JOURNAL OF LIGHTWAVE TECHNOLOGY, VOL. 28, NO. 22, NOVEMBER 15, 2010 3189
Light Emission Enhancement of GaN-Based Photonic
Crystal With Ultraviolet AlN/AlGaN Distributed
Bragg Reflector
Cheng-Chang Chen, Jun-Rong Chen, Yi-Chun Yang, M.-H. Shih, and Hao-Chung Kuo, Senior Member, IEEE
Abstract—In this study, we demonstrated two-dimensional (2-D)
photonic crystal band-edge coupling operation in the ultraviolet
wavelength range. The light extraction enhancement was obtained
from the photonic crystal structure with an ultraviolet AlN/AlGaN
distributed Bragg reflector (UVDBR). The DBR provides a high
reflectivity of 85% with 15-nm stopband width. A fivefold
enhance-ment in photoluminescence emission was also achieved compared
with the emission from the unpatterned area on the same sample
at 374 nm wavelength. We also study the photonic crystal
band-edge coupling with finite-difference time-domain and plane-wave
expansion methods.
Index Terms—Band-edge coupling, photonic crystal, ultraviolet
distributed Bragg reflector (UVDBR).
I. I
NTRODUCTIOND
IRECT wide-bandgap gallium nitride (GaN) and other
III-nitride-based semiconductors have attracted much
attention because of their potential applications, such as blue,
green, and ultraviolet (UV) LEDs and laser diodes (LDs)
[1]–[4]. The high reflectivity GaN-based distributed Bragg
reflector (DBR) is one of the key elements for GaN optical
de-vices, such as resonant cavity RCLEDs [5] and vertical-cavity
surface-emitting lasers (VCSEL) [6], [7]. Today, wide-bandgap
III-nitride-based material has been applied in flashlights and
area lighting to replace the traditional lighting sources. The
blue LD can serve as the light source of high-density data
storage. However, due to the applications, the efficiency of the
light source needs to be improved.
In general, there are two main methods to improve light
ex-traction with photonic crystal structures. One is the use of the
photonic bandgap (PBG) to inhibit the propagation of guided
modes [8]; the other is utilizing photonic crystal structure to
couple guided modes to radiative modes [9]–[13]. In this study,
Manuscript received May 28, 2010; revised September 21, 2010; accepted September 24, 2010. Date of publication October 04, 2010; date of current version November 10, 2010. This work was supported by the Center for Nanoscience and Technology, National Chiao Tung University and the Na-tional Science Council of the Republic of China, Taiwan under Contract NSC 96-2628-E009-017-MY3.
C.-C. Chen, J.-R. Chen, M. H. Shih, and H.-C. Kuo are with the Department of Photonics and the Institute of Electro-Optical Engineering, National Chiao Tung University, Hsinchu 30050, Taiwan (e-mail: mhshih@gate.sinica.edu.tw; hckuo@faculty.nctu.edu.tw).
M.-H. Shih and Yi-Chun Yang are with the Research Center for Applied Sci-ences, Academia Sinica, Nankang, Taipei 115, Taiwan (e-mail: mhshih@gate. sinica.edu.tw).
Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org
Digital Object Identifier 10.1109/JLT.2010.2083634
Fig. 1. SEM image of the epitaxial structure from cross-sectional view. The ultraviolet AlN/AlGaN DBR contains 25 periods of=4 pairs.
we demonstrated light enhancement of GaN-based 2-D
pho-tonic crystals with the ultraviolet AlN/AlGaN DBR at room
temperature. This structure combines a 2-D photonic crystal
in-plane and a 1-D DBR in vertical direction, which is designed
for the UV wavelength region. The DBR structure has center
stopband at 375 nm and a width approximately 15 nm.
There-fore, it can be acted as a mirror to reflect light from the bottom
area and played the role as a lower refracted index layer to
con-trol the guided modes.
