台灣師範大學機電科技學系 -1-
10
台灣師範大學機電科技學系 -2-10.1 Introduction 10.2 Transducers 10.3 Vibration Pickups
10.4 Frequency-Measuring Instruments 10.5 Vibration Exciters
10.6 Signal Analysis
10.7 Dynamic Testing of Machines and Structure 10.8 Experimental Modal Analysis
10.9 Machine-Condition Monitoring and Diagnosis
C. R. Yang, NTNU MT
10.1 Introduction
10.1
C. R. Yang, NTNU MT
10.1 Introduction
• Why we need to measure vibrations:
–To detect shifts in ωnwhich indicates possible failure –To select operational speeds to avoid resonance
–Measured values may be different from theoretical values –To design active vibration isolation systems
–To identify mass, stiffness and damping of a system –To verify the approximated model
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.1 Introduction
• Type of vibration measuring instrument used will depend on:
–Expected range of frequencies and amplitudes –Size of machine/structure involved
–Conditions of operation of the machine/structure –Type of data processing used
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.2
Transducers
10.2
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10.2 Transducers
• A device that transforms values of physical variables into electrical signals
• Following slides show some common transducers for measuring vibration
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.2 Transducers
• Variable Resistance Transducers
Mechanical motion changes electrical resistance, which cause a change in voltage or current
Strain gage is a fine wire bonded to surface where strain is to be measured.
台灣師範大學機電科技學系 -9-
• Variable Resistance Transducers
Surface and wire both undergo same strain.
Resulting change in wire resistance:
where K = Gage factor of the wire R = Initial resistance ΔR = Change in resistance L = Initial length of wire ΔL = Change in length of wire v = Poisson’s ratio of the wire r = Resistivity of the wire
Δr = Change in resistivity of the wire ≈ 0 for Advance
L v L r v r L L
R
K R 1 2 1 2
/
/
台灣師範大學機電科技學系 -10-
• Variable Resistance Transducers
Strain:
The following figure shows a vibration pickup:
RK R L
L
C. R. Yang, NTNU MT
10.2 Transducers
• Variable Resistance Transducers
ΔR can be measured using a Wheatstone bridge as shown:
R R
R R
VR R R
E R
4 3 2 1
4 2 3 1
C. R. Yang, NTNU MT
10.2 Transducers
• Variable Resistance Transducers
Initially, resistances are adjusted so that E=0 R1R3= R2R4
When Richange by ΔRi,
3 4
24 3 2 2 1
2 1 0 4
4 3
3 2
2 1
1
0 where
R R
R R R R
R r R R
R R
R R
R R Vr R
E
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.2 Transducers
• Variable Resistance Transducers
If the leads are connected between pts a and b, R1=Rg, ΔR1,= ΔRg, ΔR2= ΔR3= ΔR4=0
where Rgis the initial resistance of the gauge.
Hence E can be calibrated to read ε directly.
0
0
or
E KVr
Vr K E R
R
g
g
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.2 Transducers
• Piezoelectric Transducers
Certain materials generate electrical charge when subjected to deformation or stress.
Charge generated due to force:
where k =piezoelectric constant A =area on which Fxacts px=pressure due to Fx.
x x
x
kF kAp
Q
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.2 Transducers
• Piezoelectric Transducers E=vtpx
v = voltage sensitivity t = thickness of crystal
A piezoelectric accelerometer is shown.
Output voltage proportional to acceleration
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.2 Transducers
Example 10.1
Output Voltage of a Piezoelectric Transducer
A quartz crystal having a thickness of 2.5mm is subjected to a pressure of 50psi. Find the output voltage if the voltage sensitivity is 0.055 V-m/N.
台灣師範大學機電科技學系 -17-
Example 10.1
Output Voltage of a Piezoelectric Transducer Solution
E = vtpx =(0.055)(0.00254)(344738) = 47.4015V
台灣師範大學機電科技學系 -18-
• Electrodynamic Transducers
Voltage E is generated when the coil moves in a magnetic field as shown.
E = Dlv
where D = magnetic flux density l = length of conductor v = velocity of conductor
relative to magnetic field I F v DlE
C. R. Yang, NTNU MT
10.2 Transducers
• Linear Variable Differential Transformer Transducer Output voltage depends on the axial displacement of the core.
