國 立 交 通 大 學
機 械 工 程 學 系
碩 士 論 文
Preliminary Experimental Investigation of a DC Gas
Discharge With and Without Magnetron System
以實驗的方式初探在有無磁控管系統的直流電漿源氣
體放電情況
研究生:梁偉豪
指導教授:吳宗信 博士
以實驗的方式初探在有無磁控管系統的直流電漿源
氣體放電情況
Preliminary Experimental Investigation of a DC Gas Discharge With and
Without Magnetron System
研 究 生:梁偉豪
Student:Wei-Hao Liang
指導教授:吳宗信博士
Advisor:Dr. Jong-Shinn Wu
國 立 交 通 大 學
機 械 工 程 學 系
碩 士 論 文
A Thesis
Submitted to Institute of Mechanical Engineering Collage of
Engineering
National Chiao Tung University
In Partial Fulfillment of the Requirements
for the degree of
Master of Science
In
Mechanical Engineering
July 2006
Hsinchu, Taiwan, Republic of China
致
謝
在交大求學的這兩年來,感謝吳宗信老師悉心教導,讓我無論是在學習過程 中或是生活上都成長許多,在研究及做學問方面,因為老師不厭其煩的教導,而 使我的成長許多也學到許多,處理事情以及解決問題變得更有效率,並且也充實 了我許多日常生活經驗,感謝老師這些日子以來的照顧。同時也感謝口試委員傅 武雄教授、魏大欽副教授在口試時提供的寶貴意見,使得本論文更加充實完備, 在此一併致謝。 實驗室的氣氛融洽,使得我在良好的學習環境學習,學習過程中更有效率。 感謝學長(姐)邵雲龍、李允民、周欣芸、洪捷粲、許哲維、鄭凱文在研究上及生 活上的教導及幫助,感謝同學育進、孟樺、百彥在學習上的相互切磋砥礪,以及 學弟們生活上的幫助與鼓勵,使我這兩年的研究生活非常充實且溫馨,並能夠順 利完成學業。 此外,感謝在交大這二年的生活中陪伴著我的各位好友以及我的家人,有你 們的鼓勵,使得我更能堅持下去。在這離別的季節裡,大家各奔前程,去追求自 己心中的夢想。希望大家在不久的將來,我們都能擁有屬於自己的一片天空。 梁偉豪 謹誌 九五年七月于風城以實驗的方式初探在有無磁控管系統的直流電漿源
氣體放電情況
學生:梁偉豪
指導教授:吳宗信 博士
國立交通大學機械工程學系
摘
要
近幾十年來,電漿在半導體工業的運用越來越廣泛。其中直流電漿源可以用 簡單的機制使得氣體能夠輕易的產生輕微的解離而形成電漿,並且直流電漿源被 普遍的運用在濺鍍金屬材料來形成薄膜沉積方面已經有很好的例子。 如果就直流放電的電漿,其電漿產生所需達到的崩潰電壓根據帕申(Paschen) 曲線,當氣體解離所需要達到崩潰電壓一般都需要相當高的氣體壓力。但這在這 壓力下,離子或分子的平均自由徑卻相當的小,要使得被轟擊出來的原子能夠黏 著在基材上也就相當不容易。所以為了要使直流電漿源能夠操作在較低的壓力 下,一般比較常見的作法會在靶材附近增加磁場,利用磁力來限制從靶材轟擊出 來的二次電子,用以增加在靶材附近的電漿密度。 此研究最主要的目的就是要了解電漿參數的變化,所以我們會利用蘭牟耳探 針(Langmuir probe)深入電漿內部,來量測電漿內的電漿特性變化,並比較在有 無外加磁場的情況下電漿特性的改變。Preliminary Experimental Investigation of a DC Gas Discharge With
and Without Magnetron System
Student:Wei-Hao
Liang
Advisor:Dr. Jong-Shinn Wu
Department of Mechanical Engineering
National Chiao Tung University
Abstract
In the recent years, the field of gas discharge plasma applications has
rapidly expanded in semiconductor industry. The dc discharges has been applied
in generating weakly ionized plasmas and has been studied the properties of
plasma. The dc glow discharges have been used as the sputtering source to
product thin film and other specialized application for a long time.
As illustration in the Paschen curve, the pressure that discharges exceed
breakdown voltage must be high enough (p>30mTorr) and maintain in the
usually manner by the secondary electron emission from the cathode. These
pressures are higher than the optimum for deposition of sputtered atoms onto the
substrate. This results in sputtered atom poor adhesion for the sputtered film. It
is desirable to operate a sputtering discharge at lower pressures than to be
magnetic field at cathode to confine the secondary electrons.
This research will use Langmuir probe to measure the properties of dc
discharges in the condition with and without magnetron and compare the
INDEX
致 謝 ... I 摘 要 ...II ABSTRACT ... III INDEX ... V LIST OF TABLE ...VII LIST OF FIGURES... VIII
CHAPTER 1 INTRODUCTION...1
1.1BACKGROUND AND MOTIVATION...1
1.2PLASMA SOURCES AND DIAGNOSTICS...3
1.3LITERATURE SURVEY...5
1.3.1 The Development of Diagnostic Theory...5
1.3.2 Applications of DC Sputtering System ...7
1.4OBJECTIVES AND ORGANIZATION OF THE THESIS...9
CHAPTER 2 EXPERIMENTAL APPARATUS ... 11
2.1EXPERIMENTAL FACILITY... 11
2.1.1 Overview of the DC-magnetron sputtering system... 11
2.1.2 Pressure gauges ... 11 2.1.3 Plasma source ...12 2.1.4 Magnetron assembly ...13 2.1.5 DC Power Supply...13 2.2EXPERIMENTAL INSTRUMENTATION...13 2.2.1 Lamgmuir probe...13 2.2.2 Thermocouple...14
2.3EXPERIMENT METHODS AND STEPS...15
CHAPTER 3 LANGMUIR PROBE DIAGNOSTICS...16
3.1TYPICAL I-V...16
3.2THEORY OF LANGMUIR PROBE...18
3.2.1 Planar Probe with Collisionless Sheath...19
3.2.2 Cylinder probe with collisionless sheath...23
3.3THEORY OF ELECTRON ENERGY DISTRIBUTION FUNCTION (EEDF) ...25
3.4PARAMETER CALCULATION...28
4.1THE DISCHARGES WITH MAGNETRON...30
4.1.1 Plasma potential and floating potential ...31
4.1.2 Plasma density ...32
4.1.3 Electron temperature...34
4.2THE DISCHARGES WITHOUT MAGNETRON...35
4.2.1 Plasma potential and floating potential ...36
4.2.2 Plasma density ...37
4.2.3 Electron temperature...37
CHAPTER 5 CONCLUSIONS AND FUTURE WORK...39
5.1SUMMARY...39
5.2RECOMMENDATIONS FOR FUTURE WORK...40
List of Table
Table 1. The value of (Vp-Vf)/Te in different places in the chamber with working pressure 30 mtorr and operated with magnetron ...85 Table 2. The value of (Vp-Vf)/Te in different places in the chamber with working pressure 20
mtorr and operated with magnetron ...85 Table 3. The value of (Vp-Vf)/Te in different places in the chamber with working pressure 10
mtorr and operated with magnetron ...86 Table 4. The value of (Vp-Vf)/Te in different places in the chamber with working pressure 70
mtorr and operated without magnetron ...86 Table 5. The value of (Vp-Vf)/Te in different places in the chamber with working pressure 80
List of Figures
Figure 1.1. Breakdown voltages in various gases for the plane parallel electrode [Raizer, 1991]..44
Figure 1.2. Construction of a cylindrical probe ...44
Figure 2.1. The DC-magnetron Sputtering System ...45
Figure 2.2. The MKS self-tuning controller ...45
Figure 2.3. The Baratron capacitance manometer ...46
Figure 2.4. The Wide-Range Vacuum Gauge Controllers ...46
Figure 2.5. The ion gauge ...47
Figure 2.6. The thermocouple gauge...47
Figure 2.7. The plasma source ...48
Figure 2.8. The Magnetron System ...48
Figure 2.9. The LakeShore 421 Gaussmeter...49