II. F
ABRICATIONThe 2-D photonic crystal square lattices were fabricated
in an ultraviolet GaN-based DBR (UVDBR) structure. This
AlN/AlGaN DBR structure was grown by a low pressure
metal-organic chemical vapor deposition (MOCVD) system. A
2- m-thick undoped GaN was first grown on a C-plane (0001)
sapphire substrate. Then 25-pair AlN/Al
Ga
N structure
was grown at 900 C, followed by a 200-nm undoped GaN
gain layer on the top of the epitaxial structure. The schematic
structure of the grown DBR is shown in Fig. 1. The structural
quality of the UVDBR layers is maintained by compensating
the compressive and tensile stress in each
pair. This
ap-proach results in the lowest elastic strain energy and allows the
3190 JOURNAL OF LIGHTWAVE TECHNOLOGY, VOL. 28, NO. 22, NOVEMBER 15, 2010
Fig. 2. (a) Schematic structure of the square photonic crystal patterns with a depth 500 nm and total square area of a width about 50m. (b) Top view SEM images of the photonic crystal structures with square lattices and circle unit cells.
growth of thick coherently strained DBR. The growth details
were reported in our previous works [14], [15].
To fabricate the photonic crystal lattices, a 300-nm Si N
layer and a 300-nm polymethylmethacrylate (PMMA) layer
were deposited as the masks during the process. The photonic
crystal square lattice patterns were defined on the PMMA
layer by E-beam lithography and the patterns were transferred
into Si N layer in reactive ion etching (RIE) with CHF /O
mixture. The structure was then etched by inductively coupled
plasma reactive ion etching (ICP-RIE) with Cl /Ar mixture.
The mask layers were removed at the end of processes. The
size of a fabricated photonic crystal pattern is approximately 50
m
50
m with a lattice constant
of 250 nm and a hole
radius of
. The etch depth of the holes is approximately
500 nm, which is pass through undoped GaN layer into DBR
region. The schematic structure of the fabricated photonic
crystals in AlN/AlGaN DBR is shown in Fig. 2(a). The top
view of an SEM image of a fabricated photonic crystal pattern
on the GaN-based structure is shown in Fig. 2(b).
III. C
HARACTERIZATION ANDM
EASUREMENTBefore characterizing the photonic crystal with the
AlN/AlGaN DBR structure, the high reflectivity in UV region
from the DBR layers was characterized. The UVDBR structure
is designed for the UV wavelength around 360 nm. The
thick-ness of AlN and AlGaN layers are 45 and 42 nm decided by the
formula
and
.
Here,
and
are refractive indexes of AlN and
AlGaN, which are 2.03 and 2.19, respectively. The black curve
in Fig. 3 is the simulated reflectivity spectrum from
transmis-sion matrix method for the UVDBR. The blue curve in Fig. 3
Fig. 3. Calculated (solid) and measured (dash) reflectivity spectra of ultraviolet AlN/AlGaN DBR measured at room temperature with a stopband width of about 15 nm and the center wavelength is 375 nm.
is the measured spectrum by an
and
spectrum analyzer
with a normal incident light from 300 to 420 nm wavelength.
The ultraviolet DBR has the highest reflectivity of 85% at the
center wavelength of 375 nm, with a stopband width of about
15 nm. A good agreement between simulation and experiment
was obtained for the UVDBR structure. The mismatch between
calculated and measured reflectivity spectra is attributed to
inaccuracy of material indexes in simulation and imperfection
of DBR fabrication.
To demonstrate the light enhancement from the photonic
crystal structure, the optical pumping was performed by using
a frequency-tripled Nd:YVO 355-nm pulsed laser with a pulse
width of 0.5 ns and a repetition rate of 1 kHz. (The device
was pumped by a normal incident laser beam with a spot size
of 50
m, which can cover the whole photonic crystal pattern
area. The light emission from the sample was collected by a
15 X objective lens through a multimode fiber and coupled into
a spectrometer with a charge coupled device detectors.
Fig. 4(a) shows the measured PL spectrum from the undoped
GaN layer. The gain peak of the undoped GaN is located around
360 nm wavelength. Fig. 4(b) shows the measured spectra from
the photonic crystal DBR structure (black curve) and
nonpat-terned region (red curve). The gray region in Fig. 4(a) and (b)
is the high reflection region of the bottom UVDBR structure.
The reflectivity of DBR might have very small degradation since
photonic crystals were etched into top four pairs of AlN/AlGaN
layers. The stopband region remains between 362 to 381 nm in
wavelength. A strong light emission from the photonic crystal
pattern was observed. A strong resonant peak was observed at
374 nm wavelength, which is inside the high reflection region,
as expect. A fivefold enhancement in photoluminescence
emis-sion was also achieved compared with the emisemis-sion from the
unpatterned area on the same sample, as shown in Fig. 4(b).
