Highly
textured
ZnO:B
films
grown
by
low
pressure
chemical
vapor
deposition
for
efficiency
enhancement
of
heterojunction
silicon-based
solar
cells
Jui-Chung
Hsiao
a,b,
Chien-Hsun
Chen
b,*
,
Hung-Jen
Yang
c,
Chien-Liang
Wu
b,
Chia-Ming
Fan
b,
Chien-Fu
Huang
b,
Chao-Cheng
Lin
b,
Peichen
Yu
a,
Jenn-Chang
Hwang
ca
DepartmentofPhotonicsandInstituteofElectro-OpticalEngineering,NationalChiaoTungUniversity,HsinChu30010,Taiwan
b
GreenEnergyandEnvironmentResearchLaboratories,IndustrialTechnologyResearchInstitute,HsinChu30010,Taiwan
c
DepartmentofMaterialsScienceandEngineering,NationalTsingHuaUniversity,Hsin-ChuCity30013,Taiwan
It is very important to have both a high energy conversion
efficiencyandalowproductionprocessingcostfor
commercial-izedsolarcells.Itisnodoubtthattheheterojunctionsilicon-based (HJS)solarcellisoneofthemostattractivesolarcellsamongthem forthefollowingreasons[1–3].First,thewholestructureofaHJS solarcellisverysimple.Theemitterlayerandthe
back-surface-filed (BSF) layer are deposited on a crystalline silicon (c-Si)
substrate by a plasma enhanced chemical vapor deposition
(PECVD)system.Nosophisticatedstep,suchasphotolithography
orion-implantation,noranycomplicatedstructuresuchasametal wrapthroughoraninter-digitalbackcontactisinvolved[4–6]. Second,theprocessingtemperatureofaHJSsolarcellisverylow. AlloftherequiredprocessestoaHJSsolarcellcanbeaccomplished
below2508CusingaPECVDsystem,whichisespeciallysuitable
forthinnersiliconwafers[7].Thereductionofthethermalbudget, comparedtothetraditionalcrystallinesiliconsolarcell,isbenefit
to the mass production. Third, there is a very high energy
conversionefficiencyduetoahighopenvoltageforaHJSsolarcell
[8].Anintrinsichydrogenatedamorphoussilicon(a-Si:H)layercan beinsertedbetweenanemitterlayerandac-SisubstrateoraBSF layerandac-Sisubstrate,whichcanprovideanexcellentsurface passivationtoac-Sisubstrate[9–11].Itisthereforeattractedmany
peopledevotedonthistopic.
MostoftheresearchaboutHJSsolarcellsarefocusedonthe
intrinsic a-Si:H layer [9,12,10]. Only few papers discuss the
transparentconductiveoxide (TCO)layeron theHJSsolarcells
[13–16].AnIndiumTinOxide(ITO)layerisatypicalTCOmaterial fortheHJSsolarcells.However,theshortageoftheindiumandfree carrieradsorptionatthelongwavelengthregionaretwoserious
problemstoanITOmaterial[17].AZnO-basedTCOcouldbean
alternative for its low cost and non-toxicity, attracting much
attention for its widely applications to light-emitter diode,
transparenthighpower electronicstransducers,gas-sensingand
solarcell[18,19].ItisanappropriateTCOlayerforaHJSsolarcell becauseithasthepropertiesofahightransmittance(>80%)anda lowsheetresistance(10
V
/&).Inthiswork,aZnO:Blayersweredepositedbythelowpressure
chemical-vapor-deposition (LPCVD) system. The electrical and
opticalpropertiesofZnOfilms,whichwerecontrolledbytheflow
rateoftheB2H6andthesubstratetemperature,wereoptimized
first.Second,thePVcharacteristicsofHJSsolarcellsvaryingwith thethicknessoftheoptimizedZnO:Bfilmfrom0.35
m
mto1.6m
m wereexamined.Finally,theperformanceofHJSsolarcellswiththeZnO:BfilmandtheITOfilm,respectively,arediscussed.
