應變矽奈米CMOS元件的熱載子可靠性研究與分析
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(2) 應變矽奈米 CMOS 元件的熱載子 可靠性研究與分析 Investigation of Hot Carrier Reliabilities in Strained-Silicon Nanoscale CMOS Devices. 研 究 生 : 劉又仁. Student : You-Ren Liu. 指導教授 : 莊紹勳 博士. Advisor : Dr. Steve S. Chung. 國立交通大學 電子工程學系 電子研究所碩士班 碩士論文. A Thesis Submitted to Department of Electronics Engineering & Institute of Electronics College of Electrical Engineering and Computer Science National Chiao Tung University in Partial Fulfillment of the Requirements for the Degree of Master of Science in Electronics Engineering July 2005 Hsinchu, Taiwan, Republic of China.. 中華民國 九十四 年 七 月.
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