The slight misalignment between the GaN gain peak and the
stopband of UVDBR can be avoided by optimizing geometry of
the bottom DBR structure. The better performance from the UV
GaN photonic crystals can be expected with higher gain support
and better optical properties.
CHEN et al.: LIGHT EMISSION ENHANCEMENT OF GAN-BASED PHOTONIC CRYSTAL WITH ULTRAVIOLET ALN/ALGAN DISTRIBUTED BRAGG REFLECTOR 3191
Fig. 4. (a) Photoluminescence spectrum from the undoped GaN layer without the DBR. (b) Photoluminescence spectra of unpatterned (red) and patterned (black) GaN UVDBR structure at room temperature. This peak of the resonant mode is 374 nm wavelength and is located within stopband width (gray region).
IV. S
IMULATION ANDM
ODELA
NALYSISIn order to understand optical modes of the photonic crystal
DBR structure, 3-D finite-difference time-domain (FDTD) and
plane-wave expansion (PWE) methods were used to performed
simulations for the fabricated structure [16], [17]. The left part
of Fig. 5(a) shows calculated band diagram (red) of the
pho-tonic crystal structure from the PWE method from normalized
frequency
0.6 to 0.8. The right part of Fig. 5(a) is
calcu-lated spectrum (blue) from FDTD simulation within the same
frequency region. The gray region in Fig. 5(a) indicates the high
reflection region due to the UVDBR at the bottom of photonic
crystal lattices. Several resonant modes were observed from the
FDTD spectrum around the UV region, which are labeled with
modes, A, B, C, and D. They are all bandedge modes of photonic
crystal lattices because the strong resonances can be observed
near these bandedges due to the flat photonic bands and their
slow group velocities. By comparing the band diagram and the
FDTD spectrum, the mode A, B, and D are bandedge modes at
symmetry point
, the mode C is a mode at M point. By
com-paring the measured and calculated spectra, the strong emission
at 374 nm wavelength, which is corresponded to a normalized
frequency of
, is verified to be the resonant mode A.
Fig. 5(b) shows the calculated in-plane
field profile of mode
A from the FDTD simulation. We also obtained same mode
profile from the PWE simulation. This in-plane mode profile also
Fig. 5. (a) Corresponding band diagram calculated by the PWE method (red) and the calculated luminescence spectra is presented (blue), corresponding dif-ferent modes, A, B, C, and D. (b) and (c) are top view and side view of the electric-field distribution, respectively, calculated by FDTD simulation.
confirms mode behavior of the bandedge mode at the
point.
Fig. 5(c) is the vertical
field profile of mode A along the
-axis. According to the vertical mode profile, the optical mode
is clearly located in the 200-nm undoped GaN layer due to the
high reflection of the UVDBR.
The UVDBR plays an important role to select emission
wave-length in the GaN-based photonic crystal structure. The gain peak
of the GaN without the DBR is around 360 nm wavelength, which
is outside the stopband of the DBR. However, the PL peak of GaN
on DBR is around 378 nm and the resonant modes are around
374 nm wavelength. There is a 14 nm wavelength difference
be-tween the GaN gain peak and the resonant mode. It is mainly
at-tributed to the reflection of the UVDBR mirror on the bottom of
photonic crystal lattices. This DBR effect in the GaN epitaxial
structure had been observed in our previous works [15], [18]. The
amplitude difference between mode A and other modes (mode B,
C, and D) in FDTD spectrum also prove stronger optical
enhance-ment within the high reflection region of DBR. The UVDBR also
reduces number of resonant modes by tuning its reflection
band-width. The mode reduction decreases energy waste in modes
out-side the DBR high reflection region. More emission behavior of
the GaN photonic crystals can be obtained with further studies
such as far-field pattern characterization [19], [20].
V. C
ONCLUSIONIn this study, a strong emission from the GaN-based photonic
crystal with the AlN/AlGaN DBR structure was achieved in the
UV wavelength region. A fivefold enhancement in
photolumi-nescence emission was also observed. This enhancement results
from the coupling between electron-hole recombination in the
3192 JOURNAL OF LIGHTWAVE TECHNOLOGY, VOL. 28, NO. 22, NOVEMBER 15, 2010
top GaN gain layer and low group velocity modes at the
band-edge of
point. Experimental results show excellent agreement
with the FDTD and PWE simulations. Due to the larger
en-hancement of the devices, we believe the photonic crystal
struc-ture with bottom DBR mirror, which has the potential to light
sources for the future applications.