1. Experimental
The HJS solar cells were fabricatedon textured n-type c-Si
substratescuttinginto2cm2cm.Theresistivityandthickness ofthen-typeCZc-Si(100)substrateswere1–5?cmand180
m
m, JournaloftheTaiwanInstituteofChemicalEngineers44(2013)758–761ARTICLE INFO
Articlehistory:
Received5October2012
Receivedinrevisedform23January2013 Accepted27January2013
Availableonline30March2013
Keywords: ZnO:B
Heterojunctionsolarcell
Low-pressurechemical-vapor-deposition
ABSTRACT
Thispaperdemonstratesthegrowthofhighly-texturedboron-dopedZnO(ZnO:B)filmbyusing low-pressure chemical-vapor-deposition (LPCVD)forefficient lightharvestingand carrier collectionin heterojunctionsilicon-based (HJS) solar cells. Theoptical and electrical characteristicshave been optimizedversusthesubstratetemperatureandB2H6flowratefortradeoffsamongthesheetresistance,
free-carrierabsorption,andopticaltransmissionofblue/greenwavelengths.AHJSsolarcellwitha
1.6-mm-thickZnO:Bfilmachievesahighpowerconversionefficiencyof16.30%andfillfactorof78.05%, comparedto15.64%and72.17%,respectively,fromacounterpartwithaconventional80-nm-thick indiumtinoxidelayer.
ß2013TaiwanInstituteofChemicalEngineers.PublishedbyElsevierB.V.Allrightsreserved.
*Correspondingauthor.Tel.:+88635915170. E-mailaddress:[email protected](C.-H.Chen).
ContentslistsavailableatSciVerseScienceDirect
Journal
of
the
Taiwan
Institute
of
Chemical
Engineers
j o urn a lhom e pa g e :ww w . e l se v i e r. c om / l oca t e / j t i ce
1876-1070/$–seefrontmatterß2013TaiwanInstituteofChemicalEngineers.PublishedbyElsevierB.V.Allrightsreserved.
respectively.Samplesweredippedin5%HFsolutiontoremovethe nativeoxidelayerandthenwererinsedinthede-ionizedwaterin 3min.Ap-typea-Si:HfilmusingB2H6gasasaprecursorandan
n-typea-Si:HfilmusingPH3gasasaprecursorweredepositedona
texturedc-Si substrate asan emitterlayerand a BSF layer.All
ZnO:BfilmsweredepositedbyLPCVD.Diethylzinc(DEZ)andwater
(H2O)vaporscarriedbyargongaswereusedasprecursors,and
theirflowsweresetto500and550sccm,respectively.Diborane
(B2H6),1%dilutedinhydrogen,wasusedasthedopinggaswiththe
flowrateof8sccm.AllthedepositionparametersforZnO:Bfilms
aresummarizedinTable1.Asilvergridlayer,definedbyashadow
metalmask,wassputteredontheZnO:Bfilmwithathicknessof
200nm.TheAg/ITOlayersweresputteredonthen-typea-Si:Hfilm asabackcontact.
The electrical and optical properties of a ZnO:B film were
characterized by four points probes and UV–vis spectrometer
(PerkinElmer,Lambda750s).Scanningelectronmicroscope(JEOL,
JSM5400)wasutilizedtoinvestigatethesurfacemorphologyand
thicknessofaZnO:Bfilm.Thephotovoltaiccharacteristicsofthe
HJSsolarcellsweredeterminedunderstandardilluminationtest
condition(258C,1000W/m2,AM1.5G).
2. Resultsanddiscussion
Fig.1showsthesheetresistance(R&)oftheZnO:Bfilmsasa
functionofthediborone(B2H6)dilution.Thereisadrasticdecrease
oftheR&from227
V
/&to11.2V
/&withtheincreaseoftheB2H6from0sccmto3sccm.TheR&canbefurtherdecreasedto7.8
V
/&attheB2H6flowrateof5sccmandseemstobesaturatedto6.3
V
/& attheB2H6 flow rateof10sccm.Bothelectrical andoptical
propertiesareimportanttothetransparentconductivelayer.The transmissionoftheZnO:BfilmswithdifferentB2H6flowrateare
measured from thewavelengthof 300nmto 1200nm (Fig.2).
