圖5-31為量測晶片時的測試設置方式，首先會將晶片放置於PCB電路板上並且鎊 線，使用Agilent E8257D來產生類比輸入信號，以E3610A供應晶片所需之電源，而取樣 時脈則是由Agilent N4910B提供。在輸出量測方面，則是由外部所選擇的測試模式來決 定所需之量測儀器。在測試模式A下，使用頻譜分析儀Agilent E4440A，以量測晶片之 動態參數。當選擇測試模式B時，則是使用高速示波器Agilent 86100B來紀錄輸出波形，
再使用電腦來計算，以求得電路靜態參數得量測結果。如此，可以藉由此種設置方式來 量測出所需要的效能參數，則可代入式5.1來計算出FoM的大小，以得知晶片的效能表現
為何。圖5-32為PCB上的量測電路設計，輸入信號經由交流耦合的方式送入晶片內，在 輸出端則是使用50Ω與儀器做阻抗匹配。
Agilent E8257D Analog Input
Agilent E3610A Power Supply
Agilent N4910B Clock Source
Agilent E4440A PSA Spectrum Analyzer
Agilent 86100B Oscilloscope
Chip
圖5-31 量測晶片儀器設置
圖5-32 PCB 量測電路
第六章
結論
本論文提出一個可以藉由改變不同的傳輸閘阻值來做頻寬補償的方法，其可延展頻 寬但不會額外消耗功率，所以可達成高速且低功率的目的。此外，在設計上亦提出數位 化的吉伯特元件與差動放大器，除了能以全數位化的方式來實現整體類比數位轉換器之 外，其在設計上只要先設計出單位大小的反相器，則可藉由改變輸入驅動對、回授網路 與自我偏壓電路三者的比例來得到所需的增益，且其電路架構對於抗拒雜訊的能力亦非 常良好。此外，在類比數位轉換器中，追蹤與保持電路所消耗的功率也不容小覷，所以 在此亦使用數位化差動放大器來實現高速且低功率的追蹤與保持電路，達成全數位化與 低功率的目的。在數位編碼器方面則是使用格雷碼編碼器來實現，其受亞穩態的影響最 低，並且將其管線化使之能操作在5GHz 的高速要求。在數位類比轉換器方面，其在偏 壓電路的設計中使用回授的方式來產生所需的偏壓，使之能在製程變異時，能隨運作環 境來產生正確的偏壓，使輸出電流有達到預期的大小，此外，亦考量到電流鏡與供應電
源的誤差，將這些非理想效應考量入內，以設計出一個高精準度的數位類比轉換器，使 之能作為傳送器與測試電路。在解碼器方面，則是使用分段式控制的解碼方式，可以得 到一個在效能與面積都有非常好表現的控制電路。在內建測試電路方面，其可藉由切換 信號路徑的方式來選擇測試模式，分別有模式 A 與模式 B 兩種測試模式，測試模式 A 是將本身已有之數位類比轉換器來把類比數位轉換器的輸出轉為類比信號，所以可直接 對數位類比轉換器輸出的類比信號做頻譜分析，則可量測到類比數位轉換器的動態效能 參數，在測試模式B 下，內建的數位三角波產生器會啟動，其可產生低速三角波信號來 測試出INL 與 DNL 等靜態參數。在類比數位轉換器方面，則是透過輸出驅動電路來將 信號傳至晶片外部，因此可輸入慢速的鋸齒波信號來測試出INL 與 DNL。
在類比數位轉換器的結果方面，其INL 變化範圍為 0.31LSB 到-0.24LSB，而 DNL 則是由0.16LSB 到-0.1LSB，其結果都小於 0.5LSB，且頻譜分析的模擬結果顯示出 ENOB 為3.9 位元，此外，在 Nyquist Frequency 內所有的 ENOB 都有大於 3 位元，所消耗的功 率為33.7mW。最後將整體電路模擬結果與近年來的期刊論文比較，其品質因數方面有 非常良好的表現。而數位類比轉換器INL 變化範圍為 0.07LSB 到-0.06LSB，DNL 則是 由 0.07LSB 到-0.03LSB，其結果亦小於 0.5LSB， ENOB 高達 3.9 位元，且在 Nyquist Frequency 內所有的 ENOB 都非常接近 4 位元，而所消耗的功率為 18.9mW，由此可知 其非常適合用於測試與發送信號。最後將類比數位轉換器、數位類比轉換器以及內建測 試電路組合成整體系統，當選則測試模式A 時，其 ENOB 的輸出結果為 3.9 位元，顯示 整體電路有正常運作，所以輸出結果的表現上仍含單獨測試一樣。此外，亦模擬操作在 測試模式B 下的靜態參數，其所得到之 INL 變化範圍由 0.09LSB 到-0.09LSB，而 DNL 則是由0.11LSB 到-0.09LSB，其線性度非常高，其整體系統的消耗功率為 61.9mW。
在本論文中已設計出一個高速且低功率的快閃式類比數位轉換器，其在品質因數方 面表現非常良好，且亦設計出一個高速且失真度低的數位類比轉換器，使之能用於發送
信號與測試類比數位轉換器，最後在內部加入測試電路，使之能降低測試設置的複雜度 且提升可測試性。
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