Insensitive to temp and high output.
C. R. Yang, NTNU MT
10.3 Vibration Pickups
10.3
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10.3 Vibration Pickups
• Most common pickups are seismic instruments as shown
• Bottom ends of spring and dashpot have same motion as the cage
• Vibration will excite the suspended mass
• Displacement of mass relative to cage: z = x – y
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.3 Vibration Pickups
• Y(t) = Ysinωt
• Equation of motion of mass m:
• Steady-state solution:
t Y m kz z c z m
y m kz z c z m
y x k y x c x m
sin
or 0
2
t Z t
z sin
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.3 Vibration Pickups
n
n
m
r c
r r m
k c
r r
Y r c
m k Z Y
2 ,
1 tan 2 tan
2 1
2 1 2
1
2 2 2
2
2 2 2 2
2
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.3 Vibration Pickups
• Vibrometer
Measures displacement of a vibrating body Z/Y ≈ 1 when ω/ωn≥ 3 (range II)
In practice Z may not be equal to Y as r may not be large, to prevent the equipment from getting bulky
1
r
2 1if sin
2 2 2
2
r r
t Y t
z
台灣師範大學機電科技學系 -25-
Example 10.2
Amplitude by Vibrometer
A vibrometer having a natural frequency of 4 rad/s and ζ = 0.2 is attached to a structure that performs a harmonic motion. If the difference between the mximum and the minimum recorded values is 8 mm, find the amplitude of motion of the vibrating structure when its frequency is 40 rad/s.
台灣師範大學機電科技學系 -26-
Example 10.2
Amplitude by Vibrometer Solution
Amplitude of recorded motion:
Amplitude of vibration of structure:
Y = Z/1.0093 = 3.9631 mm
1 10
2
0.2 10
1.0093 4mm10
2 2 2
2
Y Y
Z
C. R. Yang, NTNU MT
10.3 Vibration Pickups
• Vibrometer
Measures acceleration of a vibrating body.
t Y t z
r r
r r
t t Y
z
n n
sin , 1 2 1
1 If
2 1
sin
2 2
2 2 2
2 2 2 2 2
C. R. Yang, NTNU MT
10.3 Vibration Pickups
• Vibrometer If 0.65< ζ < 0.7,
Accelerometers are preferred due their small size.
1
2 1.04 for 0 0.6 96 1. 0
2 2 2
r
r
r
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.3 Vibration Pickups
Example 10.3
Design of an Accelerometer
An accelerometer has a suspended mass of 0.01 kg with a damped natural frequency of vibration of 150 Hz. When mounted on an engine undergoing an acceleration of 1 g at an operating speed of 6000 rpm, the acceleration is recorded as 9.5 m/s2by the instrument. Find the damping constant and the spring stiffness of the accelerometer.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.3 Vibration Pickups
Example 10.3
Design of an Accelerometer Solution
1
(E.2)4444 . 0 r or 1 6667 . 0
6667 . 48 0 . 942
32 . 628 1
1 Thus
rad/s 48 . 942 2 150 1
rad/s 32 . 60 628
2 6000 speed Operating
(E.1) 0663 . 1 9684 . 0 / 1 2 1
or
9684 . 81 0 . 9
5 . 9 value True
value M easured 2
1 1
2 2
2
2 d 2
2 d
2 2 2
2 2 2 2
r
r r
r r r
n n
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.3 Vibration Pickups
Example 10.3
Design of an Accelerometer Solution
Substitute (E.2) into (E.1): 1.5801ζ4– 2.2714ζ2+ 0.7576 = 0 Solution gives ζ2= 0.7253, 0.9547
Choosing ζ= 0.7253 arbitrarily,
s/m - N 8571 . 19
7253 . 0 8889 . 1368 01 . 0 2 2
constant Damping
N/m 5628 . 18738 8889 . 1368 01 . 0
rad/s 8889 . 1368 7253 . 0 1
48 . 942 1
2 2
2 2
d n
n n
m c
m k
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-32-
10.3 Vibration Pickups
Example 10.3
Design of an Accelerometer Solution
Measures velocity of vibrating body:
Velocity:
t Y t y cos
t Y t z
r r
r
t r
r Y t r
z
cos
then , 1 2 1
If
cos 2 1
2 2 2
2 2 2 2
2
台灣師範大學機電科技學系 -33-
Example 10.4
Design of a Velometer
Design a velometer if the maximum error is to be limited to 1% of the true velocity. The natural frequency of the velometer is to be 80Hz and the suspended mass is to be 0.05 kg.
