Future Works

The high performance architecture of BIOCIS design can detect more biomedical information with ease. Applications of such chip are as smart pill system or wearable ring sensor. The sensitivity of BIOCIS can be improved by reducing read and reset noise as well as increasing the conversion gain. This chip will target on reaching the goals of lower size, high resolution, lower power, integrated more the circuits (with analog to digital converter, instrument amplifier chip, and temperature sensor, etc.), lower noise and high sensitivity in the future.

References

[1] Tokuda, T. Ng, D.C. Yamamoto, A. Kagawa, K. Nunoshita, M. Ohta, J. ,“An optical and potential dual-image CMOS sensor for on-chip neural and DNA imaging applications,＂ IEEE International Symposium on Circuits and Systems, Proceedings, pp.1127-1130, 2006.

[2] Parikh, S. Gulak, G. Chow, P., “A CMOS Image Sensor for DNA Microarrays,＂

IEEE Conference on Custom Integrated Circuit, pp.821-821, 2007.

[3] Eltoukhy, H.; Salama, K.; Gamal, A.E., “A 0.18-μm CMOS Bioluminescence Detection Lab-on-Chip, ＂ IEEE Journal on Solid-State Circuits, vol. 41, pp.651-662, 2006.

[4] A. El Gamal and H. Eltoukhy,“CMOS Image Sensors, ” IEEE Magazine on Circuits and Device, vol. 21,pp.6-20, 2005.

[5] Wang, Chih Yu, Chin Tin Chen, Chun Pin Chiang, S. T. Young, Song Nan Chow and Huihua Kenny Chiang,“Partial least-squares discriminant analysis on autofluorescence spectra of oral carcinogenesis,” in Applied Spectroscopy, pp.1190-1196, 1998.

[6] Ching-Chun Wang,“A Study of CMOS Technologies for Image Sensor Applications,” in Massacgysetts Institute of Technology, pp.179-183, 2001.

[7] P. Favrat, P. Deval and M.J. Declercq, “A New High Efficiency CMOS Voltage Doubler,” IEEE Conference on Custom Integrated Circuit, pp.259-262, 1997.

[8] Gao Jun; Chen Zhongjian; Lu Wengao; Cui Wentao; Ji Lijiu,“Correlated double sample design for CMOS image readout IC,” International Conference on Solid-State and Integrated Circuits Technology Proceedings 7th, vol. 2, pp.1437-1440, Oct. 2004.

[9] A. Fish, S. Hamami and O. Yadid-Pecht, “CMOS Image Sensors with Self-Powered Generation Capability,” IEEE Trans. on Circuits and Systems II, vol. 53, pp. 131-135, 2006.

[10] Sasaki, M.; Mase, M.; Kawahito, S.; Tadokoro, Y., “A Wide-Dynamic-Range CMOS Image Sensor Based on Multiple Short Exposure-Time Readout with Multiple-Resolution Column-Parallel ADC,” IEEE Journal on Sensors, vol.7, pp.151-158, 2007.

[11] Hui Tian; Fowler, B.; Gamal, A.E., “Analysis of temporal noise in CMOS photodiode active pixel sensor,” IEEE Journal on Solid-State Circuits, vol.36, pp.92-101, Jan 2001.

[12] S. Kavusi, K. Ghosh and A. El Gamal, “Architectures for High Dynamic Range, High Speed Image Sensor Readout Circuits,” International Conference on Very Large Scale Integration, pp.36-41, 2006.

[13] Akahane, N.; Sugawa, S.; Adachi, S.; Mori, K.; Ishiuchi, T.; Mizobuchi, K. , “A

sensitivity and linearity improvement of a 100 dB dynamic range CMOS image sensor using a lateral overflow integration capacitor,” IEEE Journal on Solid-State Circuits, vol. 41, pp.851-858, 2006.

[14] Furuta, M. Nishikawa, Y. Inoue, T. Kawahito,S.,“ A High-Speed, High-Sensitivity Digital CMOS Image Sensor With a Global Shutter and 12-bit Column-Parallel Cyclic A/D Converters,” IEEE Journal on Solid-State Circuits, vol.42, pp.766-774, 2007.

[15] Yu-Chuan Shih, Chung-Yu Wu, “A New CMOS Pixel Structure for Low- Dark-Current and Large-Array-Size Still Image Applications,” IEEE Trans. on Circuits and System-I , vol.51, pp.2204-2214, 2004.

[16] Snoeij, M.F.; Theuwissen, A.; Makinwa, K.; Huijsing, J.H., “A CMOS Imager with Column-Level ADC Using Dynamic Column FPN Reduction,” IEEE Conference on Solid-State Circuits, pp.2014-2023, 2006.

[17] Zhengming Fu; Culurciello, E., “A 1.2mW CMOS temporal-difference image sensor for sensor networks,” IEEE International Symposium on Circuits and Systems, pp.1064-1067, 2008.