Figure 2.10. The DC power control panel...49
Figure 2.11. Standard ESP analysis system with motorized Z-motion control ...50
Figure 2.12. RF-compensated probe ...50
Figure 2.13. Automatic Z-motion drivers ...51
Figure 2.14. The position of thermocouple in the chamber...51
Figure 2.15. Schematic of experimental chamber...52
Figure 3.1. Typical I-V curves for Langmuir probe...53
Figure 3.2. Qualitative behavior of the sheath and presheath in contact with a wall ...53
Figure 3.3. Ion orbital motion within the sheath of a cylindrical Langmuir probe ...54
Figure 4.1. The coordinate in the chamber where the origin is on the center of the target surface. (a) the coordinate is on the picture (b) the coordinate is on the schematic of experimental chamber ...55
Figure 4.2. The discharge was operated with the magnetron assembly in the pressure 10 mtorr.56 Figure 4.3. The horizontal distribution of plasma potential in the pressure 30 mtorr and the distance between substrate and target is (a) 11 cm and (b) 8 cm. ...57
Figure 4.4. The horizontal distribution of plasma potential in the pressure 20 mtorr and the distance between substrate and target is (a) 11 cm and (b) 8 cm. ...58
Figure 4.5. The horizontal distribution of plasma potential in the pressure 10 mtorr and the distance between substrate and target is (a) 11 cm and (b) 8 cm. ...59
Figure 4.6. The horizontal distribution of floating potential in the pressure 10 mtorr and the distance between substrate and target is (a) 11 cm and (b) 8 cm. ...60
Figure 4.7. The horizontal distribution of floating potential in the pressure 20 mtorr and the distance between substrate and target is (a) 11 cm and (b) 8 cm. ...61
Figure 4.8. The horizontal distribution of floating potential in the pressure 30 mtorr and the distance between substrate and target is (a) 11 cm and (b) 8 cm. ...62
Figure 4.9. The vertical distribution of floating potential in the horizontal position x=-2, x=0 and x=2 and working pressure in (a) 30, (b) 20 and (c) 10 mtorr. ...64 Figure 4.10. The difference of plasma density difference between OML and EEDF; the working
pressure is (a) 30, (b) 20 and (c) 10 mtorr. ...65 Figure 4.11. The horizontal distribution of plasma density in the distance 11 cm between the
substrate and the target. The working pressure is (a) 10, (b) 20 and (c) 30 mtorr...67 Figure 4.12. The horizontal distribution of plasma density in the distance 8 cm between the
substrate and the target. The working pressure is (a) 10, (b) 20 and (c) 30 mtorr...68 Figure 4.13. The vertical distribution of plasma density in the horizontal position x=-2, x=0, x=-2
and x=4 and working pressure in (a) 10, (b) 20 and (c) 30 mtorr...70 Figure 4.14. The horizontal distribution of electron temperature in the distance 11 cm between
the substrate and the target. The working pressure is (a) 10, (b) 20 and (c) 30 mtorr...71 Figure 4.15. The horizontal distribution of electron temperature in the distance 8 cm between the substrate and the target. The working pressure is (a) 10, (b) 20 and (c) 30 mtorr...73 Figure 4.16. The difference of electron temperature between sheath theory and EEDF; the
working pressure is (a) 30 and (b) 20 mtorr...74 Figure 4.17. The vertical distribution of electron temperature in the horizontal position x=-2, x=0,
x=-2 and x=4 and working pressure in (a) 10, (b) 20 and (c) 30 mtorr. ...76 Figure 4.18. The changes of electron temperature in the different working pressure and in the
same vertical position z=4 ...77 Figure 4.19. The discharge was operated without the magnetron assembly in the pressure 90
mtorr ...78 Figure 4.20. The horizontal distribution of plasma potential in the distance between substrate
and target is 4 cm and working pressure (a) 70 mtorr and (b) 80 mtorr...79 Figure 4.21. The horizontal distribution of floating potential in the distance between substrate
and target is 4 cm and working pressure (a) 70 mtorr and (b) 80 mtorr...80 Figure 4.22. The horizontal distribution of plasma density in the distance between substrate and
target is 4 cm at working pressure (a) 70 mtorr and (b) 80 mtorr and (c) the distance between substrate and target is 5 cm at working pressure 70 mtorr. ...82 Figure 4.23. The horizontal distribution of electron temperature in the distance between
substrate and target is 4 cm at working pressure (a) 70 mtorr and (b) 80 mtorr and (c) the distance between substrate and target is 5 cm at working pressure 70 mtorr. ...84
Chapter 1 Introduction
1.1 Background and Motivation
Advances in microelectronics technology over the last two decades have
exceeded even the most optimistic exceptions. It depends on the application of
plasma, i.e. etching, deposition, sputtering, surface cleaning, ion implantation and
diamond film, etc. in semiconductor industry. We should know the circumstance of
plasma first and then we will know the design of the plasma source could meet our
needs or not. When talking to the development of plasma sources, it is quite important
to improve the diagnostics techniques and need the knowledge of mechanism to
generate plasma.
In the recent years, the field of gas discharge plasma applications has rapidly
expanded. This is due to the large chemical freedom offered by non-equilibrium
aspects of the plasma. This wide variety of chemical non-equilibrium condition is
possible, since (external condition) parameters can be modified, such as:
● The chemical input (working gas; this defines the different species in plasma:
electrons, atoms, molecules, ions, etc.)