台灣師範大學機電科技學系 -34-
Example 10.4
Design of a Velometer Solution
We have
Maximum
True velocity (E.1)velocity Recorded 2
1
cos 2 1
2 2 2
2 2 2 2
2
r r R r
t r r
Y t r
z
(E.2) 2 1
1
2
r r
C. R. Yang, NTNU MT
10.3 Vibration Pickups
Example 10.4
Design of a Velometer Solution
Substitute (E.2) into (E.1),
R
R
4 2
2 2 2 2
2
4 4 1
2 1 4 1 2
1 1 1
2 1
1
C. R. Yang, NTNU MT
10.3 Vibration Pickups
Example 10.4
Design of a Velometer Solution
R = 1.01 or 0.99 for 1% error
ζ4– ζ2+ 0.245075 = 0 and ζ4– ζ2+ 0.255075=0 ζ2 = 0.570178, 0.429821 or
ζ = 0.755101, 0.655607
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.3 Vibration Pickups
Example 10.4
Design of a Velometer Solution
Choosing ζ = 0.755101 arbitrarily,
s/m - N 9556 . 37
05 . 0 656 . 502 755101 . 0 2 2 c
N/m 1527 . 12633 656 . 502 05 . 0
rad/s 656 . 502 2 80
n 2 2
m m
k n
n
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.3 Vibration Pickups
• Phase Distortion
All vibrating-measuring instruments have phase lag.
If the vibration consists of 2 or more harmonic components, the recorded graph will not give an accurate picture – phase distortion Consider vibration signal of the form as shown:
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10.3 Vibration Pickups
• Phase Distortion
Let phase shift = 90° for first harmonic Let phase shift = 180° for third harmonic
Corresponding time lags: t1= 90° /ω, t2= 180° /ω Output signal is as shown:
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10.3 Vibration Pickups
• Phase Distortion
In general, let the complex wave be y(t) = a1sinωt + a2sin2ωt + … Output of vibrometer becomes:
z(t) = a1sin(ωt – Φ1) + a2sin(2ωt – Φ2) + … where
,...
2 , 1 , 1
2
tan 2
j
j j
n n j
台灣師範大學機電科技學系 -41-
• Phase Distortion
Φj≈ π since ω/ωnis large.
z(t) ≈ – [a1sinωt + a2sin2ωt + …] ≈ -y(t) Thus the output record can be easily corrected.
Similarly we can show that output of velometer is Accelerometer: Let the acceleration curve be
Output of accelerometer:
t y
t z
t a ta t
y 12sin 2 22sin2
zt a12sint1 a222sin2t2
台灣師範大學機電科技學系 -42-
• Phase Distortion
Since Φ varies almost linearly from 0° to 90° for ζ = 0.7, Φ ≈ αr
= α(ω/ωn) = βω where α and β are constants.
Time lag is independent of frequency.
Thus output of accelerometer represents the true acceleration being measured.
t
t a
a
t a
t a t z
where 2
sin 2 sin
2 2 sin 2 sin
2 2 2
1
2 2 2
1 2
C. R. Yang, NTNU MT
10.4 Frequency-Measuring Instruments
10.4
C. R. Yang, NTNU MT
10.4 Frequency-Measuring Instruments
• Single-reed instrument or Fullarton Tachometer
Clamped end pressed against vibrating body
Adjust l until free end shows largest amplitude of vibration
Read off frequency
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10.4 Frequency-Measuring Instruments
• Multi-reed Instrument or Frahm Tachometer
Clamped end pressed against vibrating body
Frequency read directly off strip whose free end shows largest amplitude of vibration
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10.4 Frequency-Measuring Instruments
• Stroboscope
Produces light pulses
A vibrating object viewed with it will appear stationary when frequency of pulse is equal to vibration frequency
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10.5 Vibration Exciters
10.5
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10.5 Vibration Exciters
• Used to determine dynamic characteristics of machines and structures and fatigue testing of materials
• Can be mechanical, electromagnetic, electrodynamic or hydraulic type
台灣師範大學機電科技學系 -49-
• Mechanical Exciters
Force can be applied as an inertia force
Force can be applied as an elastic spring force for frequency <30 Hz and loads <700N
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• Mechanical Exciters
The unbalance created by two masses rotating at the same speed in opposite directions can be used as a mechanical exciter.
