IOP PUBLISHING NANOTECHNOLOGY
Nanotechnology 18 (2007) 225603 (5pp) doi:10.1088/0957-4484/18/22/225603
Nanoscale mechanical characteristics of
vertical ZnO nanowires grown on
ZnO:Ga/glass templates
S J Young
1, L W Ji
2, S J Chang
1, T H Fang
3, T J Hsueh
1,
T H Meen
2and I C Chen
41Institute of Microelectronics and Department of Electrical Engineering, National Cheng
Kung University, Tainan 701, Taiwan
2Institute of Electro-Optical and Materials Science, National Formosa University, Yunlin 632,
Taiwan
3Institute of Mechanical and Electromechanical Engineering, National Formosa University,
Yunlin 632, Taiwan
4Micro Systems Technology Center, Industrial Technology Research Institute South,
Tainan 709, Taiwan
E-mail:[email protected]
Received 13 December 2006, in final form 8 March 2007
Published 4 May 2007
Online at
stacks.iop.org/Nano/18/225603
Abstract
The mechanical properties of vertical single-crystal ZnO nanowires on
ZnO:Ga/glass templates were characterized by nanoindentation experiments
in this work. The results from x-ray diffraction and Raman spectra show
good crystal quality for the ZnO nanowires. The buckling loads were found
to be 1465 and 215
μN for ZnO nanowires of 100 and 30 nm diameters,
respectively. When the fixed–fixed column mode was used, it was found that
the Young’s modulus values of the ZnO nanowires of 100 and 30 nm
diameters were 117 and 232 GPa, while the critical buckling strains were
0.62% and 0.35%, respectively. On the other hand, when we employed the
fixed–pinned column mode, it can be seen that the Young’s modulus values
were 229 and 454 GPa, while the critical buckling strains were 0.32% and
0.18%, respectively. Buckling behaviour of the ZnO nanowires was
significantly predicted by the Euler buckling model in this work.
1. Introduction
One-dimensional (1D) materials such as nanowires, nanobelts and nanorods have attracted considerable interest in recent years. They present the utmost challenge to semiconductor technology, making fascinating novel devices possible. It has been demonstrated that these 1D materials exhibit superior electrical, optical, mechanical and thermal properties. It has also been shown that these materials are potentially useful for nanoscale interconnects, active components of optical electronic devices and nanoelectromechanical systems (NEMS). However, it is important to understand the mechanical characteristics of these nanowires prior to any feasible applications [1–3]. For example, mechanical properties of carbon nanotubes (CNTs) have been studied extensively by tensile loading, bending and buckling [4–10].
To our knowledge, mechanical properties of various Si and III–V semiconductor-based nanowires have also been reported [11–13].
1D oxide systems such as SnO2 [14], tungsten oxide
(
W18O49)
[15], GeO2 [16], indium tin oxide (ITO) [17],Al2O3 [18] and ZnO [1–3, 19, 20] nanowires have also
attracted much attention in recent years. Among them, ZnO is an n-type direct-gap semiconductor with a large exciton binding energy of 60 meV and wide bandgap energy of 3.37 eV at room temperature. Hence, ZnO is regarded as a promising photonic material [21,22]. However, only a few reports on the mechanical properties of ZnO nanowires can be found in the literature [1,2,23–25]. Previously, Song et al [1] used atomic force microscopy (AFM) to measure the elastic properties of vertically aligned ZnO nanowires. By scanning AFM tips
Nanotechnology 18 (2007) 225603 S J Young et al
catastrophe is immediate. If ideal loading is wholly plastic on the other hand, then the material’s yield strength limits the load that can be applied. Failure in practice is governed by elastic–plastic interaction, such as the dashed locus of the sketch. Thus, the load-carrying capacity of a wire decreases significantly as the slenderness ratio
L/r
increases, especially in the middle region of(L/r)
cvalues.4. Conclusion
In summary, we report the experimental observations of buckling instabilities in vertical single-crystal ZnO nanowires grown on ZnO:Ga/glass templates by a self-catalyzed vapour– liquid–solid process without any metal catalyst. X-ray diffraction and Raman spectra all show good crystal quality of our ZnO nanowires. The mechanical properties of vertical ZnO nanowires under uniaxial compression were performed by using the nanoindentation technique. The critical buckling loads of the ZnO NWs are found to be 1465 and 215
μ
N for samples A (100 nm diameter) and B (30 nm diameter), respectively. Furthermore, the buckling energies were 3.
62×
10−10J and 3.
