• 沒有找到結果。

4 Circuit Design

4.6 Simulated Result of Pipelined ADC with Power Noise

There are both digital circuit and analog circuit in a pipelined ADC. The power noise due to the digital circuit impacts the analog circuit performance. Thus we use the separated power line to reduce the effect of the power noise. But the substrate noise still impacts the analog circuit performance. In the section, we add a pad which is shown in Figure 4.24 to simulate power noise at ground and VDD and the dirty power is shown in Figure 4.25. Figure 4.26 shows the DNL and INL. The simulation result is worse than ideal power line. Figure 4.27 shows the FFT spectrum with input signal at 292.96875 KHz. The SNDR is 49.503dB, and the SFDR is 62.018dB. It is worse than ideal case, but this ADC still can archive 8 bit resolution in this noisy environment.

Figure 4.24 The simulated power PAD

Figure 4.25 Power noise

(a) (b)

Figure 4.26 Simulated results of the pipelined ADC with power noise (a) DNL (b) INL

Figure 4.27 512 points FFT spectrum of the pipelined ADC at 292.96875KHz input signal

5 Conclusions

5.1 Conclusion

An 8 bit pipelined analog-to-digital has been designed and simulated in TSMC CMOS 0.35um 2P4M technology. Based on the analysis and simulation results, the summary is as follows:

1. The error due to the mismatch of devices dominates the ADC performance in low-to-medium resolution ADC, especially the capacitor matching in MDAC.

2. The 1.5 bit/stage architecture is adopted for high speed ADC that data latency is of little concern. It can reduce the requirement of the op-amp in switched capacitor.

3. The dynamic comparator provides high conversion speed and low capacitance loading. But it introduces a kickback noise to the analog signal path. In high speed ADCs, the noise must be reducing. The improved way is using static comparator or adding a new advanced clock.

4. The digital circuits inject noise into the substrate and power line, especially the clock generator. The analog and digital power line must be separated. The cross point of analog signal path and digital signal path must be reduced and design carefully in the layout, especially the input of the op-amp.

5. The higher sample rate pipelined ADC required high speed op-amp. The

telescopic op-amp will be required more current and device size to support high sampling rate. The parasitic capacitor at the input of the op-amp is also increased.

Thus the gain of the op-amp is required more. The simple telescopic op-amp may be not adopted for more high speed ADC.

Reference

[1] R.H., Walden, “Analog-to-digital converter survey and analysis,” IEEE J.

Selected Areas in Communications, vol.17, no.4, April 1999.

[2] Boris Murmann, “VLSI Data Conversion Circuits,” CCNet of Stanford University.

[3] Yun Chiu, “High-Performance Pipelined A/D Converter Design in Deep-Submicron CMOS,” UC Berkeley MS Thesis, 2004.

[4] B. Razavi, “Principles of Data Conversion System Design,” IEEE PRESS 1995.

[5] R. V. D. Plassche, “Integrated Analog-to-Digital and Digital-to-Analog Converters,” Kluwer Academic Publishers, 1994.

[6] Kuang-Wei Cheng, “A 1.0-V, 10-Bits CMOS Pipelined Analog-to-Digital Converter,” Department of Electrical Engineering of National Taiwan University, June 2002.

[7] Chung-Yu Wu, “Analog Integrated Circuits II,” Department of Electronics Engineering of National Chiao-Tung University, 2004.

[8] David William Cline, “Noise, Speed, and Power Trade-offs in Pipelined Analog to Digital Converters,” UC Berkeley PhD Thesis, November, 1995.

[9] Mark Burns, Gordon W. Roberts, “An Introduction to Mixed-Signal IC Test and Measurement,” Oxford University Press, 2001, Ch12.

[10] F. Adamo, F. Attivissimo, N. Giaquinto, and M. Savino, “FFT Test of A/D Converters to Determine the Integral Nonlinearity,” IEEE J. Transactions on Instrumentation and Measurement, vol.51, no.5 October 2002.

