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矽離子佈植二氧化矽中雜質與奈米矽晶特性分析

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(1)國立交通大學 光電工程研究所 碩 士 論 文. 矽離子佈植二氧化矽中雜質與奈米矽晶特性分析. Characteristics of Defects and Naoncrystallite Silicon in Silicon Implanted Silicon Dioxide. 研 究 生:余國正 指導教授:林恭如. 教授. 中 華 民 國 九 十 三 年 七 月.

(2) 矽離子佈植二氧化矽中雜質與奈米矽晶特性分析 Characteristics of Defects and Naoncrystallite Silicon in Silicon Implanted Silicon Dioxide. 研 究 生:余國正. Student:Kuo-Cheng Yu. 指導教授:林恭如. Advisor:Gong-Ru Lin. 國 立 交 通 大 學 光 電 工 程 研 究 所 碩 士 論 文. A Dissertation Submitted to Institute of Electro-Optical Engineering College of Science National Chiao Tung University In partial Fulfillment of the Requirements for the Degree of Master of Engineering in Electro-Optical Engineering. July 2004 Hsinchu, Taiwan, Republic of China. 中華民國九十三年七月.

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