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改善低溫複晶矽薄膜電晶體均勻性之元件結構與校正電路之研究

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(1)國立交通大學 電子工程學系. 電子研究所. 博 士 論 文 改善低溫複晶矽薄膜電晶體均勻性之元件結構 與校正電路之研究 Study on the Uniformity Improvement of Low-Temperature Polycrystalline-Silicon Thin Film Transistors with the Device Structures and Compensated Circuits. 研 究 生:陳柏廷 指導教授:鄭晃忠 博士 戴亞翔 博士. Bo-Ting Chen Dr. Huang-Chung Cheng Dr. Ya-Hsiang Tai. 中 華 民 國 九十五 年 十一 月.

(2) 改善低溫複晶矽薄膜電晶體均勻性之元件結構與校正電路之研 究. Study on the Uniformity Improvement of Low-Temperature Polycrystalline-Silicon Thin Film Transistors with the Device Structures and Compensated Circuits 研 究 生 : 陳柏廷 指導教授 : 鄭晃忠 博士 戴亞翔 博士. Student : Bo-Ting Chen Advisor : Dr. Huang-Chung Cheng Advisor : Dr. Ya-Hsiang Tai 國立交通大學. 電子工程學系 電子研究所 博士論文. A Dissertation Submitted to Department of Electronics Engineering and Institute of Electronics College of Electrical and Computer Engineering National Chiao Tung University In Partial Fulfillment of the Requirements for the Degree of Doctor of Philosophy in Electronics Engineering 2006 Hsinchu, Taiwan, Republic of China 中華民國 九十五 年 十一 月.

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