C. R. Yang, NTNU MT
10.5 Vibration Exciters
• Electrodynamic Shaker
The electrodynamic shaker can be considered as the reverse of an electrodynamic transducer.
2 resonant frequencies are shown below.
DIl F
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10.6 Signal Analysis
10.6
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10.6 Signal Analysis
• Acceleration-time history of a frame subjected to excessive vibration:
• Transformed to frequency domain:
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.6 Signal Analysis
• Spectrum Analyzers
Separates energy of signal into various frequency bands Real-time analyzers useful for machine health monitoring 2 types of real-time analysis procedures: digital filtering method and Fast Fourier Transform method
Basic component of spectrum analyzer: Bandpass filter
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10.6 Signal Analysis
• Bandpass Filter
Permits passage of frequencies over a band and rejects all other frequency components
Response of a filter:
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.6 Signal Analysis
• Bandpass Filter
fuand flare upper and lower cutoff frequencies respectively fc is centre (tuned) frequency
Ripples within band is minimum for a good bandpass filter
2 types of bandpass filters: constant percent bandwidth filters and constant bandwidth filters
Constant percent: (fu– fl)/fcis a constant E.g. octave, one-half-octave filters
Constant bandwidth: fu– flis independent of fc
台灣師範大學機電科技學系 -57-
• Constant Percent Bandwidth and Constant Bandwidth Analyzers
Spectrum analyzer with a set of octave and 1/3-octave band filters can be use for signal analysis
Lower cutoff freq of a filter = upper cutoff freq of previous filter.
Filter characteristics as shown
台灣師範大學機電科技學系 -58-
• Constant Percent Bandwidth and Constant Bandwidth Analyzers
Constant bandwidth analyzer used to obtain more detailed analysis than constant percent bandwidth analyzer
Wave or heterodyne analyzer is a constant bandwidth analyzer with a continuously varying centre frequency
C. R. Yang, NTNU MT
10.7 Dynamic Testing of Machines and Structures
10.7
C. R. Yang, NTNU MT
10.7 Dynamic Testing of Machines and Structures
• Involves finding the deformation of machines/structures at a critical frequency
• Approaches:
Operational Deflection Shape measurements
Modal Testing
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10.7 Dynamic Testing of Machines and Structures
• Using Operational Deflection Shape Measurements
Forced dynamic deflection shape measured under steady-state frequency of system.
Valid only for forces/frequency associated with operating conditions.
If a particular location has excessive deflection, we can stiffen that location.
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10.7 Dynamic Testing of Machines and Structures
• Modal Testing
Any dynamic response of a machine/structure can be obtained as a combination of its modes.
Knowledge of the mode shapes, modal frequencies and modal damping ratio will describe completely the machine dynamics.
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10.8 Experimental Modal Analysis
10.8
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10.8 Experimental Modal Analysis
• When a system is excited, its response exhibits a sharp peak at resonance
• Phase of response changes by 180° as forcing frequency crosses the natural frequency
• Equipment needed:
Exciter to apply known input force
Transducer to convert physical motion into electrical signal
Signal conditioning amplifier
Analyzer with suitable software
台灣師範大學機電科技學系 -65-
• Necessary Equipment Exciter
Can be an electromagnetic shaker or impact hammer
Shaker is attached to the structure through a stringer, to control the direction of the force
Impact hammer is a hammer with built-in force transducer in its head Portable, inexpensive and much faster to use than a shaker
But often cannot impart sufficient energy and difficult to control direction of applied force
台灣師範大學機電科技學系 -66-
• Necessary Equipment Transducer
Piezoelectric transducers most popular Strain gauges can also be used Signal conditioner
Outgoing impedance of tranducers not suitable for direct input into analyzers.