● The pressure (ranging from 1 mTorr to atmospheric pressure; as mentioned
above, a higher pressure typically reduces the confinement and pushed the plasma
● The electromagnetic field structure ( typically externally imposed, but it can
also be modified by the plasma species; these electric and magnetic fields are used to
accelerate, heat, guide and compress the particles.)
● The discharge configuration (e.g. with or without electrodes; discharge
volume)
● The temporal behavior (e.g. pulsing the plasma)
In dc discharge, a few electrons are accelerated by the electric field in front of
the cathode; collide with the gas atoms and cause excitation and ionization. The
ionization collisions create new electrons and ions. The ions are accelerated by the
electric field toward the cathode, where they release new electrons by ion induced
secondary electron emission. The electrons give rise to new ionization collisions,
creating new ions and electrons. These processes of electron emission at the cathode
and ionization in the plasma make the glow discharge self-sustaining plasma.
The pressure is an important factor to reach the breakdown voltage in the dc
discharge and the minimum value of breakdown is relative to electrode distance and
pressure (Figure 1.1). These pressures are higher than optimum for deposition of
sputtered atoms onto the substrates due to scattering of sputtered atoms by argon
atoms. The sputtering efficiency of a dc discharge can be improved by a hollow
to the addition of a magnetic field. It is clearly desirable to operate a sputtering
discharge at higher current densities, lower voltages, and low pressures than can be
obtained in a conventional glow discharge. This has led to use of a dc magnetic
configuration. The permanent magnet placed at the back of the cathode target
generates magnetic field lines that enter and leave through the cathode plate. The
magnetic field could trap the electrons near the cathode in order to achieve the
intention had been mentioned above.
1.2 Plasma Sources and Diagnostics
There are various ways of transferring energy from fields to plasma discharges.
Utilizing different electron heating mechanism, it would influence the characteristics
of the plasma, i.e., capacitive discharges, inductive discharges, wave-heated
discharges and dc discharges. Capacitive discharges have been the most widely used
source for low-pressure materials processing. However, the limitation of capacitive
RF discharges and their magnetically enhanced variants have led to the development
of various low-pressure, high-density plasma discharges, i.e., inductively coupled
plasmas (ICP) and electron cyclotron resonance (ECR), etc. Besides preceding plasma
sources, a dc discharge has one obvious feature, its macroscopic time independence
both in application of weakly ionized plasma and in the studying the properties of the
plasma medium. DC discharge is also a fine source to begin plasma diagnostic
technique.
After introduction to the plasma sources briefly, we would be interesting in the
plasma properties. The purpose to diagnose is appreciating the basic plasma
properties and further we can control the fabrication of semiconductor devices to
detect the quality of the process of deposition and etching, etc. The basic plasma
properties that we are interesting are plasma density, electron temperature, electron
energy distribution, plasma potential, ion energy distribution and floating potential,
etc. How do we receive the above properties? Following will introduce some
diagnostics techniques shortly.
The diagnostics techniques could be generally divided into invasive and
non-invasive diagnostics techniques. The invasive diagnostics include microwave
diagnostics and optical methods. Each of above methods has different application
ways, i.e. interferometer, plasma induced emission spectroscopy, laser induced
fluorescence (LIF) and absorption spectroscopy, etc. All of these methods are
generally measure the entire averaged properties of the plasma. The invasive
diagnostics include Langmuir probe and emissive probe and the invasive diagnostics
would make perturbation in the plasma, it’s still a good studying tool. The Langmuir
probe specially can obtain more plasma properties than other diagnostic techniques
and its price also has a small advantage than others.
1.3 Literature Survey
1.3.1 The Development of Diagnostic Theory
One of the fundamental techniques (the first one, in fact) for measuring the
properties of plasmas is the use of electrostatic probes. This techniques was developed
by Langmuir and Mott-Smith [Langmuir and Mott-Smith, 1926] as early as 1924 and
consequently is sometimes called the method of Langmuir probes, basically an
electrostatic probe is merely a small metallic electrode, usually a wire, inserted into
plasma. The probe is attached to a power a supply capable of biasing it at various
voltages positive and negative relative to the plasma, and the current collected by the
probe then provides information about the condition in the plasma.
In 1950s, many scientists [Schneider, 1956; Boyd and Twiddy, 1959] proved that
the electron velocity distribution is not completely complying with Maxwellian
velocity distribution and not completely isotropic especially in low pressure, partially
1935] successfully proved, in 1930, any type of Electron Energy Distribution
Function (EEDF) could be directly received by the secondary differential of the I-V
curve of the probe. And EEDF could be employed directly to calculate the plasma
properties.
Johnson and Malter [Johnson and Malter, 1949, 1950] developed double probes
in 1949 and Yamamoto [Yamamoto and Okuda, 1956; Okuda and Yamamoto, 1960]
improved to triple probe in 1960. The triple probe measurement replaced the
sweeping bias method used in the single and double probe measurement. Both of
above development make the plasma diagnostics techniques more selectivity and
comprehensive applications.
There are lots of literatures about the Langmuir probe in the plasma diagnostic
techniques, and F. F. Chen [Chen, 1965] in 1965 gathered all of the literatures about
Langmuir probe together to supply the completely analyzing in all kind of modules
and theories. Except Chen, Swift, Schwan [Swift, 1971] and Schott [Schott, 1995]
supplied large contribution in the integrated of probe diagnostics techniques and
analysis methods.
Laframboise [Laframboise, 1966] especially do the discussion of the theory and
study to the spherical and cylindrical probe, and get the practical and important result.
the probe.
From 1924, Langmuir introduced the electrostatic probe to plasma diagnose, it
allowed people to understand the phenomenon in the plasma. Langmuir probe still
applies to the design and development of high density plasma source today.
1.3.2 Applications of DC Sputtering System
DC planar magnetron discharge are widely and maturely used for sputtering
deposition metallic thin films such as aluminum, zincoxide, gold, and various alloy
and have gained wide acceptance for high rate deposition of blanket metal films with
good film adhesion. A permanent, electromagnet, or rotating magnet assembly is often
used in the magnetron to confine energetic electrons. With the applied magnetic field,
the ionization efficiency is effectively increasing so that high deposition rate could be
achieved at a relatively low pressure.
In 1985, Rossnagel and Kaufman [Rossnagel and Kaufman, 1986] used
Langmuir probe to character the plasma properties of a magnetron sputtering system.
Langmuir probe presented to investigate more close to the cathode region. The
experiment presented the plasma sheath thicknesses were estimated from the potential
variations for the low-current discharge and compared the plasma potential, electron
and investigated a discharge in dual-side dc magnetron system in 2005, and he
explored the detail correlation between plasma density and discharge parameters. The
power input and gas pressure are two major parameters to tune the deposition process.
In Wu’s study it was shown that as these two parameters are varied, discharge
characteristic change correspondingly.