A
CKNOWLEDGMENTThe authors would like to thank Prof. T.-C. Lu and Dr.
Z.-Z. Li at the National Chiao-Tung University.
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Cheng-Chang Chen was born in Shalu, Taiwan, in 1981. He received the
B.E. degree in physics from the National Chung-Cheng University, Minhsiung, Taiwan, in 2004, and the M.E. degree in photonics technologies from the National Tsing Hua University, Hsinchu, Taiwan, in 2006. He is currently working toward the Ph.D. degree in electrophysics at the National Chiao Tung University (NCTU), Hsinchu, Taiwan.
In 2007, he joined the Semiconductor Laser Technology Laboratory, NCTU, where he is currently with the Department of Photonics and the Institute of Electro-Optical Engineering. His current research interests include III-V semi-conductor materials and Si-based material for light-emitting devices and nanos-tructure for optical devices under the instruction of Prof. Hao-Chung Kuo and Prof. Min-Hsiung Shih.
Jun-Rong Chen was born in Taichung, Taiwan, on October 23, 1980. He
re-ceived the B.S. degree in physics from the National Changhua University of Education (NCUE), Changhua, Taiwan, in 2004, and the M.S. degree in op-toelectronics from the Institute of Photonics, NCUE, Taiwan, in 2006. He is currently working toward the Ph.D. degree in the Department of Photonics and the Institute of Electro-Optical Engineering, National Chiao Tung University (NCTU), Hsinchu, Taiwan.
In 2006, he joined the Semiconductor Laser Technology Laboratory, NCTU, where he was engaged in research on III-V semiconductor materials for light-emitting diodes and semiconductor lasers under the instruction of Prof. T.-C. Lu, Prof. H.-C. Kuo, and Prof. S.-C. Wang. His current research interests include III-nitride semiconductor lasers, epitaxial growth of III-nitride materials, and numerical simulation of III-V optoelectronic devices.
Yi-Chun Yang received the B.S. degree in applied physics from the National
University of Kaohsiung, Kaohsiung, Taiwan, in 2006.
In 2007, she joined the Research Center for Applied Sciences, Academia Sinica, Taipei, Taiwan, as a Research Assistant. Her current research interests include integrated photonic circuits, photonic crystal lasers and waveguides, and cavity quantum electrodynamics.
Min-Hsiung Shih received the B.S. degree in physics from the National Cheng
Kung University, Tainan, Taiwan, in 1995, the M.S. degree in physics from the National Tsing Hua University (NTHU), Taiwan in 1997, and the Ph.D. degree in electrical engineering/electrophysics from the University of Southern Cali-fornia, Los Angeles, in 2006.
In 2007, he joined the Research Center for Applied Sciences, Academia Sinica, Nankang, Taiwan, as an Assistant Research Fellow. His current re-search interests include integrated photonic circuits, photonic crystal lasers and waveguides, surface plasmonics, and cavity quantum electrodynamics.
Hao-Chung Kuo (S’98–M’99–SM’04) received the B.S. degree in physics
from the National Taiwan University, Taipei, Taiwan, in 1990, the M.S. degree in electrical and computer engineering from Rutgers University, Camden, NJ, in 1995, and the Ph.D. degree in electrical and computer engineering from the University of Illinois at Urbana-Champaign, Urbana, in 1999.
He has an extensive professional career both in research and industrial re-search institutions, which includes as follows: Rere-search Consultant with Lucent Technologies, Bell Labs, Holmdel, NJ, from 1995 to 1997, R&D Engineer with the Fiber-Optics Division, Agilent Technologies, from 1999 to 2001, and R&D Manager with LuxNet Corporation, from 2001 to 2002. Since September 2002, he has been with the National Chiao Tung University, Hsinchu, Taiwan, as a member of the faculty at the Institute of Electro-Optical Engineering. He is the author or coauthor of more than 60 papers published in various national and international journals and conference proceedings. His current research inter-ests include the epitaxy, design, fabrication, and measurement of high-speed In-Pand GaAs-based vertical-cavity surface-emitting lasers, as well as GaN-based lighting-emitting devices and nanostructures.