Charge or voltage amplifiers are used to match and amplify the signals before analysis
C. R. Yang, NTNU MT
10.8 Experimental Modal Analysis
• Necessary Equipment
Analyzer
FFT analyzer commonly used
Analyzed signals used to find natural frequencies, damping ratios and mode shapes
C. R. Yang, NTNU MT
10.8 Experimental Modal Analysis
• Necessary Equipment
General arrangement for experimental modal analysis:
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.8 Experimental Modal Analysis
• Digital Signal Processing
x(t) represents analog signal, xi= x(ti) represents corresponding digital record.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.8 Experimental Modal Analysis
• Digital Signal Processing We have
N is fixed for a given analyzer and equations can be expressed as
N
j
j j i N
j
j j i N
j j N
i
j i j i j
j
T x it b N T x it a N N x a
N T j
b it T a it t a
x x
1 1
1 0
2 /
1 0
sin2 1
2 , 1 cos 1 , where
, , 2 , 1 2 ; 2 sin
2 cos
N N
TT N
b b b a a a a d
x x x X X
A d
2 / 1 1 2 / 2 1 0
2 1
1 where ,
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.8 Experimental Modal Analysis
• Analysis of Random Signals
Input and output data usually contain random noise.
If x(t) is random signal, its average is
j NN j T T
t N x x
dt t T x t x
1 0
signal, 1 digital For
1
lim lim
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.8 Experimental Modal Analysis
• Analysis of Random Signals Define a new variable x(t) as
Mean square value
t y t y t
x
2 RMS
2
1 2
0 2 2
value square mean Root
signal, 1 digital For
1
lim lim
x x
t N x x
dt t T x t
x
j N
N j T T
台灣師範大學機電科技學系 -73-
• Analysis of Random Signals Autocorrelation function
If x(t) is purely random, R(t) 0 as T ∞ If x(t) is periodic, R(t) will also be periodic.
n N
j n j j T
T
x n x t N n R
d t x T x x t R
0 0
2
, 1 signal, digital For
lim1
台灣師範大學機電科技學系 -74-
• Analysis of Random Signals Power spectral density (PSD):
Cross-correlation function:
Cross-PSD:
t N S x
d e R
S i
2
: form Digital
2 1
R e dSxf xf i
2 1
T
xf T x f td
t T
R 0
lim1
C. R. Yang, NTNU MT
10.8 Experimental Modal Analysis
• Analysis of Random Signals
If f(τ+t) is replaced by x(τ+t), we get Rxx(t) which leads to Sxx(ω).
Frequency response function H(iω) is related to PSD as
xf xx
ff fx
ff xx
S i H S
S i H S
S H S
2C. R. Yang, NTNU MT
10.8 Experimental Modal Analysis
• Analysis of Random Signals Coherence function:
β = 0 if x and f are pure noises.
β = 1 if x and f are not contaminated at all.
Typical coherence function:
ff xx
xf xx
xf ff fx
S S
S S
S S
S 2
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.8 Experimental Modal Analysis
• Determination of Modal Data from Observed Peaks
Let the graph of H(iω) be as shown below.
4 peaks suggesting a 4-DOF system.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.8 Experimental Modal Analysis
• Determination of Modal Data from Observed Peaks
Partition into several frequency ranges.
Each range is consider a 1-DOF system Damping ratio corresponding to peak j:
When damping is small, ωj≈ ωn
2
satisfy and
where 2
2 1
2 1 1
2
j j
j
j j j
j j j
i i H H i
H
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.8 Experimental Modal Analysis
Example 10.5
Determination of Damping Ratio from Bode Diagram
The graphs showing the variations of the magnitude of the response and its phase angle with the frequency of a single DOF system provides the frequency response of the system.
