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A Heuristic Input Control Method for a Single-Product and High-Volume Wafer Fabrication to Minimize the Number of Photomask Changes

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Reproduced with permission of the copyright owner. Further reproduction prohibited without permission.

A Heuristic Input Control Method for a Single-Product, High-Volume Wafer Fabr...

Ching-Chin Chern; Kwei-Long Huang

Journal of Manufacturing Systems; 2004; 23, 1; ABI/INFORM Global pg. 30

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