Pulsed-mode, non-continuous and continues are two plasma systems have widely
used for plasma-based processes. Pulsed dc magnetron sputtering technology has been
developed in the last 10 years as useful tool for deposition of high-quality dielectric
thon films. Typically, these sputtering sources are operated in the frequency range
from 10 to 100 kHz and the duty cycles from 50% to 90% with two operation
methods of the unipolar and bipolar modes. The characteristics of plasma during
pulses and between pulses are very important in plasma-based processes as well as
understanding plasma physics.
Seo [Seo et al., 2005] investigated the effect of the duty cycle of the cathode
pulse on the plasma parameters in the pulsed magnetron discharges of
constant-voltage mode, constant-power mode and constant-current mode. They
observed that as the duty cycle of the pulse is reduced, the average electron rapidly
increases irrespective of the operating mode, although the average electron density
operation with a short duty cycle can produce the high-temperature plasma that yields
improved films quality by achieving a high ionization rate of the sputtered atoms. The
time-resloved Langmuir probe technique has been developed to obtain the evolution
of the characteristics of the plasma versus time during high-voltage pulses and
between pulses. However, the secondary electron emission during high-voltage pulses
seriously interferes with plasma measurement. Qin and McTeer [Qin and Mcteer,
2005] used a time-delayed and time-resolved Langmuir probe measurement to
measure the evolution of the plasma densities versus time of a dc pulsed,
non-continuous plasma.
1.4 Objectives and Organization of the Thesis
The purpose of the present study is to use Langmuir probe to obtain the plasma
properties in the sputtering system. It will show the investigation of the plasma with
and without the magnetron assembly and apply in different theory ways, i.e. sheath
theory and electron energy distribution function method. And then we would construct
plasma diagnose the plasma properties of the system and to make the plasma
diagnostic becomes simple in the future.
The organization of the thesis would be stated as following. It would start from
introduction and introducing the experimental apparatus briefly. The analysis theory
obtained by the theories introduced in the following chapter. It would finally show the
Chapter 2 Experimental Apparatus
2.1 Experimental Facility
2.1.1 Overview of the DC-magnetron sputtering system
The figure 2.1 shows overview of the dc-magnetron sputtering system that
contains unit of mass flow controller, system control panel, valve controller, pressure
gauge, dc power control panel and the chamber.
2.1.2 Pressure gauges
1. MKS Pressure Controller and Capacitance Manometer
The MKS Type 651 instrument (figure2.2) is a self-tuning pressure controller for
throttle valves. The self-tuning feature of the Type 651 unit determines system
characteristics necessary for control. This feature takes into account time constants,
transfer functions of the valve and plumbing, valve gain, pump speed, and many other
important parameters when determining the system characteristics. The default
window display on the front panel shows the pressure readout and the valve position
(% open). The pressure readout can be displayed in units of Torr, mTorr, mbar, µbar,
Pascal, or kPa. Five reprogrammable set points are provided, each one having the
option of being setup for pressure or position control. Valve open, close, and stop
The instrument has a high-powered driver to operate MKS type throttle valves and
equip with Baratron transducers (Capacitance Manometer figure2.3) giving the unit a
control range from 10 to 0.1 Torr. -3
2. Thermocouple Gauge and Ion Gauge
The Model 934 Wide-Range Vacuum Gauge Controllers (figure2.4) provide
pressure measurements across a broad range of vacuum environments. It also provides
easy-to-use, intuitive front panel and large, bright, digital displays for ion gauge and
low-vacuum gauges. The Model 934 controller connected to a single Bayard-Alpert
ion gauge (figure 2.5) covers a pressure range that formerly required two instruments.
It allowed us to set gas factor in vacuum gauge controller to display corrected
readings if our system uses different gases. The gas factor is a multiplier that the
vacuum gauge controller applies to a reading before it shows the result on the digital
ion gauge display. The working range of the ion gauge is from 2x10 Torr to 1 -10
Torr. The low-vacuum gauge is thermocouple gauge (figure 2.6) and the working
range of the thermocouple gauge is from 10 Torr to 999 Torr. -3
2.1.3 Plasma source
figure is the cathode region that we provide negative voltage source. And it is our
target in the centre of the picture that was made by aluminum.
2.1.4 Magnetron assembly
The figure 2.8 shows the top view and side view of the magnetron system. The
magnetic field is provided by a magnet assembly consisting of a diameter of 8.3 cm
iron plate on which is mounted a series of 1.1x0.6x2.6 cm magnets (see figure 2.8)
with the entire assembly mounted vertically under the target. The magnetic field was
measure by the Lakeshore 421 Gaussmeter (see figure 2.9); and the gaussmeter
indicated the maximum perpendicular magnetic field of 350G to the target surface at
the center and the maximum parallel magnetic field of 220G to the surface at 2.2cm
from the center.
2.1.5 DC Power Supply
The DC power supply may maximally provide 300 watts energy. The figure 2.10
shows the dc power control panel.
2.2 Experimental Instrumentation
2.2.1 Lamgmuir probe
(EPIU), a gas-cooled Radio-Frequency (RF) compensated electrostatic plasma probe
and all the required interconnection cabling, see Figure2.11.
The RF-compensated electrostatic plasma probe for fixed installations and
motorized Z-motion driver is shown in Figure 2.12. The tip can provide the potential
ramp start from -200V to 100V and resolution 0.025V minimum. This probe is
suitable for use with both DC and RF plasma; the maximum allowable temperature at
the probe tip is 2500C, the maximum allowable temperature at the mounting flange is
700C. For high temperature plasma, cooling gas may be used to limit the temperature
of the compensation components, which are mounted as close to the probe as
possible.
An automatic motor-driven Z-motion driver is an available as an option for the
probe system; see Figure 2.13.
A computer-controlled stepped motor, with maximum movement of 300mm,
powers the automatic Z-motion driver. The stepped motor is controlled by the PC via
the EPIU and the Linear Motion Driver. A lead screw drives the probe into the
chamber; vacuum sealing is provided by the flexible bellows unit.
2.2.2 Thermocouple
We could move the tip of thermocouple (see figure 2.14) to measure the
2.3 Experiment Methods and Steps
This research focuses on a spatial Langmuir probe survey of sputtering
deposition plasma and the response of this plasma to process condition. The DC
magnetron sputtering system employed in this investigation is depicted in figure 2.15.
The research is divided into with and without magnetron system conditions. Pressures
in the condition without magnetron system are set at 70 and 80 mTorr in the 99.99%
argon gas and the probe is scanned horizontally across the plasma at two different
cross-section in the constant distance between target and substrate and is also scanned
in the normal direction at the centre location above the target. Additionally, the
pressure in the condition with magnetron system are set at 10, 20 and 30 mTorr in the
Chapter 3 Langmuir Probe Diagnostics
A metal probe is one of the earliest and still the most useful tools fordiagnosing plasma. They are often used as plasma diagnostics because of their
apparent simplicity and they are constructed easily. They measure the electron
current which depends on their bias voltage with respect to the plasma potential.