Instead of dealing with the magnitude curves directly, if the logarithms of the magnitude ratios (in decibels) are used, the resulting plots are called Bode diagrams. Find the natural frequency and damping ratio of a system whose Bode diagram is as shown.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
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10.8 Experimental Modal Analysis
Example 10.5Determination of Damping Ratio from Bode Diagram
台灣師範大學機電科技學系 -81-
Example 10.5
Determination of Damping Ratio from Bode Diagram Solution
ωn= 10Hz, ω1= 9.6 Hz, ω2= 10.5 Hz, Peak response = -35 dB Damping ratio:
10.0
0.0452 6 . 9 5 . 10 2
1
2
n
台灣師範大學機電科技學系 -82-
• Determination of Modal Data from Nyquist Plot
Real parts of frequency-response function of 1-DOF system plotted along horizontal axis
Imaginary parts of frequency-response function of 1-DOF system plotted along vertical axis
Frequency-response function:
2
2 2 2
2
2 2 22 2
4 1 2 , 4 1
1
where 2
1 1
r r v r r r
u r
r iv r u i i r
n
C. R. Yang, NTNU MT
10.8 Experimental Modal Analysis
• Determination of Modal Data from Nyquist Plot
C. R. Yang, NTNU MT
10.8 Experimental Modal Analysis
• Determination of Modal Data from Nyquist Plot
Properties of Nyquist Circle:
•u and v are large when r=1
•1-r2= (1+r)(1-r) ≈ 2(1-r) and 2ζr ≈ 2ζ
2 2 2
2 2 2 2 2
2
4 1 4
1
1 2 , 1
2 1
v u
r v r
u r
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-85-
10.8 Experimental Modal Analysis
• Determination of Modal Data from Nyquist Plot
Once H(iω) is measured, use least square approach to fit a circle.
Intersection of circle with –ve Im axis corresponds to H(iωn) Bandwidth is the difference of the frequencies at the 2 horizontal diametral points
Damping ratio:
n
2
1 2
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-86-
10.8 Experimental Modal Analysis
• Measurement of Mode Shapes Undamped multi-DOF system:
Free harmonic vibration:
Orthogonal relations for mode shapes:
m x k x f
k
i2m
yi0
i i i
T T
M K
K Y
k Y
M Y
m Y
2
diag diag
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-87-
10.8 Experimental Modal Analysis
• Measurement of Mode Shapes
When forcing functions are harmonic,
N
i i i
q i p i
q j N j q F
p pq pq
T
t i t
i t
i
M K
y y
F X
Y M K Y
e F e
F m k e X t x
j
1 2
; , , 2 , 1
; 0 with 2 1
~ 1 ~
~ 2
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-88-
10.8 Experimental Modal Analysis
• Measurement of Mode Shapes
Further normalized [Y] as
N
i i
i q i p pq
N Y M
1 2 2
2 / 1 2
] 1
[
台灣師範大學機電科技學系 -89-
• Measurement of Mode Shapes Damped multi-DOF system:
Assume proportional damping:
Undamped mode shapes of the system will diagonalize the damping matrix:
mxcxkxf
c ak bm
YTc Y diag
k台灣師範大學機電科技學系 -90-
• Measurement of Mode Shapes
Frequency-response function when is harmonic:
When mass-normalized mode shapes are used:
f
N
i i i i
i q i p pq
pq K M i C
y y
1
2 ~
Ni i i i
i q i p
pq 1 2 2
i ~
2
C. R. Yang, NTNU MT
10.8 Experimental Modal Analysis
• Measurement of Mode Shapes
Substituting ω=ωiinto the equation, we get:
i p i q i i pq
i i ii q i p i pq i pq
i i i
q i p i i
pq i pq
H H H i
2
2 2 2
2
2 or
or 2
2~
C. R. Yang, NTNU MT
10.9
Machine-Condition Monitoring and Diagnosis10.9
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-93-
10.9 Machine-Condition Monitoring and Diagnosis
• Machine operations will cause misalignments, cracks, unbalances etc in machine parts
• Vibration level will increase until machine failure occurs
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-94-
10.9 Machine-Condition Monitoring and Diagnosis
• Vibration Severity Criteria
Vibration severity charts can be used as a guide to determine machine condition.
RMS value of vibratory velocity is compared against the criteria set by the standards.
However the overall velocity signal used for comparison may not give sufficient warning of the imminent damage.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-95-
10.9 Machine-Condition Monitoring and Diagnosis
• Machine Maintenance Techniques Life of machine follows the bathtub curve:
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-96-
10.9 Machine-Condition Monitoring and Diagnosis
• Machine Maintenance Techniques
Breakdown maintenance:
Allow the machine to fail and then replace it with a new machine.
This strategy is used when machine is inexpensive and no other damage is caused by the breakdown.
台灣師範大學機電科技學系 -97-
• Machine Maintenance Techniques
Preventive maintenance:
Maintenance performed at fixed intervals.
Intervals determined statistically from past experience.
