1. 研究不同雜質含量鎂合金之微弧氧化製程，並探討其膜層特性、耐腐蝕性 質與腐蝕特性，以確定雜質含量在微弧氧化膜層中所扮演的角色，其中可 以透過短時間或不同時間之鹽霧試驗來檢查雜質之影響。
2. 針對 LZ91 具有保護性膜層之腐蝕機制進行研究，找出造成 LZ91 中α 相和 ß 相之間腐蝕差異的原因。
3. 找到造成 LZ91 微弧氧化膜層變色之原因，可能可以透過拉曼光譜、歐傑 電子能譜儀、X 光光電子能譜儀或二次離子質譜儀分析來分析膜層中成分 或化學組態的變化。
4. 對鎂合金在不同製程下的微弧氧化膜層進行殘留應力、抗拉強度與疲勞性 質研究，了解微弧氧化膜層對鎂合金之機械性質的影響。
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附錄-矽酸鋁鈉對微弧氧化的影響
當矽酸鈉溶液中添加鋁酸鈉時，發現溶液會產生乳白色懸浮物，此懸浮物 為矽酸鋁鈉(Na2Al2Si2O8)，此化合物會影響成膜反應，但必須在均勻攪拌的情 形下，可以使微弧氧化膜層發生一致的電漿放電行為改變，但當 10g/L 矽酸鈉 溶液中加入 3g/L 鋁酸鈉或以上時，溶液中懸浮的矽酸鋁鈉含量變多，可能使試 片邊角上的微弧氧化膜層出現不均勻的白色斑點，如圖 1。使用 SEM 觀察此白 點區域，可發現此白點在微觀尺度下有著截然不同的形貌，如圖 2 與圖 3。使 用 EDS 檢測圖 3 的白點並與正常區域的部分比較其成分上的差異，結果如表 1，可發現白點區域內含有相對較多的電解液成(氟、鋁、矽成分)，表示著此處 與電解液的反應較劇烈，且圖 3(b)(c)(d)的白點微觀形貌與圖 3(e)的正常區域的 微觀形貌差異非常大，尤其圖 3(c)(d)並非常見的微弧氧化多孔表面，而是類似 於顆粒堆疊的形貌，極有可能是溶液內的懸浮粒子在此參與成膜反應，使放電 行為改變，進而使白點處的微觀形貌產生變異。
圖 1 10 g/L 矽酸鈉中添加 5 g/L 鋁酸鈉所製作的 LZ91 微弧氧化試片
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圖 2 微弧氧化白點在 SEM 下的宏觀形貌，箭頭與弧線為光學掃描圖與 SEM 圖位置之比對關係
圖 3 微弧氧化白點在 SEM 下的微觀形貌 (a)白點區域 (b)白點區域中紅色箭頭 指示區域放大圖 (c)白點區域中紅色箭頭指示區域放大圖 (d) 白點區域中紅色
箭頭指示區域放大圖 (e)正常無白點區域的微觀形貌
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表 1 白點區域的 EDS 成分分析(at%)，A、B、C 分別指圖 3 中的位置
A B C 正常區域
O 52.82 52.76 52.79 52.04 Mg 32.44 32.55 27.11 35.24
F 5.71 2.93 6.89 4.65
Na 1.86 1.33 4.09 0.76
Al 1.53 2.64 2.27 1.4
Si 5.64 7.79 6.84 5.91