Over a very range of situation, the details of the I-V curve characteristics can be
related to the plasma parameters. These probes, introduced by Langmuir and
analyzed in considerable by Mott-Smith and Langmuir are usually called
Langmuir probes.
3.1 Typical I-V
As the probe voltage is swept with respect to the plasma potential, electrons and
ions are either attracted or repelled and the net current collected by the probe changes.
From the interpretation of the I-V characteristic the electron distribution function,
electron temperature and plasma density can be obtained. A typical voltage-current
curve, in general, can be divided into three regions and two meaningful potential
value points [Chen, 1965; Schott, 1955; Hershkowitz, 1989; Chung et al., 1975]: 1.
VB<Vf: Ion saturation region. 2. Vf<VB<Vp: Transition region. 3. VB>Vp: Electron
saturation region. 4. VB=Vf: The floating potential. 5. VB=Vp: The plasma potential.
ion current and the magnitude of the ion saturation current is much smaller than the
electron current due to the much greater ion saturation mass.
1. Ion saturation region:
For the potential of probe is lower than floating potential VB<Vf, the current is
increasingly ion current tending to an ion saturation current and almost electrons are
repelled. It’s not all ions can be collected by the probe. According to Bohm criterion,
the velocity of ion should be accelerated over the Bohm velocity [Chen, 1965; Bohm,
1949; Lieberman and Lichtenberg, 1994] (
1/2 e B M KT u ⎟ ⎠ ⎞ ⎜ ⎝ ⎛
= ) so that the ion can be
collected by the probe.
2. Transition region:
For the probe potential is between plasma potential (Vp) and floating potential
(Vf), electrons are repelled according to the Boltzmann relation until at floating
potential.
3. Electron saturation region:
For increasing VB above the plasma potential, the current tends to saturate at the
electron saturation current. The probe potential is positive relative to the plasma
potential, electrons will be attracted and ions will be repelled. The electron sheath
form in the probe surface and the electron current is limited by the thermal motion of
raising potential in non-planar probe. The electron saturation current is always not a
constant and increase with the raising probe potential.
4. Floating potential:
The potential that the electron and ion currents cancel out and no net current flow
through the probe is called floating potential.
5. Plasma potential:
At the probe voltage VB=Vp, the probe is the same potential as the plasma and
draws mainly current flowing from the more mobile electron because of the electron
velocity is larger than ion velocity.
3.2 Theory of Langmuir Probe
The probe is immersing in the plasma though the structure is simple in Langmuir
probe. Its theory is quite complicated. In order to simplify the probe theory, we need
to do some assumptions in process of analyzing.
1. The plasma should be uniform and quasi-neutral in the condition without
probe.
2. Electrons and ions must obey Maxwellian velocity distribution.
3. Electron temperature is far larger than ion temperature.
4. The mean free path of electron and ion is far larger than any characteristic
5. Each charged particle hitting the surface of probe will be neutralized
completely and secondary electrons will not occur.
3.2.1 Planar Probe with Collisionless Sheath
Considering a flat plate probe with the physical probe area A>>s2, where s is the
sheath thickness, such that the collecting area A is essentially independent of s.
A. Electron Current:
In thermal equilibrium and without perturbation in the plasma, the particle
current density is v N 4 1 Jr = (3.1)
where Jr is particle current density, N is particle number density, and
1/2
M 8KT v=⎢⎣⎡ ⎥⎦⎤
π is
mean speed in thermal equilibrium.
Then the electron current Ie that the probe collects can be state as
e e e eN AV 4 1 I = (3.2)
WhenVB ≥Vp, all electrons move into the sheath with thermal motion. The
property of plasma at the sheath edge is quasi-neutral, i.e.
∞ ∞
∞ ≈N ≡N
Ne i
whereNe∞、Ni、∞ N∞ represent the density of electrons, ion and plasma with infinity
e e e sat e, eN AV 4 1 V A eN 4 1 I = ∞ = ∞ (3.3)
When VB<Vp, electrons are repelled by the probe. From the previous assumption,
electrons must obey Maxwellian velocity distribution function,
( )
⎥ ⎦ ⎤ ⎢ ⎣ ⎡ ⎥⎦ ⎤ ⎢⎣ ⎡ = ∞ e 2 e 1/2 e e e 2KT mv exp m 2KT N v fπ . From Boltzmann relation, the electron density
becomes ⎥ ⎦ ⎤ ⎢ ⎣ ⎡ = ∞ e p e e T V -V exp N N (3.4)
The electron current in the transition region and the ion saturation can be
represents as ⎥ ⎦ ⎤ ⎢ ⎣ ⎡ = ⎥ ⎦ ⎤ ⎢ ⎣ ⎡ = ∞ e p sat e, e e p e e T V -V I V A T V -V exp eN 4 1 I (3.5) B. Ion Current:
When VB<Vp, ions are attracted by the probe. Because ion temperature is low, ion
mass is large, the mean velocity of ion is far smaller than electrons in thermal
equilibrium. It’s more complicated than electrons in current analyzing.
The ion sheath will occur in the probe surface when the probe potential is lower
than plasma. The electron density would then decay to shield the electrons from the
wall. We will show that a transition layer or presheath must exist between the neutral
rise to an ion velocity at the plasma-sheath edge.
We define the zero of the potential V at x=0 and the ions have a velocity us
there.
Ion energy conservation (in collisionless) then gives
( )
Mu -eV( )
x 2 1 x Mu 2 1 2 s 2 = (3.6)The continuity of ion flux (no ionization in the sheath) is
( ) ( )
is s i xu x n un = (3.7)
where nis is the ion density at the sheath edge. Solving for u(x) from equation (3.6)
and substituting in equation (3.7) we have
( )
2 -1/2 s is i Mu 2eV -1 n x n ⎟⎟ ⎠ ⎞ ⎜⎜ ⎝ ⎛ = (3.8)The electron density is given by the Boltzmann relation can be stated as
( )
V( )x/Tees e x n e
n = (3.9)
Setting Nes =Nis ≡Nsat the sheath edge and substituting N and i N into e
Poisson’s equation
( ) ( )
[
n x -n x]
e dx V d i e 0 2 2 ε = (3.10) We obtain ( ) ⎥ ⎥ ⎦ ⎤ ⎢ ⎢ ⎣ ⎡ ⎟⎟ ⎠ ⎞ ⎜⎜ ⎝ ⎛ = -1/2 2 s /T x V 0 s 2 2 Mu 2eV -1 -e en dx V d e ε (3.11)( )
∫
∫
⎥⎥ ⎦ ⎤ ⎢ ⎢ ⎣ ⎡ ⎟⎟ ⎠ ⎞ ⎜⎜ ⎝ ⎛ = ⎟ ⎠ ⎞ ⎜ ⎝ ⎛ V 0 -1/2 2 s /T x V 0 s V 0 dx Mu 2eV -1 -e dx dV en dx dx dV dx d dx dV e ε (3.12) ( ) ⎥ ⎥ ⎦ ⎤ ⎢ ⎢ ⎣ ⎡ ⎟⎟ ⎠ ⎞ ⎜⎜ ⎝ ⎛ + = ⎟ ⎠ ⎞ ⎜ ⎝ ⎛ e Mu -Mu 2eV -1 e Mu T -e T en dx dV 2 1 2 s -1/2 2 s 2 s e /T x V e 0 s 2 e ε (3.13)It is apparent that the RHS of the equation (3.13) should be positive. We expect
this to be the problem only for small V; we expand the RHS of equation (3.13) to
second order in a Taylor series to obtain
0 Mu eV 2 1 -T V 2 1 2 s 2 e 2 ≥ (3.14) We see that B 1/2 e s u M eT u ⎟ ≡ ⎠ ⎞ ⎜ ⎝ ⎛ ≥ (3.15)
This result is known as Bohm sheath criterion [Langmuir, 1961] [Bohm, 1949]
[Lieberman and Lichtenberg, 1994]. There must be a finite electric field in presheath
region to give the ions the directed velocity uB.