[18] Serra-Graells, F.; Misischi, B.; Casanueva, E.; Mendez, C.; Teres, L.,

“Low-Power and Compact CMOS APS Circuits for Hybrid Cryogenic Infrared Fast Imaging,” IEEE Trans. on Circuits and Systems II, vol.54, pp.1052-1056, 2007.

[19] Kawai, N. Kawahito, S., “Noise analysis of high-gain, low-noise column readout circuits for CMOS image sensors,” IEEE Trans. on Electron Devices, vol.51, pp.185-194, 2004.

[20] B. Choubey and S. Collins, “Wide dynamic range CMOS pixels with reduced dark current,” in Analog Integrated Circuits and Signal Processing, 2007.

[21] S. J. Decker, R. D. McGrath, K. Brehmer, and C. G. Sodini, “A 256 × 256 CMOS imaging array with wide dynamic range pixels and column parallel digital output,” IEEE Journal on Solid-State Circuits, vol. 33, pp. 2081-2091,1998.

[22] D. Yang, A. El Gamal, B. Fowler, and H. Tian, “A 640X512 CMOS image sensor with ultrawide dynamic range floating-point pixel-level ADC,” IEEE Journal on Solid-State Circuits, vol.34, pp. 1821-1834, 1999.

[23] D. Stoppa, A. Simoni, L. Gonzo, M. Gottardi, and G.-F. Dalla Betta, “A 138-dB dynamic range CMOS image sensor with new pixel architecture,” IEEE International Conference on Solid-State Circuit, vol. 45, pp. 40-41, 2002.

[24] L. McIlrath, “A low-power low-noise ultrawide-dynamic-range CMOS imager with pixel-parallel A/D conversion,” IEEE Journal on Solid-State Circuits, vol.

36, pp.846-853, 2001.

[25] O. Y. Petch., E. R. Fossum, “Wide Interscene Dynamic Range CMOS APS Using

Dual Sampling,” IEEE Trans. On Electron Devices, vol.44, pp. 1721-1723, 1997.

[26] S. J. Decker, R. D. McGrath, K. Brehmer, and C. G. Sodini, “A 256 × 256 CMOS imaging array with wide dynamic range pixels and column parallel digital output,” IEEE Journal on Solid-State Circuits, pp.176-177, 1998.

[27] D. Yang, B. Fowler, and A. El Gamal, ”A Nyquist-Rate Pixel Level ADC for CMOS Image Sensors,” IEEE Journal on Solid-State Circuits, vol. 34, pp.348-356, 1999.

[28] Eversmann, B.; Jenkner, M.; Paulus, C.; Hofmann, F.; Brederlow, R.; Holzapfl, B.; Fromherz, P.; Brenner, M.; Schreiter, M.; Gabl, R.; Plehnert, K.; Steinhauser, M.; Eckstein, G.; Schmitt-Landsiedel, D.; Thewes, R., ” A 128 × 128 CMOS bio-sensor array for extracellular recording of neural activity,” IEEE International Conference on Solid-State Circuit, vol. 1, pp.2306-2317, 2003.

[29] Junichi Nakamura, “Image Sensors and Signal Processing for Digital Still Cameras”, Taylor & Francis Group, LLC, Inc. 2006.

[30] Jun Ohta, “Smart CMOS Image Sensors and Applications,” Taylor & Francis Group, LLC, Inc. 2007.

[31] Jerald G. Graeme, “Photodiode Amplifiers: OP AMP Solutions,” McGraw –Hill Companies, Inc. 1995.

[32] ” MEMS Technology〈2008〉イノベーションと異分野融合をもたらす (大 型本) ,” 日經 BP 社, Dec. 2007.

[33] 米本和也, ”CCD/CMOS 影像感測器之基礎與應用”,全華科技,2005 年.

[34] Behzad Razavi, “Design of Analog CMOS Integrated Circuits”, McGraw-Hill Companies, Inc. 2004.

[35] D. Johns and K.W. Martin, “Analog Integrated Circuits”, Wiley, New York, 1997.

[36] Phillip E. Allen, Douglas R. Holberg, “CMOS Analog Circuit Design”, Oxford, New York, 2002.

[37] Gray P. R., Hurst P. J., Lewis S. H., Meyer R.G.,”Analysis and Design of Analog Integrated Circuits”, 4th Edition, John Wiley & Sons, Inc., 2001.

[38] R. Jacob Baker, “CMOS Circuit Design, Layout, and Simulation”, second edition, John Wiley & Sons, Inc., 2005.

[39] N. Weste, David Harris, “CMOS VLSI design-A circuits and system perspective”,third edition, Addison Wesley, Inc., 2005.

[40] M. Morris Mano, Michael D. Ciletti, “Digital Design”, third Edition, Prentice HallM.,2006.

[41] Simon M. Sze, “Semiconductor Devices: Physics and Technology”, second Edition, John Wiley & Sons, Inc. 2001.