69×
10−11J for samples A and B, respectively. The Euler buckling model can be employed in evaluating the Young’s modulus(E)
and the critical buckling strain(ε
cr)
ofindividual ZnO nanowires. A size dependence of Young’s modulus in [0001]-oriented ZnO nanowires has been found in this work.
References
[1] Song J H, Wang X D, Riedo E and Wang Z L 2005 Nano Lett.
5 1954
[2] Chen C Q, Shi Y, Zhang Y S, Zhu J and Yan Y J 2006 Phys.
Rev. Lett.96 075505
[3] Wang Z L and Song J H 2006 Science312 242
[4] Iijima S 1991 Nature354 56
[5] Wong E W, Sheehan P E and Lieber C M 1997 Science
277 1971
[6] Falvo M R, Clary G J, Taylor R M II, Chi V, Brooks F P, Washburn S and Superfine R 1997 Nature389 582
[7] Morales A M and Lieber C M 1998 Science279 208
[8] Poncharal P, Wang Z L, Ugarte D and de Heer W A 1999
Science283 1513
[9] Yu M F, Lourie O, Dyer M J, Moloni K, Kelly T F and Ruoff R S 2000 Science287 637
[10] Yu M F, Files B S, Arepalli S and Ruoff R S 2000 Phys. Rev.
Lett.84 5552
[11] Zhu J and Fan S 1999 J. Mater. Res. 14 1175 [12] Chen C C and Yeh C C 2000 Adv. Mater.12 738
[13] Ji L W, Fang T H, Hung S C, Su Y K, Chang S J and Chuang R W 2005 J. Vac. Sci. Technol. B23 2496
[14] Dai Z R, Pan Z W and Wang Z L 2003 Adv. Funct. Mater.13 9
[15] Zhu Y Q, Hu W B, Hsu W K, Terrones M, Grobert N, Hare J P, Kroto H W, Walton D R M and Terrones H 2000 Appl. Phys. A70 231
[16] Bai Z G, Yu D P, Gai H E Z, Hang Q L, Xiong G C and Feng S Q 1999 Chem. Phys. Lett.303 311
[17] Yumoto H, Sako T, Gotoh Y, Nishiyama K and Kaneko T 1999
J. Cryst. Growth203 136
[18] Valcarcel V, Souto A and Guitian F 1998 Adv. Mater.10 138
[19] Pan Z W, Dai Z R and Wang Z L 2001 Science291 1947
[20] Hsu C L, Chang S J, Hung H C, Lin Y R, Huang C J, Tseng Y K and Chen I C 2005 IEEE Trans. Nanotechnol.
4 649
[21] Young S J, Ji L W, Chang S J and Du X L 2007 J. Electrochem.
Soc.154 H26
[22] Alivov Y I, Kalinina E V, Cherenkov A E, Look D C, Ataev B M, Omaev A K, Chukichev M V and Bagnall D M 2003 Appl. Phys. Lett.83 4719
[23] Saitoh H, Namioka Y, Sugata H and Ohshio S 2001 Japan. J.
Appl. Phys.40 6024
[24] Mao S X, Zhao M H and Wang Z L 2003 Appl. Phys. Lett.
83 993
[25] Kulkarni A J, Zhou M and Ke F J 2005 Nanotechnology
16 2749
[26] Tseng Y K, Huang C J, Cheng H M, Lin I N, Liu K S and Chen I C 2003 Adv. Funct. Mater.13 811
[27] Tseng Y K, Hsu H C, Hsieh W F, Liu K S and Chen I C 2003
J. Mater. Res. 18 2837
[28] Hu J Q, Li Q, Wong N B, Lee C S and Lee S T 2002 Chem.
Mater.14 1216
[29] Yao B D, Chan Y F and Wang N 2002 Appl. Phys. Lett.81 757
[30] Calleja J M and Cardona M 1977 Phys. Rev. B16 3753
[31] Xing Y J, Xi Z H, Xue Z Q, Zhang X D, Song J H, Wang R M, Xu J, Song Y, Zhang S L and Yu D P 2003 Appl. Phys. Lett.
83 1689
[32] Timoshenko S P and Gere J M 1961 Theory of Elastic Stability (New York: McGraw-Hill)
[33] Lee W, Jeong M C and Myoung J M 2004 Nanotechnology
15 254
[34] Coleman V A, Bradby J E, Jagadish C, Munroe P, Heo Y W, Pearton S J, Norton D P, Inoue M and Yano M 2005 Appl.
Phys. Lett.86 203105