This method is uneconomical.
台灣師範大學機電科技學系 -98-
• Machine Maintenance Techniques
Condition-based/Predictive maintenance:
Replace fixed-interval overhaul with fixed-interval measurements.
Can extrapolate measured vibration levels to predict when they will reach unacceptable values.
Maintenance costs are greatly reduced.
C. R. Yang, NTNU MT
10.9 Machine-Condition Monitoring and Diagnosis
• Machine Maintenance Techniques
C. R. Yang, NTNU MT
10.9 Machine-Condition Monitoring and Diagnosis
• Machine Condition Monitoring Technique
Following methods are used to monitor machine conditions:
Aural and visual – a skilled technician will listen and see the vibrations produced by the machine
Operational variables monitoring – performance is monitored wrt intended duty. Deviation denotes a malfunction.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-101-
10.9 Machine-Condition Monitoring and Diagnosis
• Machine Condition Monitoring Technique
Temperature monitoring – rapid increase in temperature is an indication of malfunction.
Wear debris found in lubricating oils can be used to assess extent of damage by observing concentration, size, shape and colour of the particles.
Available vibration monitoring techniques.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-102-
10.9 Machine-Condition Monitoring and Diagnosis
• Vibration Monitoring Techniques
Time domain analysis
E.g. following is an acceleration waveform of a gearbox. Pinion is coupled to 2685 rpm motor.
Period of waveform same as period of pinion.
This implies a broken gear tooth on the pinion.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-103-
10.9 Machine-Condition Monitoring and Diagnosis
• Vibration Monitoring Techniques
Statistical Methods
Peak level, RMS level and crest factor may be used as indices to identify damage.
Changes in Lissajous figures can be used to identify faults.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-104-
10.9 Machine Condition Monitoring and Diagnosis
• Vibration Monitoring Techniques Statistical Methods
Waveform corresponding to good components will have bell-shaped probability density curve
Any deviations can be due to component failure
First 4 moments of the curve are called the mean, standard deviation, skewness and kurtosis.
Kurtosis is defined as
Increase in value of kurtosis can be due to machine component failure
x x f x dx
k 1
4 4
台灣師範大學機電科技學系 -105-
• Vibration Monitoring Techniques
Frequency Domain Analysis
Vibration spectrum is unique to that particular machine. Its shape changes as faults starts developing.
Nature and location of the fault can be detected by comparing the frequency spectrum of the damaged machine with that of the machine in good condition.
台灣師範大學機電科技學系 -106-
• Vibration Monitoring Techniques
Frequency Domain Analysis
Each rotating element generates identifiable frequency.
Thus changes in the spectrum at a given freq can be attributed to the corresponding element.
C. R. Yang, NTNU MT
10.9 Machine-Condition Monitoring and Diagnosis
• Vibration Monitoring Techniques
Quefrency Domain Analysis
Quefrency is the x-axis for cepstrum.
Cepstrum c(τ) is the inverse fourier transform of the log of the power spectrum SX(ω).
Cepstrum can detect any periodicity in the spectrum caused by component failure.
X
T T
t i X
S F c
dt e t T x t x F t
x F S
log
1 where
1
2 2 2
C. R. Yang, NTNU MT
10.9 Machine-Condition Monitoring and Diagnosis
• Vibration Monitoring Techniques Quefrency Domain Analysis
2ndgear was at fault although 1stgear was engaged.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-109-
10.9 Machine-Condition Monitoring and Diagnosis
• Instrumentation Systems
Quefrency Domain Analysis
3 types – basic system, portable system, computer-based system.
Basic system consists of vibration meter, stroboscope and headset.
Portable system consists of portable FFT vibration analyzer based on battery power.
Computer-based system consists of FFT vibration analyzer coupled with computer for maintaining centralized database and provide diagnostic capabilities.
台灣師範大學機電科技學系 C. R. Yang, NTNU MT
-110-
10.9 Machine-Condition Monitoring and Diagnosis
• Instrumentation Systems
Piezoelectric accelerometers are commonly used.
Can choose between acceleration, velocity and displacement to monitor.
Velocity is commonly used as the parameter for monitoring the machine conditions because the velocity spectrum is the flattest.
Any change in the amplitude can be observed easily in a flatter spectrum.