Thereisablue-shiftofacut-offwavelengthfortheZnO:Bfilmsin theultra-violetregionincreasingwiththeB2H6flowrate.Thisis
mainlyduetotheBursteinMossshift[20].Thetransmissionsare alsoincreasedwiththeB2H6flowrateatthesewavelengthranges.
On the contrary, the transmissions of these ZnO:B films are
decreasedwiththeincreaseoftheB2H6flowrateintheIRregion.
Thiscanbeattributedtothefreeelectronsadsorptionatthelong
wavelengthregion[17].Meanwhile,thetransmissionsarealmost
the same(80%) at the wavelengthof 550–850nmfor the all
ZnO:BsamplesregardlessoftheB2H6flowrate.
Itisnotedthatthedepositionrateandtheorientationofthe
ZnO:Bfilms,determinedbytheSEMandXRD,respectively,arenot
affectedby theB2H6 flow ratefrom0sccm to10sccm.On the
contrary,theincreaseofthesubstratetemperaturehasremarkable
change in the surface morphology as shown in Fig. 3. The
structuresoftheZnO:Bfilmschangefromgranular-likestructure
at1308Ctopyramid-likestructureat1608Candfurtherchangeto stripe-likestructure at3008Cdeposited onthetextured silicon substrate.Moreimportantly,thelowestR&canbeobtainedtobe
6.3
V
/&at1608CasshowninTable1.Itisimportanttotaketheopticalandelectricalpropertiesofthe
ZnO:B films as well as the deposition temperature into the
considerationforthefabricationoftheHJSsolarcells.TheB2H6
flowrateandthedepositiontemperaturearechosentobe10sccm
and 1608C, respectively. Generally speaking, the optimized
thicknessofanITOfilmforaHJSsolarcellis80nm.Itisnoted thattheresistivityofaZnO:Bfilm(4103
V
cm)ishigherthanthatofanITOfilm(3104
V
cm).TheoptimizedthicknessofaZnO:BfilmforaHJScellshouldbelargerthan80nm.Thethickness
of the ZnO:B films are varied from 0.35
m
m to 1.6m
m toinvestigatehowtheyaffectthePVcharacteristics,includingopen circuitvoltage(Voc),shortcircuitcurrent density(Jsc),fill factor
(FF),andenergyconversionefficiency(Eff.)oftheHJSsolarcellsas showninFig.4.TheJscvaluesofHJSsolarcellswithZnO:Bfilmsare
almost the same at the ZnO:B films thicknessof 0.35
m
m and0.8
m
m,butdecreaserapidlyto35.2mA/cm2asthethicknessoftheZnO:Bfilmrises to1.6
m
m. Thereisa relationbetweentheincidentlight(I0)andthetransmissionlight(I):
I¼I0eðatÞ (1)
where
a
andtaretheabsorptioncoefficientandthicknessofthefilm, respectively. The intensity of the transmission light is
inverselyexponentialtothethicknessofthefilm,suggestingthat
the Jsc decreases with the increase of the film thickness. The
Table1
ThedepositionparametersfortheZnO:Bfilmsusedinthiswork. ZnO:B sample B2H6 (sccm) Temperature(8C) Pressure (Torr) Sheetresistance (V/&) #1 0 160 0.6 227 #2 3 160 0.6 11.2 #3 5 160 0.6 7.8 #4 10 160 0.6 6.3 #5 10 130 0.6 38 #6 10 200 0.6 125 #7 10 250 0.6 390 #8 10 300 0.6 353
Fig.1.ThemeasuredsheetresistancevalueoftheZnO:Bfilmsasafunctionofthe diboronedilution.
Fig.2.ThetransmissionoftheZnOfilmswithdifferentB2H6dilutionfromthe
spectrometer.
quantum efficiencies (QEs) of HJS solar cells with different thicknessoftheZnO:BflmsasshowninFig.5canfurtherexplain thisphenomenon.ThemajordifferenceinQEsfortheseHJScellsis atthewavelengthof600–1200nm,inwhichtheQEoftheHJScell withtheZnO:Bfilmof1.6
m
mthickissmallerthanthatwiththeZnO:Bfilm of 0.8
m
m. TheHJS cellhashighenergy conversionefficiencyatthelongwavelengthregionbecausethebandgapof
thesiliconis1.1eV.Asaconsequence,thethickertheZnO:Bfilm, thelowertheJsc.