From the Bohm sheath criterion, considering that the probe is biased sufficiently
negatively to collect only ion current which was collected by the probe is
B i sat
i, enAu
I = (3.16)
The potential drop across the presheath, which accelerates the ions to Bohm
velocity, is given by p 2 B eV Mu 2 1 = (3.17)
2 T
V e
p = (3.18)
The ratio of the density at the sheath edge to that in the plasma is found from the
Boltzmann relation ∞ ∞ ≈ =n e 0.61n n -Vp/Te s (3.19)
Then we can obtain the ion current
1/2 e sat i, M eT A 0.61en I ⎟ ⎠ ⎞ ⎜ ⎝ ⎛ = ∞ (3.20)
When ion start to be repelled ( VB>Vp ), the ion current goes to zero rapidly and
it can be state as
(
)
⎟⎟ ⎠ ⎞ ⎜⎜ ⎝ ⎛ = i B p sat i, i KT V -V e exp I I (3.21)3.2.2 Cylinder probe with collisionless sheath [Langmuir
Mott-Smith, 1926; Laframboise, 1966; Chung et al, 1975;
Lieberman and Lichtenberg, 1994]
In the previous section, we discuss the basic probe theory by the planar probe.
The planar probe would make too much perturbation in the plasma because of its
large assembling surface. In practically, we would choose the cylindrical type probe to
We consider first a thin wire probe for which the sheath thickness, s, is lager than
the probe radius, a. In the saturation condition, only a single species is collected. A
giving incoming particle in the attractive central force of the probe has initial velocity
components -νr and νφ in the radial and azimuthal at the edge of the sheath r=s.
At the probe radius r=a, the corresponding compounding are ' r
-ν and '
φ
ν . For a
collisionless sheath we require conservation of energy,
(
)
(
2 '2)
r ' B p 2 2 r m 2 1 V -V e m 2 1 φ φ ν ν ν ν + + = + (3.22)and conservation of angular momentum
'
a
sνφ = νφ (3.23)
where m is the mass of the attracted species, either electrons or ions. Then we obtain
m V -V 2e a s -1 2 p B 2 2 2 r 2 r ' + ⎟⎟ ⎠ ⎞ ⎜⎜ ⎝ ⎛ + =ν νφ ν (3.24)
For ion to reach the probe, setting ν'2r =0
1/2 2 2 B p 2 r 0 s /a -1 /m V -V 2e ⎟ ⎟ ⎠ ⎞ ⎜ ⎜ ⎝ ⎛ + = ν νφ (3.25)
The particle only reach the probe ifνφ ≤νφ0.
The saturation current collected by the probe is found by integrating the radial flux
r s
n
- ν over the distribution function at the sheath edge, for those particles that reach
the probe:
(
)
φ ν νν
ν
φν
ν
ν
π
φ φd
,
f
d
sd
-e2
j
-eA
I
0 0 - r r 0 - r s=
∫
∞∫
=
(3.26)where f is the normalized distribution function of electrons or ions. The distribution is
an isotropic Maxwellian, averaged over the third velocity coordinate, we have
(
)
(
)
⎥ ⎥ ⎦ ⎤ ⎢ ⎢ ⎣ ⎡ + = s 2 2 r s r 2eT m -exp eT 2 m , f φ ν νφ π ν ν (3.27)where Ts is the temperature of the collected species at the sheath edge. For large probe
voltage,Vb-Vp >> , we can simplify the evaluation of (equation 3.26) by assuming Te
that 1 s a << (3.28) m V -V e p B 2 r << ν (3.29) m eTs 2 0 << φ ν (3.30)
Using equation (3.28) and (3.29) to evaluate equation (3.25), we obtain 1/2 B p 0 m V -V 2e s a ⎟ ⎟ ⎠ ⎞ ⎜ ⎜ ⎝ ⎛ = φ ν (3.31)
Using equation (3.27) and (3.31) in equation and condition equation (3.30), we
integral to find that
1/2 B p s
m
V
-V
2e
ad
2en
I
⎟
⎟
⎠
⎞
⎜
⎜
⎝
⎛
=
(3.32)3.3 Theory of electron energy distribution function (EEDF) [Schott,
1955; Hershkowitz, 1989; Lieberman and Lichtenberg, 1994]
be written as
( )
v f d d d eA I z z e - y - x e min ν ν ν ν ν∫
∫
∫
∞∞ ∞ ∞ ∞ = (3.33) where(
)
1/2 B p min m V -V 2e ⎥ ⎦ ⎤ ⎢ ⎣ ⎡ = νin the retarding potential region Vp-VB > , is the minimum velocity for an electron 0
along z at the plasma-sheath edge to reach the probe. For an isotropic distribution we
can introduce spherical polar coordinates in velocity to obtain
( )
ν
θ
θν
φν
θ
ν
θ π ν e 2 2 0 0 eeA
d
d
d
cos
sin
f
I
min min∫
∫
∫
∞=
(3.34)Where A is the physical collecting area of the probe and
ν ν
θ -1 min
min =cos The φ and θ are integrated, yielding
( )
ν
ν
ν
ν
ν
π
ν e 3 2 2 min eeA
d
1
-
f
I
min⎟⎟
⎠
⎞
⎜⎜
⎝
⎛
=
∫
∞ (3.35)Introducing the change of variable
e m 2 1 ν2 ε = , then
( )
[ ]
⎭
⎬
⎫
⎩
⎨
⎧
⎟
⎠
⎞
⎜
⎝
⎛
=
∫
∞ν
ε
ε
ε
ε
π
e V 2 3 ef
V
-1
d
A
m
e
2
I
(3.36) where ( ) 1/2 m 2e ⎟ ⎠ ⎞ ⎜ ⎝ ⎛ = ε ε ν . Differentiating Ie we obtain( )
[ ]
ν
ε
ε
π
e V 2 3 eA
d
f
m
e
2
-dV
dI
∫
∞=
(3.37)( )
[
V
]
Af
m
e
2
dV
I
d
e 2 3 2e 2ν
π
=
(3.38)It is usually to introduce the electron energy distribution function (EEDF) ge
( )
ε byg( )
ε dε 4πν2fe( )
ν dνe = .
