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A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes

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Fig. 1 Simplified semi-conductor ‘back-end’ flow
Fig. 2 An example of the application of AWDLs at monitored workstations
Fig. 4 Scheme of correction action
Table 2 Duncan ’s multiple test results for mean cycle time, mean throughput rate and AOTDP Total WIP Level (chip lots) μ+3σ
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