TheFFsvaluesofHJSsolarcellswithZnO:Blayersincreasesbya
factorof1.14withtheincreaseofthethicknessoftheBZOfilm
from 0.35
m
m to 1.6m
m. It can be originated from the filmthicknesseffectbecausetheR&isinverselyproportionaltothefilm
thickness,whichresultsinthelargerFF.Furthermore,asmallerR&
canresultinalowerseriesresistance,leadingtoahigherVocvalue.
ThisexplainstheFFandVocincreasingwiththethicknessofthe
ZnO:Bfilm.
Theefficiencyresultscombinewithtotalfactorsincludingthe FF,Voc,andJsc.ThetendencyofefficiencyofHJSsolarcellsisthe
sameastheFFresults.Theoptimizedefficiencyof16.2%canbe
obtainedattheZnO:Blayerthicknessof1.6
m
m.In most HJS solar cell research, an ITO film is chosen as a
transparentconductiveoxidelayerbecauseofitsexcellentoptical
and electrical properties. It is of interest to compare the PV
characteristicsbetweenHJSsolarcellswithanITOfilmof80nm
thickandaZnO:Bfilmof1.6
m
mthick,respectively,asshowninTable2.TheFFoftheHJSsolarcellwithaZnO:Bfilmishigherthan thatwithanITOfilm,becausetheR&of6.3
V
/&foraZnO:Bfilmislower than theR& of 50
V
/& for an ITOfilm. Meanwhile, thethickerfilmresultsinalowerJscasmentionedearlier.Itisworth
noting that the most significant feature of the low pressure
chemical vapordeposited ZnO:B film is the textured structure
(Fig.3),whichisbenefittothelightabsorptionandcontributesto theJscofthesolarcell.Otherwise,theJscwouldbelowerthanwe
measured. There are two main disadvantages for an ITO film
thickerthan 80nm.Oneisthat theJscwilldecreaseduetothe
absorptionofthethickerfilm.Theotheristhattheabsorptionat
thelongwavelengthregionincreasesrapidlybecauseofthefree
carrierabsorption[17,21].
3. Conclusions
WehavefabricatedtheHJSsolarcellsusingZnO:Bfilmsasthe
TCO material deposited by an LPCVD system. Due to its high
transmittance, low sheet resistance as well as the textured
structure,thehigherenergyconversionefficiencyoftheHJSsolar cellwasobtainedthanthatwithanITOfilmastheTCOlayer.Other
works such as the improvements of the optical and electrical
propertiesoftheZnO:BfilmsontheHJSsolarcellsareinprocess.
Fig.3.TheSEMcrosssectionsofZnO:Bfilmsdepositedonc-Siin(a)1308C,(b)1608Cand(c)3008C.
Fig.4.Photovoltaiccharacteristicsof(a)fillfactor,FF(b)shortcircuitcurrent density,Jsc(c)opencircuitvoltage,Vocand(d)conversionefficiency,Eff.forHJS
solarcellsasafunctionofthethicknessoftheZnO:BfilmandforaHJSsolarcellwith theITOfilm(bluespot).
Fig.5.ThequantumefficiencyofHJSsolarcellsfortwoZnO:Bfilmswiththickness of0.8mmand1.6mm.
Table2
Photovoltaic characteristicsof opencircuitvoltage (Voc),shortcircuit current
density(Jsc),fillfactor(FF),andconversionefficiency(Eff.)forHJSsolarcellswith
theITOfilmandtheZnO:Bfilm.
Sample Voc(V) Jsc(mA/cm2) FF(%) Eff.(%)
HJScellwiththeITOfilm 0.593 36.51 72.17 15.64 HJScellwiththeZnO:Bfilm 0.593 35.26 78.05 16.3 J.-C.Hsiaoetal./JournaloftheTaiwanInstituteofChemicalEngineers44(2013)758–761
Acknowledgements
This work was supported by Bureau of Energy under the
contractNo.B455DR1120.
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