[11] J. Doernberg, H. S. Lee, and D. A. Hodges, “Full-Speed Testing of A/D

Converters,” IEEE J. of Solid-State Circuits, vol. SC-19, no.6, December 1984, pp.820-827.

[12] G. Chiorboli, G. Franco, and C. Morandi, “Analysis of Distortion in A/D Converters by Time-Domain and Code-Density Techniques,” IEEE J.

Transactions on Instrumentation and Measurement, vol.45, no.1, February 1996.

[13] D.A. Johns and K. Martin, “Analog Integrated Circuit Design,”

McGraw-Hill Inc., pp.487-527 2000

[14] Maxim Integrated Products, “A/D and D/A CONVERSION/SAMPLING CIRCUITS,” Dallas Semiconductor, 2000.

[15] L. Sumanen, M. Waltari, K. Halonen, “A 10-bit, 14.3MS/s CMOS pipelined analog-to-digital converter,” IEEE J. Solid-State Circuits, vol. 34, pp.

599-606, May. 1999.

[16] L. Sumanen, “Pipeline Analog-to-Digital Converters for Wide-Band Wirless Communications,” Helsinki Unversity MS Thesis, 2002.

[17] Ming Ou Yang, “The Design and analysis of a CMOS Low-Power 10-bit 20MS/s Pipelined Analog-to-Digital Converter,” Department of Electronics Engineering of National Chiao-Tung University, Master Thesis, June 2003.

[18] Thomas Cho. “Low power low voltage A/D conversion techniques using pipelined architecture,” UC Berkeley PhD Thesis, 1995.

[19] S. H. Lewis, “A 10-b 20-Msample/s Analog-to-Digital Converter” IEEE J.

Solid-State Circuits, vol. 27, no. 3, pp. 351-357, March. 1992.

[20] E. Soenen, “Technology tradeoffs in the design of high performance analog to digital converters,” Electronics Circuits and Systems, 2001. ICECES 2001. The 9th IEEE International Conference on, Volume:1. pp. 7-11 vol.1, 2001.

[21] Cheng-Chung Hsu, and Jieh-Tsorng Wu, “A CMOS 33-mW 100-MHz 80-dB SFDR Sample-and-Hold Amplifier,” IEICE TRANS ELECTRON., vol.E85-C, no.1, January. 2002.

[22] Chi-Hui Huang, “A 125 MHz 10-Bit CMOS Fully Differential Sample and Hold Circuit,” Department of Electronics Engineering of National Chiao-Tung University, Master Thesis, July, 1999.

[23] Ojas Choksi, and L. Richard Carley, “Analysis of Switched-Capacitor Common-Mode Feedback Circuit,” IEEE Transactions on Circuits and Systems—II: Analog and Digital Signal Processing, vol.50, no.12, pp.

906-916, December. 2003.

[24] Paul J. Hurst, and Stephen H. Lewis, “Determination of Stability Using Return Ratios in Balanced Fully Differential Feedback Circuits” IEEE Transactions on Circuits and Systems—II: Analog and Digital Signal Processing, vol.42, no.12, pp. 805-817, December. 1995.

[25] R. Lotfi, M. Taherzadeh-Sani, M. Yaser Azizi, and O. Shoaei, “A 1-V MOSFET-ONLY FULLY-DIFFERENTIAL DYNAMIC COMPARATOR FOR USE IN LOW-VOLTAGE PIPELINED A/D COONVERTERS,”

Signals, Circuits and Systems, 2003. SCS 2003. International Symposium vol.2, pp. 377-380 July 2003.

[26] Lourans Samid, Patrick Volz, and Yiannos Manoli, “A dynamic analysis of a latched CMOS comparator,” Circuits and Systems 2004. ISCAS '04.

Proceedings of the 2004 International Symposium, vol 1, pp. 181-184, May.

2004.

VITA

姓名:夏志朋

相關文件