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On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay Lines

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Fig. 2. The jitter CDF sampling method in [3].
Fig. 3. Delay line calibration.
Fig. 6. Errors of measured probabilities (a) and computed x (b) (N ¼ 2 14 ).
Figure 7 illustrates how the size of C is affected by J RMS , the delay line resolution r, and the delay value offset.
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