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實驗室X光吸收光譜儀之設置

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E. A. Stern, Sci. Am. 234, 96 (1976).

B. K. Teo and D. C. Joy, Ed., in: E X A F S

Spectroscopy: Techniques and Applications,

(Plenum Press, New York, 198 1).

D. C. Koningsberger and R. Prins, Ed., in:

X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFSand XANES,

(John Wiley, New York, 1988), and references therein.

E. A. Stern, Ed., in: Laboratory EXAFS

Facilities-1980, (AIP, New York, 1980),

and references therein.

F. W. Lytle, D. E. Sayers, and E. A. Stern, Phys. Rev. B 11, 4825 (1975).

G. S. Knapp, H. Chen, and T. E. Klippert, Rev. Sci. Instrum. 49, 1658 (1978).

S. Khalid, R. Emrich, R. Dujari, J. Shultz, and J. R. Katzer, Rev. Sci. Instrum. 53, 22 ( 1982).

W. Thuke, R. Haensel, and P. Rabe, Rev. Sci. Instrum. 54, 277 (1983).

G. G. Cohen, D. A. Fisher, J. Colbert, and N. J. Shevchik, Rev. Sci. Instrum. 51, 273 (1980).

P. Georgopoulos and G. S. Knapp, J. Appl. Cryst. 14, 3 (1981). _

A. Williams, Rev. Sci. Instrum. 54, 193 (1983).

P. Brinkgreve, T. M. J. Maas, D. C. Konings-berger, J. B. A. D. van Zon, M. H. C. Janssen,

13. 14. 15.

16.

17.

A. C. M. E. van Kalmthout, and M. P. A. Viegers, in: K. 0. Hodgson, B. Hedman, and J. E. Penner-Hahn, Eds., EXAFS and Near

Edge Structures ZZI, (Spring Verlag, Berlin,

1984), p. 517.

K. Tohji, Y. Udagawa, T. Kawasaki, and K. Masudg, Rev. Sci. Instrum., 54, 1482 (1983). C. Y. Yang, (unpublished).

W. J. Price, in: The Theory and Practice of

Scintillation Counting, (Pergamon press, New

York, 1964).

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Research. (Plenum, New York, 1980), p.

353, and references therein.

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Measurement, (John Wiley & Sons New

York, 1979).

Bldg. 480, Brookhaven National Laboratory Upton, NY 11973, USA

Exxon Research & Engineering Company Route 22 East. Annandale. NJ 08801, USA

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