T = 300, n1 = : : : = nT = nt = 300, R = R1 = 50 000, and i2 f1; 2; 3g.
9
CONCLUSIONSIn the paper, …rst, a two-components mixture prior parametric family for the in-control prior distribution is proposed in a manufacturing process. Then an em-pirical Bayes approach is proposed when there are available in-control categorical data generated from the manufacturing process. As an illustration, an example of the proposed empirical Bayes model is introduced. For the purpose of model building, the goodness of …t and the simpli…cation of the proposed model are dis-cussed. Utilizing the likelihood ratio method, both Bayesian and empirical Bayes monitoring techniques are proposed as the main purpose of the paper. Finally, the performance of the proposed process monitoring scheme is studied in terms of the average run length to show the robustness of the methodology.
APPENDIX
All of nodes and weights of the Hermite polynomial of 32 degrees are shown in the following table. This table is obtained from the following website:
http://www.efunda.com/math/num_integration/…ndgausshermite.cfm
No. i abscissas xi weights wi
1 7:12581390983 7:31067642754 10 23 2 6:40949814928 9:23173653482 10 19 3 5:81222594946 1:19734401957 10 15 4 5:27555098664 4:21501019491 10 13 5 4:77716450334 5:93329148347 10 11 6 4:30554795347 4:09883215841 10 9 7 3:85375548542 1:57416779440 10 7 8 3:41716749282 3:65058512533 10 6 9 2:99249082501 5:41658405999 10 5 10 2:57724953773 5:36268365495 10 4 11 2:16949918361 3:65489032677 10 3 12 1:76765410946 1:75534288315 10 2 13 1:37037641095 6:04581309559 10 2 14 0:97650046359 1:51269734077 10 1 15 0:58497876544 2:77458142303 10 1 16 0:19484074157 3:75238352593 10 1
No. i abscissas xi weights wi
17 0:19484074157 3:75238352593 10 1 18 0:58497876544 2:77458142303 10 1 19 0:97650046359 1:51269734077 10 1 20 1:37037641095 6:04581309559 10 2 21 1:76765410946 1:75534288315 10 2 22 2.16949918361 3:65489032677 10 3 23 2:57724953773 5:36268365495 10 4 24 2:99249082501 5:41658405999 10 5 25 3:41716749282 3:65058512533 10 6 26 3:85375548542 1:57416779440 10 7 27 4:30554795347 4:09883215841 10 9 28 4:77716450334 5:93329148347 10 11 29 5:27555098664 4:21501019491 10 13 30 5:81222594946 1:19734401957 10 15 31 6:40949814928 9:23173653482 10 19 32 7:12581390983 7:31067642754 10 23
REFERENCES
1. Agresti, A. (2002). Categorical Data Analysis, 2nd ed. John Wiley & Sons, New York.
2. Carlin, B. P. and Louis, T. A. (2000). Bayes and Empirical Bayes Methods
3. Chen, C.-R. and Liu, C.-Y. (2005). A Model Selection Technique Between Two Empirical Bayes Models for Categorical Data. Technical Report, Insti-tute of Statistics, National Chiao Tung University, Hsinchu, Taiwan.
4. Chen, C.-R., Shiau, J.-J. H., Liao, H.-H., and Feltz, C. J. (2004). A process monitoring technique for categorical data under the beta-binomial/Dirichlet-multinomial empirical Bayes model. Technical Report, Institute of Statistics, National Chiao Tung University, Hsinchu, Taiwan.
5. Chen, C.-R., Shiau, J.-J. H., Lin, T.-Y., and Feltz, C. J. (2005). A process monitoring technique for categorical data under the transformed-normal-binomial/multinomial empirical Bayes model. Technical Report, Institute of Statistics, National Chiao Tung University, Hsinchu, Taiwan.
6. Fahrmeir, A. and Tutz, G. (2001). Multivariate Statistical Modelling Based on Generalized Linear Models, 2nd ed. Springer-Verlag, New York.
7. Gelman, A., Carlin, J. B., Stern, H. S., and Rubin, D. B. (2004). Bayesian Data Analysis, 2nd ed. Chapman & Hall/CRC, Boca Raton.
8. Johnson, N. L., Kotz, S., and Balakrishnan, N. (1997). Discrete Multivariate Distributions. John Wiley & Sons, New York.
9. McCullagh, P. and Nelder, J. A. (1989). Generalized Linear Models, 2nd ed.
Chapman and Hall, London.
10. McLachlan, G. J. and Peel, D. (2000). Finite Mixture Models. John Wiley
& Sons, New York.
11. O’Hagan, A. and Forster, J. (2004). Kendall’s Advanced Theory of Statistics, Volume 2B: Bayesian Inference, 2nd ed. Arnold, London.
12. Shiau, J.-J. H., Chen, C.-R., and Feltz, C. J. (2005). An empirical Bayes process monitoring technique for polytomous data. Quality and Reliability Engineering International, 21, 13-28.
13. Yousry, M. A., Sturm, G. W., Feltz, C. J., and Noorossana, R. (1991).
Process monitoring in real time: empirical Bayes approach - discrete case.
Quality and Reliability Engineering International, 7, 123-132.