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[PDF] Top 20 Making decisions in assessing process capability index C-pk

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Making decisions in assessing process capability index C-pk

Making decisions in assessing process capability index C-pk

... Process capability indices C p , C pk and C pm have been used in manufacturing industries to provide a quantitative measure of process potential and ...collected ... See full document

6

Measuring process yield based on the capability index C-pm

Measuring process yield based on the capability index C-pm

... Based on the test, Lin and Pearn [8] developed a simple step- by-step procedure, which can be used for in-plant applications. The practitioners can use the proposed procedure to determine whether their ... See full document

6

Computer program for calculating the p-value in testing process capability index C-pmk

Computer program for calculating the p-value in testing process capability index C-pmk

... Many process capability indices, including C p , C pk , and C pm , have been proposed to provide numerical measures on the process potential and ...new capability ... See full document

10

Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC

Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC

... estimated index values are random variables and sampling errors are ...estimated index values to the lower confidence bounds then plot the corresponding lower confidence bounds on the C pk ... See full document

13

Testing manufacturing performance based on capability index C-pm

Testing manufacturing performance based on capability index C-pm

... the process mean µ and the process variance σ 2 are unknown. But, in practice µ and σ 2 can be estimated using the sample ...estimated index ˆ C pm the natural estimator of the ... See full document

8

The C ''(pk) index for asymmetric tolerances: Implications and inference

The C ''(pk) index for asymmetric tolerances: Implications and inference

... The process capability index C pk has been widely used in the manufacturing industry to provide numerical measures on process perfor- ...Since C pk is a ... See full document

18

Contract manufacturer selection by using the process incapability index C-pp

Contract manufacturer selection by using the process incapability index C-pp

... the process performance of con- tract manufacturer A is significantly lower than that of other contract manufacturers and there is no need to waste further time in considering this contract manu- ...E, ... See full document

7

Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL

Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL

... the capability indices have been criticized, since there is no sampling error assessment of these ...the index calcu- lated from sample data has never been ...the decisions made in concluding ... See full document

10

Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process

Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process

... indices, C pk and C pm , the index C pmk has been proposed to provide numerical measures of process ...The index C pmk takes into account the location of the ... See full document

10

FUZZY INFERENCE FOR ASSESSING PROCESS LIFETIME PERFORMANCE

FUZZY INFERENCE FOR ASSESSING PROCESS LIFETIME PERFORMANCE

... Abstract. Process capability studies, which use a capability index to provide numerical measures on whether a process conforms to the capability prerequisite set in the ... See full document

1

Estimating process yield based on S-pk for multiple samples

Estimating process yield based on S-pk for multiple samples

... result in incorrect conclusions. In order to use past in-control data from multiple samples to make decisions regarding process capability, the distribution of the estimated ... See full document

17

Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics

Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics

... critical process in semiconductor man- ...thickness. Process yield, a common criterion used in the manufacturing industry for measuring process performance, can be applied to examine ... See full document

6

Normal approximation to the distribution of the estimated yield index S-pk

Normal approximation to the distribution of the estimated yield index S-pk

... In this paper, we considered a normal approximation to the distribution of the estimated S pk , and investigated its accuracy computationally. We compared the critical values calculated from the approximate ... See full document

18

A note on Bayesian estimation of process capability indices

A note on Bayesian estimation of process capability indices

... the index is not very useful in making reasonable decision on the capability of a ...PCIs, C p , C pk , and C pm in Section 2. In Section 3, we derive ... See full document

10

New generalization of process capability index C-pk

New generalization of process capability index C-pk

... The process capability index C pk has been widely used in manufacturing industr y to provide numerical measures of process potential and ...practitioners, C ... See full document

12

The asymptotic distribution of the estimated process capability index (C)over-tilde(pk)

The asymptotic distribution of the estimated process capability index (C)over-tilde(pk)

... contained in the publications on our ...expressed in this publication are the opinions and views of the authors, and are not the views of or endorsed by Taylor & ...indirectly in connection with, ... See full document

10

Estimating capability index C-pk for processes with asymmetric tolerances

Estimating capability index C-pk for processes with asymmetric tolerances

... contained in the publications on our ...expressed in this publication are the opinions and views of the authors, and are not the views of or endorsed by Taylor & ...indirectly in connection with, ... See full document

13

Process capabitity assessment for index C-pk based on bayesian approach

Process capabitity assessment for index C-pk based on bayesian approach

... Abstract. Process capability indices have been proposed in the manufacturing industry to provide numerical measures on process reproduction capability, which are effective tools for ... See full document

14

The performance of process capability index C-s on skewed distributions

The performance of process capability index C-s on skewed distributions

... To link to this article: http://dx.doi.org/10.1080/03610919708813444 PLEASE SCROLL DOWN FOR ARTICLE Taylor & Francis makes every effort to ensure the accuracy of all the information (the “Content”) contained in ... See full document

18

A Bayesian-like estimator of the process capability index C-pmk

A Bayesian-like estimator of the process capability index C-pmk

... the capability index C pmk , and inves- tigated the statistical properties of its natural estimator ^ C C pmk for stable normal processes with constant mean ...^ C C pmk ... See full document

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