Using the relation between ε and ν, we find
( )
ε π ε1/2 e[ ]
ν( )
ε 3/2 e f m 2e 2 g ⎟ ⎠ ⎞ ⎜ ⎝ ⎛ = (3.39)Using this to estimate fe from (equation 38), we obtain
( )
2e 2 1/2 2 e dV I d m 2eV A e 2m V g ⎟ ⎠ ⎞ ⎜ ⎝ ⎛ = (3.40)The electron energy probability function (EEPF)
( )
ε ε-1/2 e( )
εp g
g = is
sometimes introduced. For a Maxwellian distribution,
( )
⎟⎟
⎠
⎞
⎜⎜
⎝
⎛
=
e 3/2 -e e pT
-exp
T
n
2
g
ε
π
ε
(3.41)Obviously, we could obtain the EEDF and EEPF curves from the second order
differentiation of the electron saturation current. We also could use ge
( )
ε to obtain the electron densityne, average energy and effective temperature by the followeddefinition
∫
∞ = 0 e e g d n ε∫
∞ = 0 e e d g n 1 ε ε ε ε 3 2 Teff =3.4 Parameter Calculation
As the probe voltage is swept with respect to the plasma potential, electrons and
ions are either attracted or repelled and the net current collected by the probe changes.
From the interpretation of the I-V characteristic the electron distribution function,
electron temperature and plasma density can be obtained.
1. Plasma potential:
From I-V curve, we may obtain the plasma potential directly by max dV dI B = or 0 dV I d 2 B 2 = . 2. Plasma density:
In ion saturation region, the ion saturation current can be state as
1/2 B p s m V -V 2e ad 2en I ⎟ ⎟ ⎠ ⎞ ⎜ ⎜ ⎝ ⎛ =
And a plot of I2 versus VB should be linear, with ns2 by the slope of this line,
independent of Te and Ti.
3. Electron temperature:
In the transition and electron saturation region, the current can be state
respectively as e e p B e e T AV V -V exp eN 4 1 I ⎥ ⎦ ⎤ ⎢ ⎣ ⎡ = ∞ and
e e sat e, eN AV 4 1 I = ∞
Comparing above equations and taking the logarithm, we have
e P B sat e, e T V -V I I ln ⎟⎟= ⎠ ⎞ ⎜⎜ ⎝ ⎛
From above equation we see that the electron temperature can be written as
( )
( )
-1 B e dV lnI d eV T ⎟⎟ ⎠ ⎞ ⎜⎜ ⎝ ⎛ = 4. EEDF theory:We can obtain the electron energy distribution function (EEDF), ge
( )
ε , from the secondary differential of the electron current 2e2
dV I d
. And using ge
( )
ε that we could obtain the electron density ne, average energy and effective temperature by thefollowed definition
∫
∞ = 0 e e g d n ε∫
∞ = 0 e e d g n 1 ε ε ε ε 3 2 Teff =Chapter 4 Results and Discussion
We can obtain lots of properties of plasma from the I-V curve measured by
the electrostatics probe. The object we will measure is the DC sputtering chamber
in MuST laboratory. The probe was driven by the Z-motion will pass through
above the target from the left side to the right side. We started to measure the I-V
curve from the point 8cm besides left the center of the target to the point 8cm
besides right the centre of the target and we set the center of the target is x=0 (see
figure 4.1). We also set the distance of the horizontal cross section to the surface of
the target is Z and the surface of the target is z=0 (see figure 4.1). We will show the
I-V curves and the properties of plasma with and without magnetron in this chapter.
Then, we will show the spatial survey of the properties of a sputtering plasma
system between the substrate and the target.
4.1 The discharges with magnetron
An aluminum target is used with 99.99% purity argon gas at pressures of 10
mtorr, 20 mtorr and 30 mtorr and the magnetron assembly was installed under the
cathode. Figure 4.2 shows the picture of the discharge with magnetron assembly
and we can see the extreme glowing region above the target. The target voltage for
every scan was 310 V at 10 mtorr, 270 V at 20mtorr and 250 V at 30mtorr;
completed for each pressure at distances 4 and 6 cm from the cathode in the gap
distance 8 cm between the target and the substrate. Four horizontal surveys are
also completed for each pressure at distances 4, 6, 8 and 10 cm from the cathode in
the gap distance 11 cm between the target and the substrate.
4.1.1 Plasma potential and floating potential
The plasma potential of the horizontal surveys is presented from the figure
4.3 to the figure 4.5. There is a slight variation in plasma potential for each
horizontal and vertical survey. This weak change in plasma potential indicates that
there is a very weak electric field in the plasma.
The floating potential in contrast to plasma potential has a strong dependence
on the pressure and the spatial position. We could see horizontal distribution of
floating potential from figure 4.6 to figure 4.8 and vertical distribution in figure
4.9. We can find that in the outer edge of the cathode the floating potential is near
to 0 V but drops to minus when the probe moved into the center of the cathode. In
the vertical distribution, we can also find that the floating potential far away the
cathode is larger than the floating potential closing to the cathode.
The floating potential is dependent on the relative flux of electrons and ions
to the probe where the flux depends on the density and energy of the respective
the energy differences between the electron and positive ions. Duo to the great
difference in mass, the electrons are more mobile than the ions so the floating
potential is expected to depend on the electron energy. Hence, the changes in the
floating potential should be mirrored by changes to the electron energy or the
electron temperature.
From the concept of floating potential, we can equate the ion flux to the
electron flux, i.e. Φ /Te e e s B s i n v e W 4 1 = u n =
Γ =Γ . Solving for Φw ( the potential of
the probe respect to the sheath-presheath edge), we obtain
1/2 e w m 2 M ln -T ⎟ ⎠ ⎞ ⎜ ⎝ ⎛ = π Φ .
For argon gas, we can calculateΦw =-4.7Te. This means the argon ion with initial
energy εs =0.5Tefall through a collisionless dc sheath to a floating probe with
energy ofεi ≈5.2Te. We could preliminary estimate the value of e f p T V -V would
be around 5.2 ideally. Table 1~3 show the value of e f p T V -V in different places in
the chamber. The values are a little less than the ideal value. This means we could
overestimate the electron temperature or underestimate the plasma potential.
4.1.2 Plasma density
In the previous chapter, we talk about the sheath theory and electron energy
distribution function (EEDF). These two kinds of theories have different functions
plasma density and plasma potential via sheath theory. In the other hand, we could
obtain electron temperature and plasma density via electron energy distribution
function (EEDF) theory.
For the sheath theory, i.e. OML theory, we could obtain the plasma density and it
also required a thick sheath. On the other hand, the electron energy distribution
function is not affected by the thickness of the sheath and it also doesn’t require the
distribution of the electron energy obey the Maxwellian distribution. The theory of
electron energy distribution function is derived from the planar probe so it couldn’t
show the completely spatial symmetry. Figure 4.10 shows the differences of plasma
density between derived from sheath theory and the electron energy distribution
function theory. The plasma density derived from sheath theory is a little larger than
the plasma density from EEDF in the same position.
We also show the horizontal survey in the figure 4.11 and 4.12, and in these
figures the plasma density has larger value in the center of the target. In the outer field
of the cathode have lower value of the plasma density. In figure 4.13 with the probe
which was located above the center of the cathode, it shows the plasma density
decrease with the probe move up away the cathode. It makes sense that this location
close to the cathode (inside the magnetic trap) would record the highest electron
plasma diffuses outwards.
4.1.3 Electron temperature
There are two ways to obtain the electron temperature as we have remarked
before. We could obtain the electron temperature from the analysis of the curve of the
electron current but the electron energy distribution should be obeyed the Maxwellian
distribution first. Fortunately, most of the data are closing to the Maxwellian
distribution and we could receive the meaningful electron temperature.
In the theory of electron energy distribution function, it is using the method of
the averaged energy of distribution function as following equations. The equation 4.2
uses Teff to represent the effective electron temperature. The advantage of EEDF is
that the results are not influenced by the electron energy distribution and response the
instantaneous state of the plasma. We could find the difference of the electron
temperature derived from sheath theory and EEDF in the figure 4.16.
∫
∞ = 0 e e d g n 1 ε ε ε (4.1) ε 3 2 Teff = (4.2)As the previous mentioned, the electron temperature is mirrored to the change of
the floating potential. In the figure 4.14 and 4.15, it shows the horizontal distribution
of electron temperature above the cathode. At the outer edges of the cathode the
2 eV above the center of the cathode. In figure 4.17 with the probe located above the
center of the cathode, it shows the electron temperature decrease with the probe move
up away the cathode. It makes sense that the plasma power source closes to the
cathode would generate the highest electron temperature and that at greater distances
vertical to the cathode the electron temperature would fall as more collisions occurred
outwards. We also can find the trend that the higher working pressure could lead to
lower electron temperature in figure 4.18. It could be realized that the more gas
molecules mean the more collisions occur and the electrons would lose its energy
after every collision.
4.2 The discharges without magnetron
In the discharges condition without magnetron, we also used an aluminum target
and 99.99% purity argon gas at pressures of 70 mtorr and 80 mtorr and removed the
magnetron assembly under the cathode. Figure 4.19 shows the picture of the discharge
without magnetron. According to the Paschen curve, we need the higher applied
voltage to make the gas discharge. The target voltage for every horizontal scan was
710 V at 70 mtorr and 700 V at 80 mtorr; currents at 0.01 A. Two horizontal surveys
are completed for each pressure at distances 2 and 3 cm from the cathode in the gap
4.2.1 Plasma potential and floating potential
The plasma potential of the horizontal surveys is presented from the figure
4.20. The variation in plasma potential is larger than the condition with magnetron
for each horizontal survey. This small change in plasma potential indicates that
there is a weak electric field in the plasma.
The floating potential in contrast to plasma potential has a strong dependence
on the spatial position. We could see horizontal distribution of floating potential in
figure 4.21. We can find that the floating potential decrease when the probe move
from the outer edge of the cathode to the center of the cathode.
The floating potential is dependent on the relative flux of electrons and ions to
the probe where the flux depends on the density and energy of the respective species
as we have mentioned before. Because of the plasma is quasineutral, any
inconsistency in flux will result the energy differences between the electron and
positive ions. Duo to the great difference in mass, the electrons are more mobile than
the ions so the floating potential is expected to depend on the electron energy. Hence,
the changes in the floating potential should be mirrored by changes to the electron
energy or the electron temperature.
As mentioned concept of floating potential in the section 4.1.1, we could state a
e f p T V -V
are larger than the ideal value, i.e. 5.2. This means the electron temperature is underestimated and plasma potential is overestimated in the condition operated
without magnetron.
4.2.2 Plasma density
We could obtain electron temperature and plasma density via electron energy
distribution function (EEDF) theory and sheath theory. The advantages and
disadvantages of the both methods had been mentioned before. We could find the
horizontal distribution of plasma density in figure 4.22. We also find out that the
plasma density is obviously quite smaller than the condition with magnetron even the
working pressure is larger than the condition with magnetron.
4.2.3 Electron temperature
There are two ways to obtain the electron temperature as we have remarked
before. We could obtain the electron temperature from the analysis of the curve of the
electron current but the electron energy distribution should be obeyed the Maxwellian
distribution first. Fortunately, most of the data are closing to the Maxwellian
distribution and we could receive the meaningful electron temperature by both of
above methods.
the floating potential. We also can find that the greater distances horizontal to the
center of the cathode and the electron temperature would fall down from figure 4.23
even though the range of decreasing is not large. The electron temperature did not rise
Chapter 5 Conclusions and Future Work
5.1 Summary
In the previous chapter, it could be found that we were dealing with two different
conditions. One condition is the system without the magnetron and another condition
is the system with the magnetron. The discharge system would need the higher
pressure and the system cannot be applied larger currents when system was operated
without the magnetron. The results of the distribution of plasma properties were not
symmetric as our expectation at beginning in both of conditions. We make the
coordinate move 4 cm right and the symmetry seems to be improved. It was found, in
general, that the pressure increased could lead density increasing at the same system
conditions. It also could be found that the electron temperature and the density
increased and floating potential decreased when thee probe moved forward into the
centre of the target.
The system with magnetron can generate the greater plasma density than the
system without magnetron, although the system with magnetron would be operated in
the lower pressure. The density and the electron temperature decrease progressively
with the distance of vertical the cathode increasing in the system with magnetron.
Because of the small variation of plasma potential, the electrical field in the plasma is
electron temperature, i.e. the floating potential decrease and the electron temperature
increase.
5.2 Recommendations for Future Work
This is a preliminary research to survey the special distribution of plasma
characteristics and it still has a lot of problems need to overcome. We could obtain the
different current values by applying a voltage bias when we install the electrostatic
probe into the plasma. However, it also disturbed the environment of the plasma. To
minimize the effects of the electrode that was on the probe was the following
problems needed to be solved.
When we put the magnetron into the system, the system can be operated in the
lower pressure. It also increased the sputtering phenomenon and it led the lots of
aluminum coated on the surface of the probe. Since the aluminum is the conductive
material, it seems to coat an electrode on the probe and increases the thickness of the
tip. It is also important to clean the probe after the measurement and decrease the time